Static relay and communication device using static relay

Information

  • Patent Grant
  • 6753487
  • Patent Number
    6,753,487
  • Date Filed
    Monday, May 20, 2002
    22 years ago
  • Date Issued
    Tuesday, June 22, 2004
    20 years ago
Abstract
Fixed contacts (23A, 24A) are provided on the upper surface of a silicon substrate (21). Signal lines (23, 24) electrically continuous with the fixed contacts (23A, 24A) are provided so as to pass through a silicon substrate (21) from the obverse surface to the reverse surface thereof. Bumps (32, 33) electrically continuous with the signal lines (23, 24) are provided on the reverse surface of the silicon substrate (21). A fixed electrode (22) is provided on both sides of the fixed contacts (23A, 24A). Wiring conductors (30, 31) electrically continuous with the fixed electrode (22) are provided so as to pass through the silicon substrate (21) from the obverse surface to the reverse surface thereof. Bumps (34, 35) electrically continuous with the wiring conductors (30, 31) are provided on the reverse surface of the silicon substrate (21). Through holes (26, 27) of the silicon substrate (21) through which the signal lines (23, 24) are passed and through holes (28, 29) of the silicon substrate (21) through which the wiring conductors (30, 31) are passed are hermetically sealed by a movable substrate (40) or a cap (50).
Description




SPECIFICATION




1. Technical Field of Invention




The present invention relates to a static relay (an electrostatic relay) that opens and closes electrical contacts by driving a movable contact by electrostatic attraction, and a communication device using the relay. More particularly, the present invention relates to a small-size electrostatic microrelay manufactured by using micromachining technology.




2. Background of Invention




As an electrostatic microrelay, one described in the paper “Micro Machined Relay for High Frequency” (Y. Komura, et al.) has previously been known.

FIG. 1

is an exploded perspective view showing the structure of this electrostatic microrelay.

FIG. 2

is the cross-sectional view schematically showing the structure of the relay. The electrostatic microrelay substantially comprises a stationary substrate


1


and a movable substrate


2


. In the stationary substrate


1


, two signal lines


5


,


6


are formed on a substrate


3


. Ends of the signal lines


5


,


6


are opposed to each other with a small gap in between, and serve as fixed contacts


5


S,


6


S, respectively. Fixed electrodes


4


A,


4


B are disposed on both sides of the signal lines


5


,


6


. In the movable substrate


2


, movable electrodes


9


A,


9


B are formed, with resilient supporting portions


10


A,


10


B in between, on both sides of a movable contact


11


formed substantially in the center. Anchors


7


A,


7


B are provided on the movable electrodes


9


A,


9


B with resilient bending portions


8


A,


8


B in between, respectively. The movable substrate


2


is resiliently supported above the stationary substrate


1


by fixing the anchors


7


A,


7


B onto the stationary substrate


1


. The movable electrodes


9


A,


9


B are opposed to the fixed electrodes


4


A,


4


B, and the movable contact


11


is opposed so as to straddle the gap between the fixed contacts


5


S and


6


S.




In this electrostatic microrelay, by applying a voltage between the fixed electrodes


4


A,


4


B and the movable electrodes


9


A,


9


B, electrostatic attraction is caused, and by the movable substrate


2


being attracted toward the stationary substrate


1


by the electrostatic attraction, the movable contact


11


makes contact with the fixed contacts


5


S,


6


S, so that the fixed contacts


5


S,


6


S are closed to thereby electrically connect the two signal lines


5


,


6


. Then, by eliminating the electrostatic attraction by removing the voltage, the movable electrodes


9


A,


9


B are returned to the original shapes by resilience and are separated from the fixed electrodes


4


A,


4


B, so that the electrical connection between the signal lines


5


and


6


is broken.




An important property of relays is the insertion loss. The insertion loss property shows the degree of signal loss caused between the signal lines when the contacts are closed. Improvement of the insertion loss property means a reduction in the signal loss.




The insertion loss property is determined mainly by the electric resistance of the signal lines and the contact resistance between the contacts. The electric resistance of the signal lines is determined mainly by the width, length and material of the signal lines. The contact resistance between the contacts is determined by the contact force between the fixed contact and the movable contact and the material of the contacts.




