Force sensing and feedback during a minimally invasive surgical procedure may bring better immersion, realism and intuitiveness to a surgeon performing the procedure. For the best performance of haptics rendering and accuracy, force sensors may be placed on a surgical instrument and as close to the anatomical tissue interaction as possible. One approach is to embed a force sensor at a distal end of a surgical instrument shaft with electrical strain gauges formed on the force transducer, through printing or additive deposition processes, to measure strain imparted to the surgical instrument.
A force sensor may experience a variety of different strain sources including: the orthogonal force of interest to be measured, moment, off axis force, off axis moment, compression/tension, torsion, ambient temperature and gradient temperature. Each of the full-bridges cancels the following stress: temperature, torsion, off axis force, and off axis moment. Each individual full-bridge output indicates stress due to force, moment, and compression/tension. The subtraction of an output value produced by a proximal full-bridge formed on a side face from an output value produced by a distal full-bridge on the same side face, cancels the moment and compression/tension, resulting in an output value that represents the orthogonal force of interest to be measured.
A surgical instrument force sensor may be critical to ensuring patient safety. Accordingly, force sensor error detection may be required to protect against harm by detecting force sensor failures. One approach to error detection may be to provide additional full-bridges to produce redundant force measurements that can be compared to detect errors. However, limited space on beam side faces makes formation of additional full-bridges on a side face impractical. Moreover, a manufacturing process typically is limited to formation of bridges at most on two side faces. Formation of bridges on four side faces would increase manufacturing cost significantly.
In one aspect, a force sensor includes a beam having a longitudinal axis and a proximal end portion and a distal end portion. A first Wheatstone bridge is disposed on a first face of the beam and includes first and second tension gauge resistors and first and second compression gauge resistors. A second Wheatstone bridge is disposed on the first face of the beam and includes third and fourth tension gauge resistors and third and fourth compression gauge resistors. The first and third tension gauge resistors and the first and third compression gauge resistors are disposed at a proximal end portion of the beam. The second and fourth tension gauge resistors and the second and fourth compression gauge resistors are disposed at a distal end portion of the beam.
In another aspect, a force sensor includes a beam having a longitudinal axis and a proximal end portion and a distal end portion. A first tension gauge half-bridge is disposed on a first face of the beam and includes first and second tension gauge resistors. A second tension gauge half-bridge is disposed on the first face of the beam and includes third and fourth tension gauge resistors. A compression gauge half-bridge is disposed on the first face of the beam and includes first and second compression gauge resistors. The first and third tension gauge resistors and the first compression gauge resistor are disposed at a proximal end portion of the beam. The second and fourth tension gauge resistors and the second compression gauge resistor are disposed at a distal end portion of the beam.
In yet another aspect, a force sensor includes a beam having a longitudinal axis and a proximal end portion and a distal end portion. A first bridge circuit is disposed on a first face of the beam and includes multiple tension gauge resistors and at least one compression gauge resistor. A second bridge circuit is disposed on the first face of the beam and includes multiple tension gauge resistors and at least one compression gauge resistor. The at least one tension resistor from each of the first and second bridge circuits and at least one compression gauge resistor from one of the first and second bridges are disposed at a proximal end portion of the beam. The at least one tension resistor from each of the first and second bridge circuits and at least one compression gauge resistor from one of the other of the first and second bridges are disposed at a distal end portion of the beam.
In the drawings, which are not necessarily drawn to scale, like numerals may describe similar components in different views. Like numerals having different letter suffixes may represent different instances of similar components. The drawings illustrate generally, by way of example, but not by way of limitation, various embodiments discussed in the present document.
view of a distal portion of a surgical instrument 202 with an elongated shaft 204, shown in partially cut-way, having a force sensor beam 206 mounted thereon, in accordance with some examples. The surgical instrument 202 includes an end effector 208, which may include articulatable jaws, for example. During a surgical procedure, the end effector 208 contacts anatomical tissue, which may result in X, Y, or Z direction forces and that may result in moment forces such as a moment MY about a y-direction axis. The force sensor beam 206, which includes a longitudinal axis 210, may be used to measure X and Y forces perpendicular to the longitudinal axis 210.
As explained more fully below, each tension strain gauge resistor RT1-RT4 and each compression strain gauge resistor RC1-RC4 includes a plurality of elongated resistor portions aligned in parallel and coupled end-to-end to form a serpentine or snake-like configuration. The elongated portions of the compression strain gauge resistors RC1-RC4 may be aligned perpendicular to the longitudinal axis 210 of the beam to sense compression strain upon the beam 206. The elongated portions of the tension strain gauge resistors RT1-RT4 may be aligned parallel to the longitudinal axis of the beam to sense tension strain upon the beam.
