Voltage regulators are used to provide a stable power supply voltage independent of load impedance, input-voltage variations, temperature, and time, and process. Low-dropout (LDO) regulators are generally distinguished by their ability to maintain regulation with small differences between supply voltage and load voltage. The dropout voltage in an LDO is the difference between the output voltage and the input voltage at which the circuit quits regulation with further reductions in input voltage.
A typical voltage regulator includes a reference voltage, an error amplifier circuitry to compare the reference voltage to an output voltage and a series pass transistor (e.g., bipolar or FET), whose voltage drop is controlled by the amplifier to maintain an output voltage at the required value. A supply voltage is provided to a first terminal of the pass transistor and the load voltage produced by the voltage drop is provided at a second terminal of the pass transistor. If, for example, as a load current decreases, causing the output voltage to rise incrementally, an error voltage will increase, the amplifier output will rise, the voltage across the pass transistor will increase, and the output voltage will return to its original value.
When a supply voltage is initially turned on it may ramp up before an amplifier circuit has time to adjust to the initial ramp up.
In one aspect, a voltage regulator includes a pass transistor that includes a first node coupled to receive an input voltage, a second node coupled to provide a regulated voltage and a control node. An amplifier circuit is coupled to produce a control voltage on a control line that is coupled to control a voltage at the pass transistor control node, based at least in part upon a reference voltage and the regulated voltage. A switch includes a transistor configured to transition between a first switch state in which the switch operatively couples the control line to a turn-off voltage having a value to turn off the pass transistor and a second switch state in which the switch decouples the control line from the turn-off voltage. A switch control circuit includes a signal delay circuit configured to maintain the switch in the first switch state during a first time interval while the input voltage ramps up and to transition the switch to the second switch state after the first time interval.
In another aspect, a method is provided for use in a voltage regulator circuit that includes, a pass transistor coupled to receive a supply voltage and to provide a regulated voltage, an amplifier circuit coupled to receive a reference voltage and an indication of the regulated voltage and to provide a control signal on a control line that is coupled to control turn on of the pass transistor. The method includes receiving a supply voltage ramp up at a supply node of a pass transistor. In response to receiving the supply voltage ramp up, a turn-off voltage that turns off the pass transistor is coupled to the control line for a time interval that is long enough for the control line to charge to at least a normal steady state value. The turn-off voltage is decoupled from the control line after the time interval.
The following description is presented to enable any person skilled in the art to create and use a DC-DC voltage regulator with soft startup. Various modifications to the embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments and applications without departing from the spirit and scope of the invention. Moreover, in the following description, numerous details are set forth for the purpose of explanation. However, one of ordinary skill in the art will realize that the invention might be practiced without the use of these specific details. In other instances, circuit structures and processes are shown in block diagram form in order not to obscure the description of the invention with unnecessary detail. Identical reference numerals may be used to represent different views of the same item in different drawings. Thus, the present invention is not intended to be limited to the embodiments shown, but is to be accorded the widest scope consistent with the principles and features disclosed herein.
More particularly, the voltage regulator 100 includes an operational amplifier circuit 102 and a pass transistor circuitry 104. A first input terminal 106 of the amplifier 102 is coupled to receive a first input signal that provides an indication of the reference voltage, Vref. A second input terminal 108 of the operational amplifier 102 is coupled to receive a second input signal that provides an indication of the internal regulated voltage, Vreg. An output terminal 110 of the amplifier 102 provides a control signal that is operatively coupled to a control line 112 and that is used to control current flow through the pass transistor 104, which in turn, determines a magnitude of the regulated voltage Vreg indicated on the second input terminal 108 of the amplifier 102. In some embodiments, the first signal indicating Vref is coupled to a negative terminal of the amplifier, and the second input signal indicating Vreg is coupled to the positive terminal of the amplifier. In accordance with some embodiments bandgap voltage reference 114 produces a Vref value that is substantially fixed irrespective of power supply variations, temperature changes and the loading on the regulator 100. The voltage regulator 100 acts as a LDO voltage regulator since it regulates the voltage Vin down from 3.3V (a higher DC voltage supply) to 1.2V (a lower DC voltage). Here the drop out voltage is 2.1V across the PNP device 202.
