The present invention relates to an SPR apparatus and method.
Surface plasmon resonance, SPR, is a sensitive technique to measure optical properties at and close to a surface. SPR setups are used to follow interactions between biomolecules in real time. These interactions are characterized by rate constants such as association and dissociation constants. Moreover, equilibrium constants are measured, as characterization of epitopes of molecules of interest. The analysis involves many different molecules, such as proteins, hormones, DNA, RNA, glycoproteins, receptors, ligands etc. When a molecule binds to the immobilized target, the effective refractive index will increase at the binding spot. This change in refractive index can be detected by use of SPR, where either the resonance angle or the resonance wavelength will change. The SPR condition is given by:
Where, kSP is the propagation constant for the surface plasmon, λ is the wavelength, ∈m is the complex dielectric function, and ∈a is the dielectric function for the ambient media, e.g. biomolecules and liquid. ∈a is equal to an effective refractive index: Na=√{square root over (∈a)}·Na is measured in RIU (refractive index units), which is unitless. For practical reasons small relative RIUs are often measured in mRIU and μRIUs. The resonance condition is fulfilled when the propagation constant of the incident light parallel to the sensor surface matches kSP:
Where θ is the incident angle, and np is the refractive index of the prism. At the resonance condition, the incident light will be absorbed in the metal film and for that certain wavelength and incident angle the reflected light will be reduced or vanish completely. The dark band that appear is denoted SPR-dip. The width of the dip depends on the wavelength and the metal used. The wavelength for which the resonance occurs is denoted the resonance wavelength.
So far the most common method to follow the interaction is to measure the resonance angle for a fixed wavelength. The resonance angle can be determined by either angular scanning or by projection of the whole angular interval of interest onto a linear detector, using a fan shaped beam. By using a two dimensional detector a line of detection spots can be used. Another method is to use wavelength scanning where the incident angle is held fixed and the wavelengths of interest are varied. The method depends on the wavelength dependence of the surface plasmon supporting metal. Also for this method a line of spots can be detected, using a two-dimensional detector.
There is a demand for detecting many spots, or a detection of a 2-dimensional area, which means that a two-dimensional sensor surface is preferred. This was first described by Yeatman in 1987, and in 1988 by Knoll et al. Because they only had two-dimensional detectors, they measured the intensity changes at the slope of the SPR-resonance dip. Measurement of only the slope of the dip has many drawbacks: limited dynamic range, low sensitivity, sensitivity to offset changes, sensitivity to dip broadening, to mention a few. The dynamic range is limited due to the fact that the SPR dip is sharp and contrast changes can only be detected at the slopes of the SPR-dip. Because an offset change e.g. from a drift at the detector or light source can't be discriminated from a contrast change an offset change will be interpreted as a change of the resonance condition, which is obviously false. The sensitivity will only be high at a small range due to the SPR dip's shape.
Johansen, U.S. Pat. No. 6,862,094, has proposed an apparatus that uses multiple wavelengths to increase the dynamic range and increase sensitivity, precision, accuracy, and throughput. There are several labs and institutions that nowadays use white light in SPR imaging. Wong et al., Tribology International 41 (2008) 356-366, and PhD thesis “Imaging surface plasmon resonance (SPR) photonic sensors”, August 2007, The city Univerity of Hong Kong, uses SPR imaging with white light and use the traditional HSV-model (Hue-Saturation-Value), proposed by Smith, Computer Graphics 1978, 12(3) 12-19, to quantify the position of the SPR-dip. The HSV-method is a cyclic transformation, i.e. it represents a “color whel” with complementary colors. Wong et al. uses the SPR-dip position to make a calibration curve between SPR-position and refractive index. The method has several limitations, because the use of an ordinary camera, a wide spectral RGB-scheme is used, which gives poor sensitivity and is limited to a closed transformation in the visible spectra, and hence a reduced wavelength regime. Because one channel is blue, silver is used which has its plasma frequency above the blue regime, but has very poor chemical properties regarding stability.
