Claims
- 1. An interferometer comprising a source of infrared radiation, a fixed reflector, a moving reflector, and a beamsplitter for directing incident infrared radiation to said reflectors and recombining reflected radiation from said mirrors to produce a single transmitted output beam, wherein said beamsplitter comprises a composite consisting essentially of a substrate in the form of a thin, substantially uniformly thick film selected from the group consisting of polyethylene terephthalate and polypropylene and a substantially uniform thickness coating of the element germanium, the coating thickness being 1 to 2.1 microns, said composite having substantially optically flat leading and trailing surfaces.
- 2. An interferometer according to claim 1, wherein the substrate is of polyethylene terephthalate.
- 3. An interferometer according to claim 2, wherein the thickness of the substrate is about 6 microns.
- 4. An interferometer according to claim 3, wherein the thickness of the germanium coating is about 1.8 microns.
- 5. An interferometer according to claim 4, the composite additionally comprising an overcoating of a material selected from the group consisting of SiO.sub.2 and Al.sub.2 O.sub.3 of a thickness of 20-60 nm.
- 6. An interferometer according to claim 1, wherein the substrate is of polypropylene.
- 7. An interferometer according to claim 6, wherein the thickness of the substrate is 4 to 6 microns.
- 8. An interferometer according to claim 7, wherein the thickness of the substrate is about 6 microns.
- 9. An interferometer according to claim 8, wherein the thickness of the germanium coating is 1 to 2 microns.
- 10. An interferometer according to claim 9, wherein the thickness of the germanium coating is about 1.7 microns.
- 11. An interferometer according to claim 10, the composite additionally comprising an overcoating of a material selected from the group consisting of SiO.sub.2 and Al.sub.2 O.sub.3 of a thickness of 20-60 nm.
- 12. An interferometer according to claim 6, wherein the thickness of the substrate is about 4 microns, and the thickness of the germanium coating is about 1.1 microns.
Parent Case Info
This application is a Continuation-in-Part of Applicant's U.S. application Ser. No. 08/352,026 now U.S. Pat. No. 5,558,934, filed Nov. 30, 1994.
US Referenced Citations (1)
Number |
Name |
Date |
Kind |
5587831 |
Simon et al. |
Dec 1996 |
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Continuation in Parts (1)
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Number |
Date |
Country |
Parent |
352026 |
Nov 1994 |
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