The present disclosure relates to a sensor used in, for example, an electronic device.
Conventionally, a sensor is known in which a sensor element is mounted perpendicularly to the main face of the substrate. For example, Patent Literature (PTL) 1 is known as a document disclosing a conventional technology related to the invention of the present application.
A sensor according to the present disclosure includes a substrate, a substrate electrode, a sensor element, a sensor electrode, and a connection member.
The substrate has a main face.
The substrate electrode is disposed on the main face.
The sensor element has a first face perpendicular to the main face, and detects an angular velocity about an axis parallel to the main face.
The sensor electrode is disposed on the first face of the sensor element.
A connection member connects the substrate electrode and the sensor electrode.
The width of the sensor electrode at a position closer to the main face is smaller than the width of the sensor electrode at a position farther from the main face.
The sensor electrodes in a sensor element in a conventional sensor often do not extend to the end face of the sensor element. This is because if the sensor electrodes extend to the end face of the sensor element, the sensor electrodes may peel off when the sensor element is cut. If the sensor electrodes do not extend to the end face of the sensor element, when the sensor electrodes and the substrate electrodes on the substrate are connected, solders may not sufficiently reach the sensor electrodes. In particular, when the sensor element is mounted perpendicularly to the substrate, if the sensor element is mounted obliquely to the main face of the substrate, the connection may be insufficient. In other words, insufficient precision in mounting angle leads to insufficient connection, resulting in a reduction in sensor precision.
Moreover, since the conventional sensor is small in width, it is difficult to mount the sensor element perpendicularly to the substrate with high precision.
Hereinafter, a sensor according to an embodiment of the present disclosure will be described with reference to the drawings.
Sensor 10 includes substrate 12, substrate electrodes 35, sensor element 18, sensor electrodes 18A, and connection members 11.
Substrate 12 has main face 50.
Substrate electrodes 35 are disposed on main face 50.
Sensor element 18 has first face 51 perpendicular to main face 50, and detects the angular velocity about an axis parallel to main face 50.
Sensor electrodes 18A are disposed on first face 51 of sensor element 18.
Connection members 11 connect substrate electrodes 35 and sensor electrodes 18A.
As illustrated in
Here, the term “perpendicular” is not limited to being exactly 90 degrees, but may be approximately 90 degrees. For example, it may be 90 degrees±10 degrees approximately.
Moreover, here, the term “position closer to main face 50” may indicate the position of sensor electrode 18A closest to main face 50. Moreover, the term “position farther from main face 50” may indicate the position of sensor electrode 18A farthest from main face 50.
Alternatively, the term “position closer to main face 50” may indicate the position closest to main face 50 when sensor electrode 18A is equally divided into 10 parts in the longitudinal direction of sensor electrode 18A (along the z-axis). Moreover, the term “position farther from main face 50” may indicate the position farthest from main face 50 when sensor electrode 18A is equally divided into 10 parts in the longitudinal direction of sensor electrode 18A (along the z-axis).
Moreover, the term “width” includes the case of “point”. For example, when sensor electrode 18A has a triangular shape having a vertex angle toward main face 50 as illustrated in
Hereinafter, sensor 10 will be described in detail. Sensor 10 includes substrate 12, sensor element 18, and solders 11 (connection members). Sensor element 18 is disposed on main face 50 of substrate 12. Solders 11 connect substrate 12 and sensor element 18. Sensor 10 may further include semiconductor element 20 and sealing resin 32. Semiconductor element 20 is disposed on main face 50 of substrate 12. Sealing resin 32 is disposed on main face 50 of substrate 12 so as to cover sensor element 18 and semiconductor element 20.
Substrate 12 is made of, for example, resin such as glass epoxy. Substrate electrodes 35 are disposed on main face 50 (top face) of substrate 12. Bottom electrodes 36 are disposed on bottom face 52 of substrate 12. Substrate electrodes 35 and bottom electrodes 36 are electrically connected to each other. Solder bumps 38 are disposed on bottom electrodes 36.
