Claims
- 1. A magnetometer, comprising:
a magnetic field generator for inducing measurable magnetic fields in a work piece; a plurality of super conducting quantum interference devices for measuring magnetic fields in work piece; and a computer for interfacing with the magnetic field generator and the superconductivity quantum interferences devices to permit analysis of magnetic fields in the work piece.
- 2. The magnetometer of claim 1, wherein the magnetic field generator comprises an induction coil.
- 3. The magnetometer of claim 2, wherein the induction coil is driven by a white noise generator at multiple frequencies.
- 4. The magnetometer of claim 3, further comprising a frequency filter to facilitate the measurement of magnetic fields stimulated at predetermined frequencies.
- 5. The magnetometer of claim 1, wherein the magnetic field generator produces a substantially null field at the super conducting quantum interference devices.
- 6. The magnetometer of claim 1, wherein the plurality of super conducting quantum interference devices are linearly aligned.
- 7. The magnetometer of claim 1, wherein the super conducting quantum interference devices are formed on a single substrate.
- 8. The magnetometer of claim 7, wherein the spacing between each super conducting quantum interference device on the substrate is less than one millimeter.
- 9. The magnetometer of claim 7, wherein each super conducting quantum interference devices comprises a Josephson junction.
- 10. The magnetometer of claim 9, wherein the super conducting quantum interference devices are aligned at the Josephson junctions.
- 11. The magnetometer of claim 9, wherein the Josephson junction is a thirty degree bicrystal Josephson junction.
- 12. The magnetometer of claim 1, wherein each super conducting quantum interference device has a field sensitivity of between twenty nT/Φ0 and one hundred and eighty nT/Φ0.
- 13. The magnetometer of claim 1, wherein each super conducting quantum interference device has a field sensitivity of about one hundred nT/Φ0.
- 14. The magnetometer of claim 1, further comprising and Dewar for housing the magnetic field generator.
- 15. The magnetometer of claim 14, wherein the Dewar has minimum thickness of less than about ten millimeters.
- 16. The magnetometer of claim 15, wherein the Dewar has a minimum thickness of about four millimeters.
- 17. The magnetometer of claim 14, wherein the Dewar contains liquid nitrogen.
- 18. The magnetometer of claim 17, wherein the magnetic field generator is substantially within the liquid nitrogen bath.
- 19. The magnetometer of claim 17, wherein the super conducting quantum interference devices are substantially within the liquid nitrogen bath.
- 20. The magnetometer of claim 1, further comprising a mover for moving the work piece adjacent the super conducting interference devices.
- 21. The magnetometer of claim 20, wherein the mover comprises a stepper motor.
- 22. The magnetometer of claim 20, wherein the mover comprises an x-y table.
- 23. The magnetometer of claim 1, wherein the magnetic field generator generates a pulse induction signal.
- 24. The magnetometer of claim 1, wherein the magnetic field generator generates a sine wave induction signal.
- 25. The magnetometer of claim 1, wherein the magnetic field generator generates a spike induction signal.
- 26. The magnetometer of claim 1, wherein the magnetic field generator comprises localized current.
- 27. A magnetometer, comprising:
a white noise generator for driving an induction coil to induce measurable currents in a work piece; a magnetic field detector for measuring magnetic fields in a work piece; and a computer for interfacing with the white noise generator and the magnetic field detector to permit analysis of magnetic fields in the work piece.
- 28. The magnetometer of claim 27, wherein the induction coil produces induction signals at multiple frequencies simultaneously.
- 29. The magnetometer of claim 27, further comprising a frequency filter to facilitate the measurement of magnetic fields stimulated at predetermined frequencies.
- 30. The magnetometer of claim 27, wherein the induction coil produces a substantially null field at the magnetic field detector.
- 31. The magnetometer of claim 27, wherein the magnetic field detector comprises a plurality of super conducting quantum interference devices.
- 32. The magnetometer of claim 31, wherein the plurality of super conducting quantum interference devices are linearly aligned.
- 33. The magnetometer of claim 31, wherein the super conducting quantum interference devices are formed on a single substrate.
- 34. The magnetometer of claim 33, wherein each super conducting quantum interference device comprises a Josephson junction.
- 35. The magnetometer of claim 34, wherein the super conducting quantum interference devices are aligned at the Josephson junction.
- 36. The magnetometer of claim 34, wherein the Josephson junction is a thirty degree bicrystal Josephson junction.