The pass transistor 104 is coupled to receive an external input voltage Vin at a higher first voltage level and to provide the regulated voltage Vreg at a lower second voltage level. The pass transistor 104 includes a first node 116 coupled to receive the input voltage Vin and a second node 118 coupled to provide the regulated voltage Vreg. The pass transistor 104 includes a control node 120 coupled to control turn on and turn off of the pass transistor in response to the control signal. It will be appreciated that second input signal provided to the second input terminal 108 of the amplifier 102 provides an indication of Vreg feedback from the pass transistor 102 output terminal. The regulator 100 is coupled to provide Vreg as the voltage power supply to a load VL having load capacitance CL.
In some embodiments, the amplifier 102 acts as an error amplifier that compares the first input signal Vref with the second input signal Vreg and produces the control signal that controls the pass transistor circuitry 104 so as to reduce the difference between the first and second input signals. The second input signal that is indicative of the current value of Vreg is operatively coupled via feedback line 122 to the second terminal 108 of the amplifier 102. In response to the fed back second input feedback signal having a value indicating that Vreg is higher than Vref, the amplifier 102 provides a control signal value via line 122 that decreases current through the pass transistor circuitry 104, decreasing the output voltage Vreg. In response to the fed back second input signal having a value indicating that Vreg is lower than Vref, the amplifier 102 provides a control signal value via line 122 that increases current through the pass transistor circuitry 104, increasing the output voltage Vreg.
A switch circuit 124 that includes a transistor 126 that is controllable to switch between a first switch state 129 in which the switch couples to the control line 112 a turn-off voltage VTO having a value to turn off the pass transistor circuitry 104 and a second switch state 131 in which the switch 124 decouples the control line 112 from VTO. A switch control circuit 128 that includes a signal delay circuit 130 configured to provide a switch control signal having a first value to maintain the switch 124 in the first switch state 129 during a first time interval and to provide the switch control signal having a second value to transition the switch 124 to the second switch state 131 after the first time interval. In accordance with some embodiments, VTO=Vin, and in the first switch state 129, the switch circuit 124 couples the control line 112 to the input voltage level Vin, and in the second switch state 131, the switch circuit 124 decouples control line 112 from Vin.
The switch control circuit 128 provides a first switch control signal value at a rise in Vin starting time, time t0, that causes the switch circuit 124 to couple VTO to the control line 112 at the moment when the external supply voltage Vin begins to rise to its normal operating steady state value. After a first delay interval, the switch control circuit 128 provides a second switch control signal value that causes the switch circuit 124 to decouple VTO from the control line 112. The delay circuit 130 imparts a delay between provision of the first switch control signal value and the second switch control signal value that is long enough so that the line 112 is charged to a voltage level (i.e. VTO) sufficient to prevent the pass transistor circuitry 104 from turning on while the voltage Vin rises. Moreover, the delay is long enough to accommodate estimated variations in PVT (process, voltage, temperature) that could influence the amount of time required for the voltage Vin to rise from a voltage level in a turned off state and settle at a voltage level used during normal steady state operation. After the first time interval, with the control line 112 charged to voltage VTO, the amplifier 102 takes on regulation of the operation of the pass transistor circuitry 104. Thus, prior to the amplifier's beginning to actively regulate Vreg, the line 112 is coupled to VTO, which keeps the pass transistor turned off while Vin rises, thereby protecting against Vreg voltage overshoot that could damage the load circuitry VL and also facilitating a smooth transition to voltage regulation by the amplifier 102, for example.
