Number | Date | Country | Kind |
---|---|---|---|
2541003 | Sep 1975 | DEX | |
2546272 | Oct 1975 | DEX |
Entry |
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Channin "Liquid-Crystal Technique for Observing Integrated-Circuit Operation", IEEE Transactions on Electron Devices, Oct. 1974, pp. 650-652, cited by applicant. |
Keen: "Nondestructive Optical Technique for Electrically Testing Insulated-Gate Integrated Circuits," Electronics Letters, Jul. 29, 1971, vol. 17, pp. 432-433, cited by applicant. |