1. Technical Field
The present disclosure relates to a signal test device.
2. Description of Related Art
Signals of electronic devices can be tested using an oscilloscope or oscillograph. The test devices usually include a plurality of probes, each of which is used to contact a device to be tested. Running the tests can be difficult because buttons and/or dials may need to be used on the test device while at the same time manually positioning the probes to be in contact with one or more devices to be tested.
Therefore, there is need for improvement in the art.
Many aspects of the present disclosure can be better understood with reference to the following drawing(s). The components in the drawing(s) are not necessarily drawn to scale, the emphasis instead being placed upon clearly illustrating the principles of the present disclosure. Moreover, in the drawing(s), like reference numerals designate corresponding parts throughout the several views.
An annular projection 132 extends from a circumference of the probe pin 13 and is located outside the probe column 12. A spring 133 is fitted about the probe pin 13 between the projection 132 and the bottom wall 121 of the probe column 12.
The first conductive piece 123 is mounted on the inner wall 120 of the probe column 12. The second conductive piece 124 is apart from and below the first conductive piece 123 in the probe column 12. A first end 240 of the second conductive piece 124 is connected to the second end 131 of the probe pin 13 through a connection rod 125. A second end 241 of the second conductive piece 124 is slidably contacted with the inner wall 120 of the probe column 12. The conductive piece 124 can move along the inner wall 120 with movement of the probe pin 13.
In use, the ground terminal 14 is electrically connected to a ground terminal of the electronic device 30. When the first end 130 of the probe pin 13 is contacted to a signal terminal of the electronic device 30, and the probe pin 13 is withdrawn into the probe column 12 to make the second conductive piece 124 contact the first conductive piece 123, a live waveform of a signal of the electronic device 30 is shown on the oscilloscope 20.
When the first end 130 of the probe pin 13 is pressed to the signal terminal of the electronic device 30, a portion of the probe pin 13 moves into the probe column 12 compressing the spring 133. The second conductive piece 124 is pushed by the connection rod 125 along the inner wall 120 to contact the first conductive piece 123. When the second conductive piece 124 contacts the first conductive piece 123, a snapshot of the waveform of the electronic device 30 is captured and shown by the oscilloscope 20, due to the first conductive piece 123 being electrically connected to the waveform capture controller of the oscilloscope 20 through the cable 15.
When the pressure applied on the signal terminal of the electronic device 30 by the probe pin 13 is removed, the spring 133 restores to extend the probe pin 13 back out the probe column 12 opening the connection between the second conductive piece 124 and the first conductive piece 123. Using the present signal test device allows a user to control capturing stills of a live waveform by manipulation of the probes they are holding rather than having to reach for buttons and/or dials on the oscilloscope.
While the disclosure has been described by way of example and in terms of the embodiment, it is to be understood that the disclosure is not limited thereto. On the contrary, it is intended to cover various modifications and similar arrangements as would be apparent to those skilled in the art. Therefore, the range of the appended claims should be accorded the broadest interpretation so as to encompass all such modifications and similar arrangements.
Number | Date | Country | Kind |
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2013100060559 | Jan 2013 | CN | national |