By using multi-wavelength SPR imaging, several monochromatic images from the different wavelengths are combined to a pseudo color image, U.S. Pat. No. 6,862,094, Johansen in 2000. The notation color/hue could in this context be any wavelength, wavelength band, hue, or color from below UV (ultraviolet) to above IR and FIR (infrared and far infrared). The pseudo color image is preferably a 2-dimensional image, but can be a line or spot, based on a transformation from two or more monochromatic images, based on the reflectance values from each spot on the monochromatic images, where each spot on the color image has a single value: effective wavelength, dominant wavelength, color, hue or any other arbitrary value that is related to the effective refractive index on the corresponding spot on the sensor surface.
According to an aspect, the present invention is based on calculation of effective refractive indices from reflectance values using surface plasmon resonance measurement, especially imaging, but also spot and line configurations.
According to an aspect, the present invention uses an arithmetic unit, either a separate unit, such as a processor or computer, or an embedded unit within the detector(s). The arithmetic unit reads a vector of reflectance values from the different wavelength values for each spot and calculates a color/hue value for the spot. The color/hue value is typically normalized to give an effective reflective index. The normalization procedure is favorably performed by a calibration scheme. To obtain favorable properties such as a large dynamic range, high precision and accuracy, and throughput, an apparatus with special wavelength properties are proposed. An apparatus with three or more wavelength bands, with center wavelengths spaced so that the maximum slopes of the SPR-dip are used effectively in the calculation of a color/hue value. Moreover, only wavelength bands that contribute to the signal is preferably used, other are 100% eliminated, increasing signal to noise ratio. Moreover, the separation of wavelength bands is chosen so the slope (dI/dn) of the SPR-dips (in refractive index interrogation) of adjacent wavelength bands has a slopes that are close, where I is the optical intensity at the detector, and n is the effective refractive index within the probe depth, defined by the evanescent field.
There are many different versions of functions that work with the transformation to a color/hue value, such as polynomials, centroids, weighted centroids, and wavelength to color/hue transformations.
The use of many wavelengths and the powerful transformation to a color/hue value for each spot has several advantages such as, noise rejection, offset rejection, better linearity, and larger dynamic range. The proposed apparatus with proposed algorithms gives continuous and smooth calibration curves, showing a very high sensitivity over the whole dynamic range. There are several embodiments such as many or few wavelengths, different incident angles, different refractive indices of the prism, each embodiment having advantages and limitations. Dynamic range is in this context the interval for which the measurable, e.g. effective refractive index, surface concentration, layer thickness, etc, can be determined with high or acceptable accuracy and/or precision. The term high sensitivity is used as a common nomenclature to describe high accuracy, high precision, and low detection limit, which are dependent on the system's intrinsic sensitivity (slope of the calibration curve) and, errors and noise. The term color/hue, should not to be intermixed with the HSV-system proposed by Smith.
Now embodiments of the present invention will be described. According to an embodiment, the present invention is an apparatus and method to determine effective refractive indices (or related quantities e.g. the dielectric function, surface concentration or bulk concentration, etc) at a sensor surface utilizing SPR. The invention is especially useful for two-dimensional sensor surfaces,
In
By the notation wavelength, is meant a wavelength band, symmetric or asymmetric, typically 10 nm to 50 nm, but is not limited to these values.
The light source 100 which irradiate the detector consist of discrete wavelength bands or dominating wavelengths band.
A discrete wavelength source can be designed with a “white light source” such as a Tungsten Halogen lamp, an arc lamp such as a Xenon lamp, or equivalent, with a set of filters, e.g. rotating interference filters. A discrete wavelength source can also be made of discrete wavelength devices such as light emitting diodes (LEDs) or LASERs, without or in conjunction with filters.
The use of separated discrete wavelengths means that the “resonance minimum” is not directly tracked, but the flanks of the dip are used to track the movement of the resonance. Because the SPR-dip is well defined, this is a more effective method to follow the resonance condition, using the most sensitive part of the SPR-dip. Due to a quota of differences offsets are 100% rejected, and other drifts, and dip changes are also effectively rejected.
