Claims
- 1. In an addressing structure for addressing a data element, the addressing structure including an ionizable gaseous medium, a data element that stores a data signal, and cathode and anode electrodes, the addressing structure operating in response to a sufficiently large potential difference applied between the cathode and the anode electrodes to cause the ionizable gaseous medium to transition to a conductive plasma state from a nonionized state and thereby provide an interruptible electrical connection between the data element and an electrical reference to selectively address the data element, a method of forming a cathode electrode structure that during its fabrication is not susceptible to oxidation and that during operation of the addressing structure is resistant to sputter damage and exhibits a high probability of secondary electron emission, comprising:
- providing an electrically nonconductive substrate having major surfaces on opposite sides of the substrate and including multiple spaced-apart channels inscribed in one of the major surfaces;
- forming lengthwise along each of the multiple channels at least one electrode coated by a protective layer of oxidation resistant material;
- depositing on the protective layer of oxidation resistant material a mixture of refractory substance and frit particles as a discontinuous, porous layer having high oxidation resistance, sputter resistance, and secondary electron emission properties that enables the protective layer of oxidation resistant material to function during deposition of the mixture; and
- fusing the frit particles to form a glass layer that cements the refractory particles together and thereby form a unitary cathode electrode structure having high sputter resistance and high secondary electron emission properties.
- 2. The method of claim 1 in which the protective layer of oxidation resistant material includes chromium.
- 3. The method of claim 1 in which the refractory substance particles include at least one of the group of rare earth hexaborides.
- 4. The method of claim 1 in which the refractory substance particles include Cr.sub.3 Si or diamond.
- 5. The method of claim 1 in which the deposition of the mixture is accomplished by electrophoresis.
- 6. The method of claim 1 in which the fusing of the frit particles is accomplished by a baking process.
- 7. The method of claim 1 in which an adhesive interface layer of material is positioned between the electrode and one of the major surfaces.
- 8. The method of claim 7 in which the adhesive interface layer includes chromium.
- 9. A plasma addressed liquid crystal display constructed to have at least one cathode electrode structure formed in accordance with the method of claim 1.
- 10. In an addressing structure for addressing a data element, the addressing structure including an ionizable gaseous medium, a data element that stores a data signal, and cathode and anode electrodes, the addressing structure operating in response to a sufficiently large potential difference applied between the cathode and anode electrodes to cause the ionizable gaseous medium to transition to a conductive plasma state from a nonionized state and thereby provide an interruptible electrical connection between the data element and an electrical reference to selectively address the data element, a sputter resistant cathode electrode structure with high secondary electron emission properties, comprising:
- an electrically nonconductive substrate including multiple nonintersecting channels extending in a common direction, each of the multiple channels including a base portion along which an electrode extends lengthwise and has first and second major surfaces, the first major surface being farther from and the second major surface being nearer to the base portion of the channel; and
- a coating including a fused mixture of particles of a refractory substance and frit covering the electrode in each of the multiple channels to form a unitary cathode electrode structure, the refractory substance providing the electrode with high sputter resistance and high secondary electron emission properties, and the frit cementing the particles of refractory substance together and to the first major surface of the electrode.
- 11. The cathode electrode structure of claim 10 in which for each of the multiple channels, a gas impermeable protective layer is interposed between the coating and the first major surface of the electrode.
- 12. The cathode electrode structure of claim 11 in which the gas impermeable protective layer includes chromium.
- 13. The cathode electrode structure of claim 10 in which for each of the multiple channels an adhesive interface layer is positioned between the second major surface of the electrode and the base portion of the channel.
- 14. The cathode electrode structure of claim 13 in which the adhesive interface layer includes chromium.
- 15. The cathode electrode structure of claim 10 in which the refractory substance particles include at least one of the group of hexaborides.
- 16. The cathode electrode structure of claim 10 in which the refractory substance particles include Cr.sub.3 Si or diamond.
Parent Case Info
This is a continuation of application No. 08/520,996 filed on Aug. 30, 1995, now abandoned.
US Referenced Citations (12)
Continuations (1)
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Number |
Date |
Country |
Parent |
520996 |
Aug 1995 |
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