Sensor element 18 detects the physical quantity (angular velocity) about the x-axis. In other words, sensor element 18 detects the physical quantity (angular velocity) about an axis parallel to main face 50 of substrate 12. Various structures can be used for sensor element 18. For example, sensor elements described in PTL 2 to PTL 5 may be used. Note that the physical quantity detected by sensor element 18 is not limited to the angular velocity, but may be acceleration. In other words, sensor element 18 may be described as an inertial force detection element which detects the physical quantity such as angular velocity or acceleration.
Bottom face 53 of sensor element 18 is fixed to the top face of substrate 12 via adhesive material 15 made of epoxy resin or the like.
Bottom face 53 of sensor element 18 is fixed to the top face of substrate 12 via adhesive material 15. Adhesive material 15 is an adhesive material made of a resin material such as epoxy resin. Adhesive material 15 is formed by being applied onto main face 50 of substrate 12 in a liquid state or a semisolid state and undergoing heat curing.
Sensor electrodes 18A are disposed on first face 51 of sensor element 18. Sensor electrodes 18A are connected to substrate electrodes 35 via solders 11.
Semiconductor element 20 is mounted near the central portion of main face 50 of substrate 12. Pads 34 and thin metal lines 24 are also disposed on main face 50. Semiconductor element 20 is connected to sensor element 18 via pads 34 and thin metal lines 24. Semiconductor element 20 includes a circuit incorporated for calculating the angular velocity based on the output of sensor element 18.
Such a structure reduces, for example, the possibility of chipping which occurs when sensor element 18 is divided. Hereinafter, the structure and effects will be specifically described.
In a conventional sensor element, if the sensor electrodes extend to the end face of the sensor element, chipping (electrode peeling) may occur when the sensor element is divided. Therefore, it is difficult to reduce the distance between the sensor electrodes and the end face of the sensor element. In other words, the sensor electrodes in the conventional sensor element do not extend to the end face of the sensor element, and a given distance is disposed between the sensor electrodes and the end face of the sensor element. Therefore, when the sensor element is perpendicularly mounted on the substrate, connection members (solders) are not sufficiently filled between the sensor electrodes and the substrate electrodes, which may result in defective joining.
In contrast, in the present embodiment, sensor electrodes 18A extend to the end face of sensor element 18. As a result, the connection members (solders) are sufficiently filled between sensor electrodes 18A and substrate electrodes 35. Moreover, the area of each of sensor electrodes 18A is smaller at the end face of sensor element 18 (at the position closer to main face 50 of substrate 12). In other words, the width of sensor electrode 18A is reduced toward main face 50. In other words, sensor electrode 18A has a triangular shape having a vertex angle toward main face 50. Therefore, dividing is less likely to cause chipping (electrode peeling). Since the width of sensor electrode 18A at the end face of sensor element 18 is small, even if the tip of sensor electrode 18A is slightly scraped, sensor electrode 18A itself does not peel off. Here, the term “dividing” indicates, for example, after connecting a plurality of sensor elements 18 to substrate 12, cutting sensor elements 18 into individual sensor elements 18.
As illustrated in
With this structure, for example, sensor electrodes 18A function as reflective layers for laser light 112. As a result, it is possible to prevent laser light 112 from entering substrate 120. More specifically, when laser light 112 is emitted from the rear side of sensor element 180 in order to melt solders 11, the emitting position of laser light 112 may deviate, causing laser light 112 to enter substrate 120. In this case, the inside of substrate 120 may be damaged or defective joining due to insufficient heat may be caused. However, since sensor electrodes 18A of sensor 102 function as reflecting layers for laser light 112, it is possible to prevent laser light 112 from entering substrate 120.
Each of post electrodes 35a has a cutout shape in which a portion of a prism which is in contact with sensor element 180 is cut out. In other words, post electrode 35a has an inclined face (or hypotenuse) whose distance from sensor electrode 18A is larger at a position farther from main face 50 of substrate 120. In other words, post electrode 35a has inclined face 37 (or hypotenuse) on the side opposing sensor element 180. Note that the inclined face (or hypotenuse) is not limited to a linear face. In other words, the inclined face (or hypotenuse) may include a curved line, a curved face and/or an uneven face. Moreover, post electrode 35a may have a shape in which a cylinder is partially cut out.
