Claims
- 1. An ion conducting oxide layer comprising dislocations with a density of at least 1010 cm/cm3.
- 2. The layer of claim 1 wherein said dislocations are substantially continuously extending between a top surface and a bottom surface of said layer.
- 3. The layer of claim 1 having a thickness of 350 nm and less.
- 4. The layer of claim 1 being of YSZ.
- 5. The layer of claim 3 having an ionic conductivity of at least 10−6 S/cm at a temperature of 200° C.
- 6. The layer of claim 1 being of Sm-doped ceria.
- 7. The layer of claim 6 having an ionic conductivity of at least 5×10−4 S/cm at a temperature of 200° C.
- 8. The layer of claim 1 being an electrolyte membrane of a fuel cell.
- 9. The layer of claim 1, being an electrolyte membrane of a gas sensor.
- 10. A method for fabricating an ion conducting oxide layer comprising dislocations with a density of at least 1010 cm/cm3, said method including the steps of:
a. fabricating an oxidized thin film with a predetermined thickness; b. irradiating said thin film such that vacancy clusters grow to a critical size inside said thin film, such that a surrounding atomic lattice structure of said vacancy clusters collapses whereby Frank dislocation loops are formed; and wherein said thickness is predetermined such that said irradiation penetrates said thin film.
- 11. The method of claim 10, further comprising a step of heat treating said thin film following said irradiation such that said Frank dislocation loops spatially reorient forming continuous surface-to-surface dislocations, and wherein said thickness is predetermined such that said Frank dislocation loops spatially grow and reorient to said continuous surface-to-surface dislocations.
- 12. The method of claim 10, wherein said irradiation is an ion irradiation.
- 13. The method of claim 12, wherein said irradiated ions are selected from a group consisting of Argon and Xenon.
- 14. The method of claim 10, wherein said thickness is less than 350 nm.
- 15. A fuel cell comprising an oxide electrolyte membrane, said fuel cell having a continuous internal working temperature of down to 200° C.
PRIORITY CLAIM
[0001] The present invention claims priority to the U.S. provisional application titled “Solid oxide electrolyte with ion conductivity enhancement by dislocation”, filed May 29, 2002, Application No. 60/384378, Attorney Docket No. S02-108/PROV, which is hereby incorporated by reference.
[0002] The present invention also claims priority to the U.S. provisional application titled “Sub-micron Electrolyte Thin Film on Nano-Porous Substrate by Oxidation of Metal Film”, filed May 29, 2002, Application No. 60/384380, Attorney Docket No. S02-135/PROV, which is hereby incorporated by reference.
[0003] The present invention cross references the concurrently filed U.S. Application titled “Sub-micron Electrolyte Thin Film on Nano-Porous Substrate by Oxidation of Metal Film” by Yong-il Park, Fritz B. Prinz, Suk-Won Cha, Sang-Joon John Lee & Yuji Saito, Attorney Docket No. S02-135/US, which is hereby incorporated by reference.
Provisional Applications (2)
|
Number |
Date |
Country |
|
60384378 |
May 2002 |
US |
|
60384380 |
May 2002 |
US |