The choice of spectra used is dependent on the application and complexity of the instrument. The wavelengths used are dependent on the incident angle, the refractive index of the prism, the SPR supporting metal, and the effective refractive index at the sensor surface. The relations between these parameters are given by the dispersion relation in equations 1 to 3. The refractive index of the prism define the incident angle, and a high refractive material such as SF11 glass (n=1.8) will lead to smaller incident angles than an ordinary crown glass such as BK7 (n=1.5). Smaller incident angle will lead to less distortion (compression of a two-dimensional image in one direction). The major mechanism for the sensor is the dispersion relation for the SPR-supporting material. Gold is stable and free-electron like, which makes it suitable as a SPR-supporting material. The dispersion relation, e.g. the dielectric function E, versus wavelength is shown in
The number of wavelengths used is a compromise between, complexity (and cost), linearity, noise and dynamic range. The more wavelengths used, the larger dynamic range can be achieved. The larger spacing used will mostly lead to worse linearity, and often more noise. However, different response signal methods have different properties. As shown in
The invention can be used for a single spot sensor or a line sensor. Because these configurations are subsets of an area detector, a detailed description is not necessary. However, the proposed invention simplifies the optical setup and hence a cost effective apparatus with high sensitivity and arbitrarily large dynamic range. If only one sensor spot is used, only a spot photo detector is needed. Accordingly, for a line sensor only a line photo detector is needed.
There are several algorithms (which are listed below) that can perform the transformation from a pattern of many wavelengths to an effective wavelength or hue, and many calibration schemes (listed below). The transformation is simplified and unambiguous, due to the fact that a single dip (or peak) is followed, emanation from the SPR condition.
The use of many wavelengths means that a larger range of effective refractive indices at the sensor spot can be measured than if only one wavelength was measured. There is often a need for large dynamic range. With a large dynamic range, small and large responses can be measured simultaneously, large difference in immobilization levels can be used, wide range of buffers and solutions can be used to mention a few. With the use of several (more than 3) sharp resonance dips, e.g. emanation from more free electron metals such as silver, or long range plasmon (LRP) setups, still an arbitrarily large dynamic range is achievable. A sharper resonance dip leads inherently to a larger signal to noise ratio.
Moreover, the use of many wavelengths makes it possible to simultaneously measure at descending and ascending flank on the surface plasmon resonance dip. This means that offset drifts and dip broadening can effectively be rejected, see
If many wavelengths are used, an extrapolation of the wavelength range can be performed. By such procedure a larger dynamic range can be obtained, without increasing the number of wavelengths. If chosen properly, the dynamic range can be extended, especially when using centroid or weighted centroid algorithms. Typical linear and second order extrapolation can be used.
Different algorithms for calculation of are outlined:
A transformation scheme from a multiple wavelength scheme is proposed, that is by the inventor denoted Oligo-Lambda. If a few wavelengths are used it is possible to use differences between reflectance values divided by another difference of other reflectance values. Using three or more wavelengths, the calculated color/hue is always continuous. By comparing the relative intensities for the different wavelengths a scheme can be outlined. Inverting the SPR-dips will create peaks, absorption, which may be easier to interpret, but not change any physical or mathematical meaning.
A
i=1−Ri (4)
Where Ai is the amplitude for the peak, as shown in
Find wavelength with maximum amplitude Ai, denoted Amax, i.e. index i is equal max. We can denote the wavelength closest to the resonance condition λmax.