- 37. The magnetometer of claim 33, wherein the distance between each aligned super conducting quantum interference device is less than one millimeter.
- 38. The magnetometer of claim 27, wherein each super conducting quantum interference device has a field sensitivity of between twenty nT/Φ0 and one hundred and eighty nT/Φ0.
- 39. The magnetometer of claim 38, wherein each super conducting quantum interference device has a field sensitivity of about one hundred nT/Φ0.
- 40. The magnetometer of claim 27, further comprising a Dewar for housing the magnetic field detector.
- 41. The magnetometer of claim 40, wherein the Dewar has a minimum thickness of less than about ten millimeters.
- 42. The magnetometer of claim 41, wherein the Dewar has a minimum thickness of about four millimeters.
- 43. The magnetometer of claim 27, wherein the Dewar contains liquid nitrogen.
- 44. The magnetometer of claim 43, wherein the induction coil is substantially within the liquid nitrogen bath.
- 45. The magnetometer of claim 43, wherein the magnetic field detector is substantially within the liquid nitrogen bath.
- 46. The magnetometer of claim 27, further comprising a mover for moving the work piece adjacent the super conducting interference devices.
- 47. The magnetometer of claim 46, wherein the mover is a stepper motor.
- 48. The magnetometer of claim 46, wherein the mover is an x-y table capable of moving the work piece in two directions.
- 49. A magnetometer, comprising:
a white noise generator for driving an induction coil to induce magnetic fields in a work piece at multiple frequencies; a plurality of super conducting quantum interference devices for measuring magnetic fields in work piece; a computer for interfacing with the white noise generator and the plurality of superconducting quantum interference devices to permit analysis of magnetic fields in the work piece; a Dewar for housing the super conducting quantum interference devices; and a mover for moving the work piece adjacent the super conducting quantum interference devices.
- 50. The magnetometer of claim 49, further comprising a frequency filter to facilitate the measurement of currents at predetermined frequencies.
- 51. The magnetometer of claim 49, wherein the induction coil produces a substantially null field at the super conducting quantum interference devices.
- 52. The magnetometer of claim 49, wherein the plurality of super conducting quantum interference devices are linearly aligned.
- 53. The magnetometer of claim 52, wherein the super conducting quantum interference devices are formed on a single substrate.
- 54. The magnetometer of claim 53, wherein the substrate of the super conducting quantum interference devices comprises a Josephson junction.
- 55. The magnetometer of claim 54, wherein the super conducting quantum interference devices are aligned at the Josephson junction.
- 56. The magnetometer of claim 49, wherein the Dewar has a minimum thickness of about four millimeters.
- 57. The magnetometer of claim 49, wherein the Dewar contains liquid nitrogen.
- 58. A method for testing a work piece with a magnetometer comprising a plurality of super conducting quantum interference devices, the method comprising:
driving a coil with a white noise generator to produce an induction signal for inducing eddy currents in the work piece; measuring the magnetic fields produced by the eddy currents in the work piece with at least one super conducting interference device to create an output; and analyzing the output to provide information relating to characteristics of the object.
- 59. The method of claim 58, wherein measuring is done by a plurality of super conducting interference devices in linear alignment.
- 60. The method of claim 59, wherein the super conducting quantum interference devices are formed on a single substrate.
- 61. The method of claim 59, wherein measuring comprises measuring the response of each super conducting quantum interference device to the induction signal.
- 62. The method of claim 61, wherein measuring comprises measuring the induction signal.
- 63. The method of claim 62, wherein analyzing comprises comparing each measured super conducting quantum interference device response to the measured induction signal.
- 64. The method of claim 58, wherein analyzing comprises determining a coherence of the output.
- 65. The method of claim 64, further comprising determining whether the coherence is acceptable.
- 66. The method of claim 58, wherein analyzing comprises determining a transfer function of the output.
- 67. The method of claim 58, wherein analyzing comprises factoring out errors due to undesired interference.
RELATED APPLICATIONS
[0001] The present application is related to, and claims priority from, U.S. Provisional Application No. 60/234,460, entitled “Squid Array Microscope with Multi-Frequency Induction,” filed Sep. 21, 2000, which is hereby incorporated by reference in its entirety.
GOVERNMENT RIGHTS
[0002] This invention was made with Government support under Contract Number W-7405-ENG-36 awarded by the United States Department of Energy to The Regents of the University of California. The Government has certain rights in the invention.
Provisional Applications (1)
|
Number |
Date |
Country |
|
60234460 |
Sep 2000 |
US |