Solder 11 is filled over sensor electrode 18A of sensor element 180 and the cut out portion of post electrode 35a. As a result, sufficient joining strength can be obtained.
In other words, the shape of sensor electrode 18A is that width W1 of sensor electrode 18A at a position closer to main face 50 of substrate 12 (the width of sensor electrode 18A at a position in contact with straight line L2 in
The shape of sensor electrode 18A can be expressed in another way. Specifically, it can be described as follows. First, two straight lines L2 and L3 are defined as virtual straight lines parallel to main face 50 of substrate 12. Here, the distance between straight line L2 and main face 50 of substrate 12 is smaller than the distance between straight line L3 and main face 50 of substrate 12. The width of the portion of straight line L2 passing through sensor electrode 18A is smaller than the width of the portion of straight line L3 passing through sensor electrode 18A.
Note that a gap which is distance D1 may be disposed between main face 50 of substrate 12 and the bottom end of sensor electrode 18A.
Note that straight lines L4 to L7 are virtual lines perpendicular to the main face of substrate 12. In the cross-section parallel to main face 50 of electrode 18A, it is preferable that width D3 of substrate electrode 35 is larger than width D2 of sensor electrode 18A. With this structure, defective joining can be further reduced.
It is to be noted that instead of solder 11, an electrically conductive paste in which metal powder made of Ag or the like is added to a resin material may be used. In other words, solder 11 can be read as an electrically conductive connection member.
In other words, sensor element 280 includes first face 51, and second face S2 which protrudes beyond first face 51.
In other words, sensor element 280 has third face S3 opposing main face 50 of substrate 12.
Sensor electrodes 18A are disposed on first face 51 of sensor element 280. Moreover, sensor electrodes 18A each have end E1 opposing third face S3 of sensor element 280.
Substrate electrodes 35 are disposed on main face 50 of substrate 12. Substrate electrodes 35 each have end E2.
The contact point between solder 11 and sensor element 280 is disposed on first face 51.
In other words, the contact point between sensor element 280 and solder 11 is disposed between third face S3 or second face S2 and end E1. Moreover, solder 11 covers end E2.
In view of the stable mounting of the sensor element on substrate 12, the shape of each sensor electrode 18A is not limited to a triangular shape, but may be, for example, a quadrangular shape, a polygonal shape, or an elliptical shape.
Note that substrate electrodes 35 are not limited to the shapes illustrated in
This structure can reduce the problem in that adjacent solders 11 are short-circuited. In other words, sensor elements 280, 290, 390, and 392 have walls 19A which provide partitions between sensor electrodes 18A. In other words, sensor elements 280, 290, 390, and 392 include recesses 19B which house sensor electrodes 18A. Sensor electrodes 18A are respectively housed in recesses 19B. Here, recesses 19B may be expressed as cutout portions. Instead of solders 11, electrically conductive pastes in which metal powder made of Ag or the like is added to a resin material may be used. In other words, solders 11 can be read as electrically conductive connection members.
As described above, the sensor according to the present disclosure is capable of increasing the reliability of joining between the sensor element and the substrate. Moreover, the sensor element can be stably and perpendicularly mounted on the substrate.
The sensor according to the present disclosure is excellent in reliability and stability, and is useful as a sensor used in, for example, an electronic device.
Number | Date | Country | Kind |
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2016-056462 | Mar 2016 | JP | national |
2016-057961 | Mar 2016 | JP | national |
This application is a Divisional application of U.S. patent application Ser. No. 16/075,127, filed on Aug. 2, 2018, which is a U.S. National Phase under 35 U.S.C. § 371 of International Patent Application No. PCT/JP2017/008405, filed on Mar. 3, 2017, which in turn claims the benefit of Japanese Patent Application No. 2016-057961, filed on Mar. 23, 2016 and Japanese Application No. 2016-056462, filed on Mar. 22, 2016, the entire disclosures of which Applications are incorporated by reference herein.
Number | Date | Country | |
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Parent | 16075127 | Aug 2018 | US |
Child | 17136750 | US |