Referring again to
The illustrative schematic diagrams of
Both the interleaved split full-bridge and the staggered split full-bridge produce redundant first and second output voltages VO1 and VO2. The longitudinal distribution of the tension and compression gauge sensor resistors of the pair of interleaved split full-bridges of
Thus, the distribution of gauge sensor resistors of each full-bridge between proximal and distal end portions of the beam removes the effects of noise resulting from other sources of force and cancel the effects of temperature so that the first and second output signals VO1 and VO2 produce the same redundant value. The first and second output signal values VO1 and VO2 may be compared to determine whether they have different values. A determination that VO1 and VO2 have different values provides an indication of an error due to damage to the force sensor, for example.
Referring again to
Thus, both the interleaved split half-bridge and the staggered split half-bridge produce redundant first and second tension force output voltages VO1 and VO3. The longitudinal distribution of the tension and compression gauge sensor resistors of the pair of interleaved split half-bridges of
In arriving at this invention, the inventor realized that each half-bridge (both tension gauge half-bridges and compression gauge half-bridge) cancels the following stresses: moment, off axis force, off axis moment, compression/tension, torsion, and ambient temperature. The inventor also realized that each individual half-bridge output includes the following: force and gradient temperature. The inventor further realized that if VO is the output of the half bridge
Where εp and εd represent the proximate stress and the distal stress and GF represents the gauge factor.
Then subtraction in (εp−εd) in the above equation cancels: moment, off axis force, off axis moment, compression/tension, torsion, and ambient temperature, Now subtracting the ‘T gauge’ half-bridge output and ‘C gauge’ half-bridge output, we cancel the following: gradient temperature.
If Vo1 is the output of the half-bridges of ‘T gauges’ and Vo2 is the output of the half-bridge of ‘C gauges’, then the subtraction in Vo1−Vo2 cancels ambient temperature and gradient temperature and the final output after subtraction is only the sought after ‘Force’
For the split half-bridge examples of
The redundant comparison is done after extracting the force signal and temperature differential signal from the half-bridge measurements VO1, VO2 and VO3.
For X axis, for example, (indicated by ‘x’)
We can use VO1_x and VO2_x to get Force1_x and deltaT1_x
We can use VO3_x & VO2_x to get Force1_x and deltaT2_x
For Y axis (indicated by ‘y’)
We can use VO1_y & VO2_y to get Force1_y and deltaT1_y
We can use VO2_y & VO2_y to get Force2_y and deltaT2_y
For redundancy check
Force x: we check whether Force1_x and Force1_x match
Force y: we check whether Force1_y and Force2_y match
deltaT: we check whether deltaT1_x and deltaT1_y match
These comparison checks will cover failures in any of the gauges.
deltaT2_x and deltaT2_y are kind of throw away terms because they don't provide additional information.
The math used to compute force and deltaT from voltage output is as follows
Where ‘T gauge VO’ is VO1 and ‘C gauge VO’ is VO2.
Thus, the distribution of gauge sensor resistors of each tension gauge half-bridge between proximal and distal end portions of the beam removes the effects of noise resulting from other sources of force and cancel the effects of temperature so that the first and second tension gauge force output signals VO1 and VO3 produce the same redundant value. The first and second tension gauge force output signal values VO1 and VO3 may be compared to determine whether they have different values. A determination that VO1 and VO3 have different values provides an indication of an error due to damage to the force sensor, for example.
Redundant temperature values are provided by the compression output values Vo1 produced by the compression gauge half-bridges formed adjacent orthogonal faces. The compression output values Vo1 produced by the half-bridges formed adjacent orthogonal faces may be compared to determine whether they have different values. A determination that the compression gauge half-bridges on adjacent orthogonal faces have different values provides an indication of an error due to damage to the force sensor, for example.
A. Determining T-Gauge Strain and C-Gauge Strain:
Values used to determine force and change in temperature include:
Fg: Force along the sensing plane
l: Location of the force applied
M: Moment applied perpendicular to the sensing plane
FZ: Force applied parallel to the neutral axis
I: Moment of inertia
A: Area or cross section
CTE: Coefficient of thermal expansion
ΔT: Change in temperature
ε: Strain
ρ: Poisson's ratio
T-gauge strain measurement equation:
C gauge strain measurement equation:
B. Determining Force and ΔT:
For the half-bridge of
The nominal resistance of both gauges is the same R value under no load. The change in resistance dependence on strain experienced by the gauge times the gauge factor. For small resistance change, using first order approximation we get the following equation.