There are two principal cases,
Color/Hue=−(Amax−1−Amax+1)/(Amax−Amax+1)+2·max (5)
Color/Hue=(Amax+1−Amax−1)/(Amax−Amax−1)+2·max (6)
At the ends the formula has to be explicit written as:
First segment: if i=1=max:
Color/Hue=(A1−A2)/(A0−A2) (7)
Last segment: if i=z=max:
Color/Hue=−(Az−1−Az−2)/(Az−Az−2)+2·(z) (8)
For a three wavelength system the algorithm can look as:
A2≧A1≧A0: Color/Hue=−(A1−A0)/(A2−A0)+4IV (9)
A1≧A2÷A0: Color/Hue=(A2−A0)/(A1−A0)+2III (10)
A1≧A0≧A2: Color/Hue=−(A0−A2)/(A1−A2)+2II (11)
A0>A1≧A2: Color/Hue=(A1−A2)/(A0−A2)I (4)
a and
b shows how a three wavelength system may look like with close (narrow) wavelengths (660, 635 and 685 nm, i.e. by 25 nm separation) leading to less curvature in the response signal 510, as shown in
There are three intercept between the Ri curves, and hence there are four Color/Hue segments denoted I, II, III, and IV, respectively as shown in
The Oligo-Lambda-method can have an arbitrary wide dynamic range. This is a big difference and an advantage compared to Smiths HSV-system, which is a closed system, and hence will have a reduced dynamic range.
Because there are different color/hue segments, or response segments, there may be some sensitivity (dAi/dn) differences at the color/hue segment borders. These are taken care of at the calibration procedure. An embodiment of a calibration procedure is outlined using cubic spline; As shown in
In an embodiment, each color/hue segment (I to IV) has a cubic spline function associated to it. In
Where C is the new intermediate calibration curve, cs1 and cs2 are the original overlapping calibration curves at the color/hue segment border, respectively. Nc1 is the last calibration point (refractive index) at the first segment, and Na is the refractive index (continuous). This calibration is very close to the true response, and is shown as the dotted line in
As mentioned, the calibration color/hue segment border is not exactly the same as the measured color/hue segment border. However, the calibration color/hue band border can easily be adjusted when a measured signal reaches the real hue band border (two intensities are equal). The result is an almost perfect calibration.
The hue method has several advantages, besides being a continuous function regarding changes in effective indices, the derivative of the function d(Color/Hue)/dNa is also continuous. Moreover it is has a 100% rejection of common offsets, which means an unstable light source will not give any false signals.
Polynomial curve fitting can be used to obtain a dip minimum position. An embodiment uses a second order fit, assuming equidistant wavelength bands.
λeff=[0.5+(R1−R2)/(R1−2R2+R3)]Δλ+λstart (14)
Where λeff is an effective calculated wavelength, Δλ is the separation between wavelengths, and λstart is the first wavelength. R2 corresponds to the smallest reflectance value, and R1 and R2 are the reflectance levels for the adjacent wavelengths. For four and more wavelengths, the R2 value is chosen as the smallest reflectance value. Aeff is for these cases adjusted by an integer, nλ:
λeff=[0.5+n+(R1−R2)/(R1−2R2+R3)]·Δλ+λstart (15)
The method will generate a continuous response signal (e.g. λeff or Na
λeff
Where
Corr2=4E2(Xfrac−0.5)(Xfrac+0.5) (17)
and where Xfrac is the decimal part from the relative deviation from Xmin, Xmin is the position in A where the lowest intensity occurs. The wavelength vector (λ1, λ2, λ3 . . . λn) corresponds to a vector (X1, X2, X3 . . . Xn), where the separation of the X elements are one, i.e. (1, 2 . . . n). Xfrac is Xmin minus Xrounded where Xrounded is the rounded value (i.e. Xrounded is an integer) of Xmin. Therefore Xfrac has a value between −0.5 and +0.5. E2 is the amplitude of the residuals from true position and calculated position, preferably the amplitude of the residual at the position minus the amplitude at the position between two positions. Other embodiments may define E2 as:
1) the amplitude of a least square fit of a second order polynomial with the roots at the middle between wavelength positions,
2) the peak to peak residual from the algorithm error, i.e. maximum of |λmin−λeff|.
