Claims
- 1. An optical imaging system comprising
- at least one solid state element comprising an electrode, one or more dielectric regions, and one or more semiconductor regions each of which has the same conductivity type and one of which can be depleted of mobile charges, said solid state element further having a plurality of storage cell for storing an optical image as a charge in each of said plurality of storage cells;
- means for focusing an optical image on said solid state element, said optical image thereby being stored therein;
- means which includes an integrating means for optically scanning said solid state element to read out said stored image so as to provide an electrical output which is linearly related to the total charge in each said storage cell and represents said stored image.
- 2. An optical imaging system in accordance with claim 1 wherein said system includes
- a plurality of said solid solid state elements, each capable of storing an optical image; and further wherein
- said focusing means sequentially focuses separate optical images on separate ones of said plurality of solid state elements, said separate optical images thereby being separately stored in said separate ones of said solid state elements; and
- said optical scanning means sequentially scans each of said solid state elements to read out the separately stored images therein so as to provide a plurality of electrical outputs each representing one of said separate stored images.
- 3. An optical imaging system in accordance with claim 1 and further including means responsive to said electrical output for providing a visual reproduction of said optical image.
- 4. An optical imaging system in accordance with claim 1 and further including
- means for storing said electrical output;
- means for retrieving said stored electrical output from said storing means; and
- means responsive to said retrieved electrical output for providing a visual reproduction of said optical image.
- 5. An optical imaging system in accordance with claim 1 wherein said solid state element comprises a MNOS chip having a plurality of storage cells.
- 6. A system in accordance with claim 1 wherein said optical scanning means includes an electron beam scanning means.
- 7. An optical imaging system in accordance with claim 6 wherein said electron beam scanning means comprises means for providing a scanning electron beam for producing an optical output on the screen of a cathode ray tube and means for focusing said optical output from said cathode ray tube on said at least one solid state element.
- 8. An optical imaging system in accordance with claim 4 wherein said electrical output storing means is a magnetic storage means.
- 9. An optical imaging system in accordance with claim 1 wherein said at least one solid state element is capable of storing an optical image for an extended period of time.
- 10. An optical imaging system in accordance with claim 9 wherein said extended period of time can extend up to many months.
- 11. An optical imaging system in accordance with claim 1 wherein said optically scanning means includes
- means for providing a signal from each said storage cell which is inversely proportional to the charge stored therein; and
- means, which includes said integrating means, responsive to the signal from each said cell for providing said electrical output.
- 12. An optical imaging system in accordance with claim 1 wherein said intergrating means is an electrical integrator circuit.
- 13. An optical imaging system in accordance with claim 1 wherein said optical scanning means is a light scanning means.
- 14. An optical imaging system in accordance with claim 13 wherein the light from said light scanning means is blue light.
Government Interests
The Government has rights in this invention pursuant to Contract Number AF19628-80-C-0002 awarded by the Air Force.
US Referenced Citations (14)