We can substitute the strain equation to get Vo in terms of force.
Similarly, we get an equation for the half-bridge using the compression (C) gauges.
With equations for C gauge and T gauge, we can solve for F∥ and ΔT=(ΔT1−ΔT2), we get,
C. Basic Force Measurement Using Strain:
Strain Equation for a perpendicular force applied on distal end a Cantilever Beam is
Where
We can see that the strain equation depends on the force ‘F’ applied as well as the distance ‘1’ from the sensing point. Therefore, to be able to measure the Force applied we need a second measurement to eliminate the dependence of ‘1’. The most obvious way to do this is to measure the strain at different point along the beam.
Then when we subtract the 2 measurements we get
The difference in distance is a known quantity; it is the distance between the two sensing points.
D. Force Measurements Under Noise Sources
In typical force measurement scenario there is presence of noise sources/signals that are of no interest to us but still produce a measurable strain on the beam, which we are sensing and this will result in incorrect estimation of the force applied. Some other sources of strain that could be present are
If the reference frame is selected such that the Force we want to measure is oriented along X axis then, the unwanted strain sources for measuring are, Forces (Fy, Fz), Moments (Mx, My, Mz) and Temperature (ΔT)
Therefore, the most general strain equation for a point sensing element on the cantilever beam oriented parallel to neutral axis is as follows
Where
E: Modulus of elasticity
I: Moment of inertia
r: Perpendicular distance to YZ plane passing through the neutral axis
d: Perpendicular distance to XZ plane passing through the neutral axis
A: Area of cross section
CTE: Coefficient of thermal expansion
Strain due to torsion MZ perpendicular to neutral axis
Strain due to torsion MZ parallel to neutral axis
ρr: poisson ratio of the substrate
As can be see from the equation above, a point measurement of strain will be dependent on lot of strain sources. The act of subtracting the proximal and distal measurements will also eliminate some sources of strain as common mode. The following gets eliminated
If the sensing point/element is placed symmetrically about the neutral axis (d=0), then the following does not affect the strain measurement
Therefore the strain source that is not compensated is temperature change. The most trivial way to compensate for temperature is to use Wheatstone bridge configuration using ‘C’ (compression) and ‘T’ (tension) gauges to locally eliminate strain from temperature change.
The output of the Wheatstone bridge is as follows
The resistance strain relationship of gauges is as follows
R=Ro+GF*∈*Ro
If the nominal resistance of all the gauges are same and if substitute the strain—resistance relationship and perform a first order approximation we get the following equation
When Fx is applied, the above equation reduces to the form
Vout=K*F*l
Where K is a scalar constant and l=Δl+(l+ρr)l1 and Δl=l2−l1
So, we get output signal proportional to applied force
When there is a temperature change then the strain seen by all gauges are same and the output ends up being zero, which implies temperature changes are compensated locally.
Therefore, to measure the applied force in the sensing direction (x axis) we need two Wheatstone bridge located near the proximal and distal end of the beam.
E. Measuring Force Using a Single Wheatstone Bridge
If we look at the trivial design we locally compensate for temperature, then measure two signals and externally subtract the two signals to get Force applied, but the structure of Wheatstone bridge equation has the ability subtract signals internally, so we can use this to our advantage. Also, we can arrange the gauges such that instead of temperature being compensated locally we can compensate temperature effect globally.
The temperature change seen at each measuring point can be decomposed into ambient temperature change which is same everywhere and temperature difference which is temperature delta between the ambient temperature and the temperature at the point. The ambient temperature change ends up being a common mode and just the act of subtracting the proximal and distal signal eliminates its effects.
In the above configuration, we get the output signal as
If there was not temperature difference then we can see that R1 and R2 together can measure force applied and similarly R3 and R4 can measure the force applied, since R1, R2 is Tension gauge and R3,R4 is compression gauge their relationship with force applied varies by −ρr. Therefore, the total equation will reduce to
The same configuration for temperature difference has different result, R1 and R2 measure the effect of temperature difference between the proximal and distal gauges, similarly R3 and R4 measure the effect of temperature difference. Even though the two pairs are different gauge types, they have the same sensitivity to strain due to temperature changes
So, we can roughly consider the ‘C’ gauges as temperature compensation gauges and ‘T’ gauges as the measurement gauges.