In accordance with some embodiments, the buffer circuit 212 also includes an inverter circuit. As explained above, a signal input to the delay circuit 130 at input line 214 has the same logical value when it is output at output line 216 after propagating through the multiple delay elements 302-1 to 302-10. The buffer/inverter 212 provides to the gate 217 of the second transistor 210, after delay imparted by each of the delay elements 302-1 to 302-10 and by the buffer inverter 212 itself, a signal that has a logical value that is the inverse of the logical value of a signal received at the input 214 of the delay circuit 130.
During normal steady state operation, an example embodiment of the voltage regulator 100 has an external voltage Vin of 3.3V, a reference voltage Vref of 1.2V and a regulated voltage Vreg of approximately 1.2V. The first resistor 204 has a value of 1K ohms. During normal steady state operation, the first transistor 206 is turned off, and Vin is decoupled from the control line 112. The third transistor 218 acts as an interface circuit operatively coupled between the amplifier 102 and the pass transistor circuitry 104 to control voltage drop across the pass transistor circuit in response to voltage on the control line 112. More specifically, the third transistor 218 acts as a current control circuit that controls operation of the PNP transistor 202 in response to voltage value on the control line 112. In the example embodiment, during normal operation, the first node 116 of the PNP transistor 202 receives external voltage Vin=3.3V, and the control line 112 has a voltage of approximately 1.5V, resulting in the third transistor 218 having VGS<0. Consequently, the third transistor 218 turns on. Current flows from Vin at the first node 116 through the first resistor 204 and the third transistor 218 to ground, resulting in VBE of the PNP transistor 202 rising above 0.6V, which in turn, results in turn-on of the PNP transistor 202. The current flow through the PNP transistor 202 produces voltage at the second node 118 of approximately 1.2V.
It will be appreciated that the reason node 118 is at 1.2V is that the PNP collector voltage, at node 118, is set by the feedback loop, and in the example embodiment, the feedback imposes the collector to be the same as the 1.2 V bandgap reference voltage per the error amplifier 102 wanting its positive/negative terminals to be the same. In other words, since the bandgap reference voltage is set to 1.2V, there is a 2.1V drop across the PNP device 202. Thus, it will be understood that if, for example, the bandgap reference voltage was to be set at 1.3V, then the drop across the PNP device 202 would be 2.0V. Moreover, if for example, the supply voltage at node 116 was to be set at 3.0V, then the drop across the PNP device 202 would be 1.8V. The voltage drop across the PNP device is set by the difference between the Vin supply and the desired Vreg value and in this example embodiment the VBE of the PNP is set by the feedback loop so node 118 tracks the bandgap reference voltage value because the error amplifier 102 wants its positive and negative terminals to be equal. Thus, the voltage on the control line 112 controls voltage of the base terminal of the PNP device 202, which is its, which sets it VBE.
During normal operation, the load circuit VL which may be a microprocessor core (not shown), for example, may from time to time draw more or less current resulting in variation in the internal regulated voltage Vreg. The load capacitance CL helps with the stability of the control loop of the design and acts as a decoupling capacitance to minimize any overshoots and undershoots when the load current changes abruptly. The amplifier 102 continually monitors value of Vreg via feedback line 122 and compares an indication of the value of Vreg with Vref. Based upon results of the comparison, the amplifier 102 provides a control signal via control line 112 that adjusts the gate voltage of the third transistor 218 so as to regulate current flow through PNP transistor 202 to thereby regulate Vreg to keep it at about 1.2V. In accordance with some embodiments, the control signal amplifies a difference between an indication of the value of Vreg and Vref. More particularly, adjustments to the gate voltage of the third transistor 218 result in corresponding changes in current flow through it. Changes in current flow through the third transistor 218 result in changes in current flow through the first resistor 204. Change in current flow through the first resistor 204 results in change in an IR voltage drop across the first resistor, which results in change in VBE of the PNP transistor 202 and corresponding change in current flow through the PNP transistor 202. Change in current flow through the PNP transistor 202 results in change in the value of Vreg at the output node 118. Thus, in the example embodiment, during normal steady state operation, a feedback loop involving the amplifier 102 and the pass transistor circuitry 104 maintains Vreg at approximately a fixed value of 1.2V. It will be appreciated that Vreg may vary somewhat during steady state operation and that it is the role of the amplifier feedback circuit to keep Vreg as fixed at about 1.2V.
