Claims
- 1. In an electrostatic type voltmeter for measuring the potential on a surface, the voltmeter including:
a probe; support means for supporting said probe in spaced relationship with said surface, said probe having a plurality of spacing element sites thereon for measuring a distance between each of said plurality of spacing element sites and a corresponding area on said surface opposite of each said plurality of spacing element sites; a plurality of electrostatic element sites, intermixed and adjacent to said plurality of spacing element sites on said probe, for measuring a voltage between each of said plurality of spacing element sites and an area on said surface adjacent to said corresponding area opposite of each said plurality of spacing element sites; and means for compensating an output signal of said probe in response to the measurements received from said plurality of spacing element sites and said plurality of electrostatic element sites.
- 2. The voltmeter of claim 1, wherein each of said plurality of electrostatic element sites includes:
a sensor component for measuring a voltage by capacitive coupling; a movable shutter that selectively overlays the sensor component; and a shutter driver for opening and closing said movable shutter.
- 3. The voltmeter of claim 2, further comprising a modulator for shuttering each driver of each of said plurality of electrostatic element sites independently from each other.
- 4. The voltmeter of claim 2, wherein said shutter defines a plurality of windows movable between a first position where the sensor component is exposed and a second position where the sensor component is covered, the shutter being adjacent to the sensor component.
- 5. The electrostatic voltmeter of claim 4, where the shutter driver comprises: a micro-electro-mechanical system having an electrostatic comb drive defining a maximum displacement (.delta .x) along an axis parallel to the comb fingers.
- 6. The electrostatic voltmeter of claim 5, where each of the plurality of windows defines a length (1) perpendicular to the comb fingers and a width (w) parallel to the comb fingers, the width being equal to the maximum displacement.
- 7. The voltmeter of claim 1, wherein said each of said plurality of spacing element sites includes:
a sensor component for measuring a voltage by capacitive coupling; a movable shutter that selectively overlays the sensor component; and a shutter driver for opening and closing said movable shutter; and a processor for translating voltage measurement to a distance measurement to said surface.
- 8. The voltmeter of claim 7, further comprising a modulator for shuttering each driver of each of said plurality of spacing element sites independently from each other.
- 9. The voltmeter of claim 7, wherein said shutter defines a plurality of windows movable between a first position where the sensor component is exposed and a second position where the sensor component is covered, the shutter being adjacent to the sensor component.
- 10. The electrostatic voltmeter of claim 9, where the shutter driver comprises: a micro-electro-mechanical system having an electrostatic comb drive defining a maximum displacement (.delta .x) along an axis parallel to the comb fingers.
- 11. The electrostatic voltmeter of claim 10, where each of the plurality of windows defines a length (l) perpendicular to the comb fingers and a width (w) parallel to the comb fingers, the width being equal to the maximum displacement.
INCORPORATED BY REFERENCE
[0001] This application is based on a Provisional Application No. 60/325,282, filed Sep. 27, 2001.
[0002] This invention relates generally to an electrostatographic printing machine and more particularly, concerns a method and an apparatus for monitoring voltages on a photoreceptor in an electrophotographic printing machine.
[0003] The following U.S. Patents are specifically incorporated by reference U.S. Pat. No. 6,177,800, filed Jan. 23, 2001, entitled “Method and Apparatus for Using a Shuttered Windows in a Micro Electro-Mechanical System,” by Kubby et al.; U.S. Pat. No. 5,517,123, filed May 14, 1996, entitled “High Sensitivity Integrated Micro Mechanical Electrostatical Potential Sensor,” by Zhao et al.; and U.S. Pat. No. 5,025,346, filed Jun. 18, 2001, entitled “Laterally Driven Resonant Microstructures,” by Tang et al.
Provisional Applications (1)
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Number |
Date |
Country |
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60325282 |
Sep 2001 |
US |