Electrically conductive measurement output lead lines L1-L4 and input signal lead lines L5-L6 disposed upon the beam, electrically couple the strain gauge resistors as shown. Measurement output lead line L1 is disposed to extend integral with the proximal, center and distal portions of the beam to electrically couple RT1 and RT3 at a node VO1−. Measurement output lead line L2 is disposed to extend integral with the proximal, center and distal portions of the beam to electrically couple RC1 and RC3 at a node VO1+. Measurement output lead line L3 is disposed to extend integral with the beam to electrically couple RC2 and RC4 at a node VO2+. Measurement output lead line L4 is disposed to extend integral with the beam to electrically couple RT2 and RT4 at a node VO2−. Input signal lead line L5 extends within the proximal portion of the beam to electrically couple RC1, RC2, RT1 and RT2 at a node V1+. Input signal lead line L6 extends within the distal portion of the beam to electrically couple RC3, RC4, RT3 and RT4 at a node V1−. The lead lines L1-L6 are disposed integral with and mechanically coupled to the beam.
Input tap nodes V1+, coupled to RT1, RT3, RC1, RC3, and V1−, coupled to RT2, RT4, RC2, RC4 act as input signal nodes that are coupled to receive positive and negative polarities of an input excitation signal. Measurement tap nodes VO1− and VO1+ at the respective junction of RT1, RT3 and the junction of RC1, RC3, act as output measurement signal nodes that are coupled to provide output measurement signals indicative of strain. Likewise, measurement tap nodes VO2− and VO2+ at the respective junction of RT2, RT4 and the junction of RC2, RC4, act as output measurement signal nodes that are coupled to provide output measurement signals indicative of strain.
Since each split bridge includes both strain gauge resistors disposed at a proximal end portion of the beam and strain gauge resistors disposed at a distal end portion of the beam, the lead lines L1-L6 that electrically couple the resistors of each bridge are relatively long. For example, lead lines that couple the resistors of the first and second split bridges of
A split bridge circuit can introduce undesirable amounts of unbalanced lead resistance between the strain gauges because the gauges are distributed at beam location across large distances relative to the size of the strain gauges. The lead resistance can affect the accuracy of the sensor measurements and introduce cross coupling and temperature dependent offset.
More particularly the conductive lead lines are integrally formed upon the beam through deposition and etching process that produce the strain gauges. Preferably, the lead lines do not change electrical properties in response to forces imparted to a beam or to a change in temperature, for example. However, the conductive lead lines extending along the beam to couple the active resistive strain gauges at opposite end portions of the beam are subjected to strain as the beam deflects in response to force imparted to the beam, which changes the resistance of the conductive lines. In some examples, the length of the lead lines may be comparable in magnitude to the overall length of the conductor line portions that make up the of the serpentine-shaped resistive strain gauge elements. A change in resistance of the electrical conduction lines can result in distortion of strain measurements since the electrical connection lines are not intended as behave as active resistive elements of the bridge circuits. Thus, there is a need to reduce lead resistances and balances what minimal lead resistance remains left over.
Referring to
Referring to the example two-bridge arrangement
Mechanically isolated lead line L1′ is disposed to extend in mechanical isolation from the beam between the proximal, center and distal portions of the beam, to electrically couple RC1 and RC3 at nodes labeled VO1− in the proximal and distal bridge halves. Isolated lead line L2′ is disposed to extend in mechanical isolation from the beam between the proximal, center and distal portions of the beam, to electrically couple RT1 and RT3 at nodes labeled VO1+ in the proximal and distal bridge halves. Isolated lead line L3′ is disposed to extend in mechanical isolation from the beam between the proximal, center and distal portions of the beam, to electrically couple RC2 and RC4 at nodes labeled VO1− in the proximal and distal bridge halves. Isolated lead line L4′ is disposed to extend in mechanical isolation from the beam between the proximal, center and distal portions of the beam, to electrically couple RT2 and RT4 at nodes labeled VO2+ in the proximal and distal bridge halves. Proximal lead line elements XP3-XP4 are coupled to voltage V1+ to thereby electrically couple RC1, RC2, RT1 and RT2 at the voltage V1+. Distal lead line elements XD3-XD4 are coupled to voltage V1− to thereby electrically couple RC3, RC4, RT3 and RT4 to the voltage V1+.
Referring to the example two-bridge arrangement
Still referring to
The coupling between nodes and lead lines is the same for the first and second example arrangements of
Conventionally, all pads typically are the same area, and therefore, have the same resistance. The wire bonds can be variable, however, which can impact the resistance of the electrical connection between the pads and the leads, which in turn, can influence zero offset between signals on the different electrical leads and also may influence temperature sensitivity of the electrical connection. Increased resistance at the input pads affects gain of the voltage, which is related to sensitivity of measurement. Increased resistance at the output measurement pads affects the zero offset. In general, gain can be more easily managed than zero offset, using software, for example.
