Number | Date | Country | Kind |
---|---|---|---|
57-221710 | Dec 1982 | JPX | |
57-225245 | Dec 1982 | JPX | |
57-231902 | Dec 1982 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
3588460 | Smith | Jun 1971 | |
3634760 | Murtin et al. | Jan 1972 | |
3662161 | Bergland et al. | May 1972 | |
3706843 | Laub | Dec 1972 | |
3721812 | Schmidt | Mar 1973 | |
4054785 | Lehmann | Oct 1977 | |
4093988 | Scott | Jun 1978 | |
4188583 | McCurdy | Feb 1980 | |
4222077 | Yamada | Sep 1980 | |
4264958 | Rowell, Jr. et al. | Apr 1981 | |
4321680 | Bertrand et al. | Mar 1982 | |
4346268 | Geerling | Aug 1982 | |
4393371 | Morgan-Smith | Jul 1983 |
Number | Date | Country |
---|---|---|
0056072 | Jul 1982 | EPX |
2020807 | Nov 1979 | GBX |
Entry |
---|
Mesures, vol. 44, No. 3, Mar. 1979, pp. 61-73, Paris, FR; "l'Analyseur de Spectres: Un Outil Indispensable", p. 66, column 1, line 11,-column 2, line 33; FIG. 5. |
Journal of Electronic Engineering, vol. 17, No. 164, Aug. 1980, pp. 54-56, Tokyo, JP; K. Shirakawa, "FFT Spectrum Analyzers Making Great Advances". |