Because Corr2 has zero amplitude when the two smallest wavelengths are equal, i.e. at wavelength set shifts, the corrected function is also continuous.
Another embodiment with a second order polynomial and a third order correction is exemplified:
λeff
Where
Corr3=−32/3E3(Xfrac−0.5)(Xfrac+0.5)Xfrac (19)
and where E3 is chosen as maximum of |λmin−λeff|. Other embodiments may use other third order polynomials, as far as two roots are at −0.5 and +0.5. A least square fit will give the amplitude E3 of the correction term.
Because the Corr3 has a zero amplitude when the two smallest wavelengths are equal, i.e. at wavelengths set shifts, the corrected function is also continuous. The correction functions are based on the difference in shape between a SPR-dip and a polynomial and hence to a high degree deterministic and can therefore be set once, or at least very seldom. The Correction functions are dependent on wavelength spacing, incident angle, and the effective refractive index.
Cubic spline functions and look up tables are easily performed by calibration from known refractive indices at the sensor surface. Useful calibration solutions are sucrose and glycerol solutions. The number of calibration points is dependent on the accuracy needed. In general, the calibration has two purposes, to calibrate for non linear movement of the reflectance minimum over the detector, and normalization of algorithm errors, i.e. for the case the mathematical algorithm does not follow the SPR-dip exactly.
These are examples of different embodiments, and the invention is not limited to equidistant wavelength spacing or the other features.
The use of centroid is particular useful if many wavelengths are used, e.g. more than five. An example of an embodiment is:
Where λeff is an effective wavelength, λi is the wavelength and h is the intensity for index i, respectively.
To enhance signal to noise ratio a weight which is dependent on the reflectance values can be added to the centroid formula. Because there is more information at the wavelengths which have low reflectance values, than the wavelengths which has high reflectance values, the SPR-dips can be inverted mathematically as shown in equation 4. An embodiment is when the weight function is a function with zero at reflectance is one, and then increasing:
The weight ωi can be an arbitrary function, but an example of an effective weight is the inverted reflectance signal itself, Ai. This leads to:
Moreover, signal to noise can be further enhanced by the introduction of a limiting level L. The introduction of L means that wavelengths that are close to 1 in reflectance will be omitted, which is favorable because they contain little signal and contain mostly noise. One embodiment will then look like:
If the limit is excluded or set to 1 in reflectance value the output signal will be insensitive to common offsets, i.e common offset rejection, COR, is 100%. The introduction of a L different from 1, introduces sensitivity errors as well as sensitivity to common offset errors. The sensitivity errors are to a high degree deterministic and can easily be corrected by the same methods descried for the polynomial method.
Yet another embodiment of the weighted centroid method looks like:
Where p is an arbitrary number. A preferred embodiment is for p=2.
Because all algorithms uses the same wavelength values, the different algorithms and variants can be processed in parallel or as post processing. This is particularly useful when time dependences are investigated, such as association and dissociation rates for molecules.
The algorithms described will properly designed, outperform reflectance measurement in every aspect, such as:
There are three major error sources:
Short time errors set signal to noise ratio, and hence sensitivity (e.g. detection limit). Short time errors are easy to detect but can be difficult to reduce.
Fluctuations from light source and detector, or fast and changing drifts are difficult to detect and therefore difficult to measure and reduce.
Long term errors such as drifts, are easy to detect and compensate.
The proposed method reduces all three error sources, and especially the dangerous fluctuations are virtually eliminated. The important short time noise is tenfold reduced over the dynamic range.
By repeatedly calculate the output signal in color/hue value or calibrated effective refractive index (or other parameter, such as surface concentration or film thickness) a vector of values are created, that can be used to monitor physical, chemical and biochemical reactions, as shown in
Filing Document | Filing Date | Country | Kind | 371c Date |
---|---|---|---|---|
PCT/SE08/51547 | 12/22/2008 | WO | 00 | 6/18/2010 |
Number | Date | Country | |
---|---|---|---|
61015486 | Dec 2007 | US |