Still referring to
As explained above, measurement redundancy is achieved using two split bridge circuits, each having a half-bridge disposed at the proximal end portion of the beam and having a half-bridge portion disposed at the distal end portion of the beam. For example, a mismatch of corresponding output measurements of the two split bridge circuits is indicative of measurement error and possible damage of one or both of the two bridge circuits. To ensure accuracy in determination of measurement mismatches, for example, the resistance of corresponding tap lead lines for first and second bridge circuits should match.
In particular, for example, the tap lead line length and lead line width between tap point of excitation input voltage V1+ and the circuit node receiving V1+A equals the tap lead line length and lead line width between tap point of voltage V1+B and circuit node receiving V1+B as indicated by the single hash marks on either side of the V1+ tap point.
The tap lead line length and lead line width between tap point of excitation input voltage V1− and the circuit node receiving V1−A equals the tap lead line length and lead line width between tap point of voltage V1− and circuit node receiving V1−B as indicated by the double hash marks on either side of the V1− tap point.
The tap lead line length and lead line width between tap point of measurement voltage VO1+ and the circuit node providing VO1+A equals the tap lead line length and lead line width between tap point of voltage VO1+ and circuit node receiving VO1+B as indicated by the three hash marks on either side of the VO1+ tap point.
The tap lead line length and lead line width between tap point of measurement voltage VO1− and the circuit node providing VO1−A equals the tap lead line length and lead line width between tap point of voltage VO1− and circuit node receiving VO1−B as indicated by the four hash marks on either side of the VO1− tap point.
The tap lead line length and lead line width between tap point of measurement voltage VO2+ and the circuit node providing VO2+A equals the tap lead line length and lead line width between tap point of voltage VO2+ and circuit node receiving VO2+B as indicated by the five hash marks on either side of the VO2+ tap point.
The tap lead line length and lead line width between tap point of measurement voltage VO1− and the circuit node providing VO2−A equals the tap lead line length and lead line width between tap point of voltage VO1− and circuit node receiving VO2−B as indicated by the five hash marks on either side of the VO2− tap point.
The equal tap lead line length ensures balanced tap line lead length resistance on each side of each tap point resulting in more accurate determinations of circuit damage based upon measurement output signal mismatches, for example.
Although illustrative examples have been shown and described, a wide range of modification, change and substitution is contemplated in the foregoing disclosure and in some instances, some features of the examples may be employed without a corresponding use of other features. One of ordinary skill in the art would recognize many variations, alternatives, and modifications. Thus, the scope of the disclosure should be limited only by the following claims, and it is appropriate that the claims be construed broadly and in a manner consistent with the scope of the examples disclosed herein. The above description is presented to enable any person skilled in the art to create and use a force sensor with a beam and a distributed bridge circuit. Various modifications to the examples will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other examples and applications without departing from the scope of the invention. In the preceding description, numerous details are set forth for the purpose of explanation. However, one of ordinary skill in the art will realize that the invention might be practiced without the use of these specific details. In other instances, well-known processes are shown in block diagram form in order not to obscure the description of the invention with unnecessary detail. Identical reference numerals may be used to represent different views of the same or similar item in different drawings. Thus, the foregoing description and drawings of examples in accordance with the present invention are merely illustrative of the principles of the invention. Therefore, it will be understood that various modifications can be made to the examples by those skilled in the art without departing from the scope of the invention, which is defined in the appended claims.
This application is a U.S. National Stage Filing under 35 U.S.C. 371 from International Application No. PCT/US2018/061113, filed Nov. 14, 2018, and published as WO 2019/099562 A1 on May 23, 2019, which claims the benefit of priority to U.S. Provisional Patent Application Ser. No. 62/586,721, filed on Nov. 15, 2017, and to U.S. Provisional Patent Application Ser. No. 62/586,166, filed on Nov. 14, 2017, each of which is incorporated by reference herein in its entirety.
Filing Document | Filing Date | Country | Kind |
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PCT/US2018/061113 | 11/14/2018 | WO |
Publishing Document | Publishing Date | Country | Kind |
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WO2019/099562 | 5/23/2019 | WO | A |
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Number | Date | Country | |
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20200278265 A1 | Sep 2020 | US |
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62586721 | Nov 2017 | US | |
62586166 | Nov 2017 | US |