Claims
- 1-35. (canceled)
- 36. A method for producing an light emitting diode, comprising the steps of:
providing a substrate; forming an insulating layer on said substrate defining microcavities therein, said microcavities comprising asperites; applying a first conductive layer to a side of said substrate opposite said insulating layer; applying a second conductive layer on said insulating layer, said second conductive layer being transparent to electromagnetic radiation; and impregnating said microcavities with a gas.
- 37. The method according to claim 36, wherein:
said substrate comprises silicon.
- 38. The method according to claim 37, wherein:
said substrate is doped with antimony.
- 39. The method according to claim 37, wherein:
said substrate comprises silicon (100), type n+.
- 40. The method according to claim 36, wherein:
said substrate has a resistivity of 0.008 to 0.09 Ω-cm.
- 41. The method according to claim 36, wherein:
said substrate has a resistivity of 0.008 to 0.02 Ω-cm.
- 42. The method according to claim 36, wherein:
said insulating layer is formed by etching said substrate.
- 43. The method according to claim 42, wherein:
said insulating layer is formed by electrochemical etching.
- 44. The method according to claim 43, wherein:
said electrochemical etching is conducted using an ethanoic hydrogen fluoride solution.
- 45. The method according to claim 44, wherein:
said ethanoic hydrogen fluoride solution has a concentration of 10% to 25%.
- 46. The method according to claim 44, wherein:
said ethanoic hydrogen fluoride solution has a concentration of 24%.
- 47. The method according to claim 43, wherein:
said insulating layer is formed using a current density of 1 to 4 mA/cm2.
- 48. The method according to claim 43, wherein:
said insulating layer is formed using a current density of 2 mA/cm2.
- 49. The method according to claim 43, wherein:
said substrate is etched for from 5 to 30 minutes.
- 50. The method according to claim 43, wherein:
said substrate is etched for from 10 to 15 minutes.
- 51. The method according to claim 43, wherein:
wherein said substrate serves as an anode during etching, and platinum is used as a cathode during etching.
- 52. The method according to claim 36, wherein:
said first conductive layer comprises metal.
- 53. The method according to claim 52, wherein:
said first conductive layer comprises aluminum.
- 54. The method according to claim 36, wherein:
said second conductive layer comprises metal.
- 55. The method according to claim 36, wherein:
said second conductive layer comprises an alloy of gold and copper.
- 56. The method according to claim 55, wherein:
said alloy has a gold:copper ratio of 9:1 to 3:2.
- 57. The method according to claim 56, wherein:
said alloy has a gold:copper ratio of 4:1 to 7:3.
- 58. The method according to claim 36, wherein:
said second conductive layer has a thickness of 20 to 100 nm.
- 59. The method according to claim 36, wherein:
said second conductive layer has a thickness of 30 to 60 nm.
- 60. The method according to claim 36, wherein:
said gas comprises at least one of the group consisting of nitrogen, xenon, and argon.
- 61. The method according to claim 36, wherein:
said microcavities are impregnated to a pressure of 1 to 100 mbar.
- 62. The method according to claim 36, wherein:
said microcavities are impregnated with said gas at a temperature of 100 to 150° C.
- 63. The method according to claim 36, wherein:
said microcavities are impregnated with said gas for 24 to 36 minutes.
- 64. The method according to claim 42, further comprising the step of:
before said substrate is etched, heating said substrate.
- 65. The method according to claim 64, wherein:
said substrate is heated in vacuum.
- 66. The method according to claim 64, wherein:
said substrate is heated at a temperature of 200 to 300° C.
- 67. The method according to claim 64, wherein:
said substrate is heated for 24 to 36 minutes.
- 68. A method for producing an LED assembly, comprising the steps of:
producing a light emitting diode by:
providing a substrate; applying a first conductive layer to a first side of said substrate; etching a second side of said substrate so as to form an insulating layer defining microcavities therein, said microcavities comprising asperites; applying a second conductive layer on said insulating layer, said second conductive layer being transparent to electromagnetic radiation; and impregnating said microcavities with a gas; encapsulating said diode in an encapsulation, said encapsulation comprising a window transparent to electromagnetic radiation; and electrically connecting a first contact pin to said first conductive layer and a second contact pin to said second conductive layer.
- 69. The method according to claim 68, wherein:
said encapsulation is gas-tight.
- 70. The method according to claim 68, wherein:
said window is transparent to radiation between 200 and 400 nm in wavelength.
- 71. The method according to claim 68, wherein:
said window has a transmittance of at least 90%.
- 72. The method according to claim 68, wherein:
said contact pins are bonded to said conductive layers with conductive adhesive.
- 73. A method for producing light, comprising the steps of:
providing a substrate; applying a first conductive layer to a first side of said substrate; etching a second side of said substrate so as to form an insulating layer defining microcavities therein, said microcavities comprising asperites; applying a second conductive layer on said insulating layer; impregnating said microcavities with a gas; and applying an electrical potential between said first conductive layer and said second conductive layer such that said gas forms a plasma that emits radiation in the electromagnetic spectrum.
- 74. The light emitting diode according to claim 31, wherein:
said radiation has a wavelength between 200 and 400 nm.
- 75. The method according to claim 36, wherein:
said second conductive layer is transparent to radiation between 200 and 400 nm in wavelength.
- 76. The method according to claim 68, wherein:
said second conductive layer is transparent to radiation between 200 and 400 nm in wavelength.
Parent Case Info
[0001] This application claims the benefit of U.S. Provisional Application No. 60/364,683, filed Mar. 15, 2002 and entitled SILICON-BASED LIGHT EMITTING DIODE, which is in its entirety incorporated herewith by reference.
Provisional Applications (1)
|
Number |
Date |
Country |
|
60364683 |
Mar 2002 |
US |
Divisions (1)
|
Number |
Date |
Country |
| Parent |
10389520 |
Mar 2003 |
US |
| Child |
10851254 |
May 2004 |
US |