During a startup time interval when Vin is initially applied, there is a risk of voltage overshoot at node 118 that could result in damage to the load circuit VL. For example, during a time frame before the feedback control circuitry that includes the amplifier 102 has settled, a voltage applied to load circuit VL may temporarily exceed the limit set for Vreg. Continuing with the above example, the voltage at node 118 may rise temporarily to 1.5V, for example, before the amplifier 102 is able to regulate it and bring it back down to the 1.2V level. The voltage overshoot may result in damage or degradation to the internal circuitry of the load circuit VL, which may be a microprocessor for example, which over the course of many Vin turn-on cycles may result in load circuit failure. The switch circuit 124 and the switch control circuit 128 achieve a soft start of the voltage regulator 100 that avoids voltage overshoot of the regulated voltage Vreg that otherwise could occur in the course of initial application of the external voltage Vin during startup of the circuit 128 (and startup of entire circuitry 100). Continuing with the explanation of the example embodiment, initially during startup, the external voltage Vin is applied and ramps up to 3.3V. In accordance with some embodiments, Vin ramps up from 0 Volts to 3.3 volts in one microsecond. The external voltage Vin is provided as an input signal to the input terminal 214 of the delay circuit 130 and after a delay time interval determined by the delay imparted by the delay elements 302-1 to 302-10 through which it propagates, the value Vin is provided at the output terminal 216 of the delay circuit 130.
Initially during startup, a 0V input signal is provided to the inverter 212, which results in the inverter following the rise of Vin and providing a 3.3V output to the gate of the second transistor 210 after the one microsecond rise time. Thus, initially, during the delay time interval before the Vin voltage propagates though the delay circuit 130, the second transistor 210 is turned off. Conversely, during the delay time interval before the Vin voltage propagates though the delay circuit 130, the first transistor 206 is turned on. The gate of the first transistor initially is at 0V and remains at 0V, tied to ground potential by the second resistor 208 while the first transistor 210 remains turned off. Thus, during the delay time interval before the Vin voltage propagates though the delay circuit 130, the first transistor 206 couples the control line 112 to Vin.
Initially during startup, a source voltage of the third transistor 218, referred to herein as VSdrive, is tied by the first resistor 204 to the value of Vin, and consequently rises to 3.3V since the third transistor 218 remains turned off. More specifically, since the gate of the third transistor 218 is coupled to the control line 112, which is coupled by the first transistor 206 to Vin. The VGS voltage of the third transistor 218 is below its threshold Voltage Vth and is therefore turned off. The strength of the first transistor 206 determines how close it pulls the control line 112 to the supply voltage level Vin. A large, strong device 206 may pull the control line 112 and gate of the third transistor 218 as high as Vin. However, in the example embodiment, a weaker and smaller device 206 was used just to ensure that over PVT the gate of the first transistor 206 would be high enough to make sure that the third transistor 218 remains turned off, by ensuring that over PVT initially the voltage on the control line 112 is high enough so the Vgs of 218 is below its Vth. Thus, initially, before the Vin voltage propagates though the delay circuit 130, third transistor 218 remains turned off. No current flows through the first resistor 204. Consequently, voltage VBE is 0V, and the PNP transistor 202 remains turned off. Therefore, during the delay time interval between the initial rise of Vin and the propagation of the Vin value through the delay circuit 130, the regulated voltage Vreg does not rise and remains at about 0V because it has no currents supplied from the PNP device.
