Number | Name | Date | Kind |
---|---|---|---|
4513418 | Bardell, Jr. et al. | Apr 1985 | |
4811344 | Chauvel et al. | Mar 1989 | |
4817093 | Jacobs et al. | Mar 1989 | |
4864570 | Savaglio et al. | Sep 1989 | |
4945536 | Hancu | Jul 1990 | |
4996689 | Samad | Feb 1991 | |
5038349 | Lipp | Aug 1991 | |
5184067 | Nozuyama | Feb 1993 | |
5187712 | Malleo-Roach et al. | Feb 1993 | |
5189675 | Nozuyama et al. | Feb 1993 | |
5230000 | Mozingo et al. | Jul 1993 |
Entry |
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E. J. McCluskey and S. Bozorgui-Nesbat, "Design for Autonomous Test," IEEE Transactions on Computers, vol. C-30, No. 11, Nov. 1981, pp. 866-867. |
S. B. Akers, "On the Use of Linear Sums in Exhaustive Testing," Proceedings, Fault Tolerant Computing Conference, pp. 148-153 (IEEE). |
E. Wu, "Towards an Optimal Pseudo-Exhaustive Test Generation Algorithm," Conference Proceedings, Built-In Self-Test Workshop, IEEE Test Technology Committee, Mar. 23-25, 1988. |