After the delay time interval, upon arrival of the Vin value at the input of inverter 212, the inverter 212 provides a 0V signal to the gate of the second transistor 210, which turns on that device. The second resistor 208 has a relatively large value so that even a relatively small current through the second transistor 210 results in a voltage at the gate of the first transistor 206 sufficient to turn it off. In the example embodiment, the second resistor has a value of 1 Mega Ohm. Thus the second transistor 210 can easily pull the gate of the first transistor 206 high therefore turning it off.
The first transistor turns off as its VGS goes to 0V. The turn off of the first transistor 206 decouples the control line from voltage Vin. It will be appreciated that at the moment that the control line 112 is decoupled from Vin, it already has been precharged to about a value close to VTO. It will be appreciated that the precharge value on the control line 112 should be higher than VTO −Vth of the third transistor 218 over PVT. This will ensure that the third transistor 218 has its VGS<Vth, and therefore, will be turned off. Assuming that the Vth is 0.6V, then as long as the gate of the third transistor 218 is higher than 3.3−0.6=2.7V, then the third transistor 218 will remain turned off. The device size of the first transistor 206 will dictate how high the precharge voltage on control line 112 can be, and it can also vary over PVT as long as the third transistor 218 remains off. Following its decoupling, the voltage on the control line 112 drops resulting in a lower voltage applied to the gate of the third transistor 218, allowing the third transistor 218 to turn on. Current flows through the first resistor 204 causing voltage across VBE to reach a diode drop turn-on 0.6 V threshold, resulting in current flow through the PNP transistor 202 and a corresponding rise in Vreg.
As the PNP transistor 202 is enabled, voltage at node 118 rises and eventually reaches its final value of 1.2V. The amplifier 102 begins to regulate Vreg and maintain it at the desired level. Once the amplifier 102 has settled into normal operation, the VSdrive voltage at the source of the third transistor 218 and a voltage on the control line 112 settle into their normal steady state operating levels.
Thus, the first transistor 206 is turned on, coupling the control line 112 to a turn-off voltage(VTO) which may approach Vin, during a time interval from approximately the start of the rise of Vin until time corresponding when the voltage on the control line 112 has risen to a precharge value that equals or exceeds its steady state value range 607. In the example embodiment, the time interval extends from approximately the start of the rise of Vin until approximately a time corresponding to point 606, and is long enough for the voltage on the control line 112 to reach a voltage value that exceeds its steady state value range 607. In the example embodiment, after the first transistor 206 turns off, the feedback loop can be closed and the voltage on the control line 206 is being driven by the error amplifier 102, and it smoothly decreases to its steady state value range 607, where the amplifier 102 controls its value to control the smooth turn on of the third transistor 218. This in turn will smoothly turn on the PNP device. From the curves 504 and 604, it can be seen that at start up without the soft startup circuitry, the regulated voltage Vreg rises higher than the 1.35V safe level indicated by curve 506, before voltage on the control line 112 rises to its steady state operating voltage level at which the amplifier 102 provides feedback control.
The foregoing description and drawings of embodiments are merely illustrative of the principles of the invention. For example, alternatively, the pass transistor can be implemented using an using a P-Type field effect (PFET) transistor. For a PFET alternative, a PFET is substituted for the PNP 202. Specifically, in accordance with some embodiments, the PFET source is coupled to Vin, the drain is coupled to Vreg and the gate is coupled to the control line 112. Moreover, the regulated voltage may be scaled using a resistor divider network and the scaled version of the regulated voltage may be provided to the amplifier, for example. Various modifications can be made to the embodiments by those skilled in the art without departing from the spirit and scope of the invention, which is defined in the appended claims.
This patent application claims the benefit of priority to U.S. Patent Application Ser. No. 62/057,468, filed Sep. 30, 2014, which is hereby incorporated by reference herein in its entirety.
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20160091909 A1 | Mar 2016 | US |
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62057468 | Sep 2014 | US |