To reduce the insertion loss, the above-described electrostatic microrelay operates in the following manner when the contacts are closed: When a voltage is applied between the fixed electrodes


4


A,


4


B and the movable electrodes


9


A,


9


B, electrostatic attraction is caused between the fixed electrodes


4


A,


4


B and the movable electrodes


9


A,


9


B. Then, the resilient bending portions


8


A,


8


B bend, so that the movable electrodes


9


A,


9


B approach the fixed electrodes


4


A,


4


B and the movable contact


11


is attached to the fixed contacts


5


S,


6


S. At this time, since the distance between the movable electrodes


9


A,


9


B and the fixed electrodes


4


A,


4


B is shorter than the initial one, the movable substrate


2


is attracted by a larger electrostatic attraction, so that the resilient supporting portions


10


A,


10


B bend. Consequently, the movable contact


11


makes contact with the fixed contacts


5


S,


6


S with an insulating layer in between. Since the resilient supporting portions


10


A,


10


B have a larger resilience than the resilient bending portions


8


A,


8


B, the movable contact


11


is pressed onto the fixed contacts


5


S,


6


S with a heavy load.




Since the electrostatic microrelay thus has a strong contact force between the contacts, the contact resistance between the contacts is reduced, so that the insertion loss is reduced. Moreover, an excellent insertion loss property is realized by using a low-resistance material such as gold (Au) for the signal lines and the fixed and movable contacts.




Moreover, a mounting configuration of the above-described electrostatic microrelay is such that, as shown in

FIG. 3

, the electrostatic microrelay is connected to the lead frames


12


by bonding wires


13


so that the fixed electrodes


4


A,


4


B, the movable electrodes


9


A,


9


B, the fixed contacts


5


S,


6


S, the movable contact


11


and the like are made electrically continuous with the lead frames


12


, then the electrostatic microrelay is sealed in a molded package.




However, in the electrostatic microrelay with the above-described structure and mounting configuration, since the mounting configuration uses the lead frames


12


and the bonding wires


13


, the mounting area of the electrostatic relay in the mounting configuration is large compared to the chip size and the signal line length is large, so that the insertion loss increases to degrade the high-frequency property.




In the above-described electrostatic microrelay, the insertion loss of the relay can further be reduced by suppressing the electric resistance of the signal lines by the shortening signal line length by reducing the size of the electrostatic microrelay.




However, when the size of the electrostatic microrelay is reducing, the areas of the movable and fixed electrodes are also reduced, so that the electrostatic attraction that acts between the electrodes decreases. This decreases the contact force between the contacts. Consequently, the contact resistance between the contacts increases to increase the insertion loss.




As described above, in the electrostatic microrelay of the conventional structure, since there is a tradeoff relationship between the electric resistance of the signal lines and the contact force between the contacts, size reduction of the electrostatic microrelay does not always improve the insertion loss of the electrostatic microrelay.




SUMMARY OF THE INVENTION




An object of the present invention is to provide an electrostatic relay capable of reducing the insertion loss irrespective of the size of the relay and the contact resistance between the contacts. Another object is to provide an electrostatic relay capable of reducing the insertion loss without degrading the reliability of the contacts. Still another object is to provide a communications apparatus using the relay.




In an electrostatic relay of the present invention in which a movable electrode of a movable substrate resiliently supported so as to be opposed to a fixed electrode formed on a stationary substrate is driven based on electrostatic attraction caused between the fixed electrode and the movable electrode, and a plurality of fixed contacts provided on the stationary substrate and a movable contact provided on the movable substrate are brought into contact with each other and separated from each other; a sealing portion formed on a third substrate is provided that constitutes a portion that crosses a line connecting the fixed contacts and the movable contact outside a gap between the fixed contacts and the movable contact, and seals at least the fixed contacts and the movable contact by bonding them to the stationary substrate or to the movable substrate, and a through portion in which at least one of the signal lines connecting to the fixed contacts is passed through the stationary substrate from an obverse surface to a reverse surface thereof and is disposed in a position not deteriorating a sealing condition of the sealing portion.




According to the electrostatic relay of the present invention, since the signal lines are passed through the through portion formed so as to pass through the stationary substrate from the obverse surface to the reverse surface thereof, the signal lines provided in the through portion can be directed to the lower surface of the stationary substrate. Consequently, the electrostatic relay is small in size compared to a case where lead frames or the like are used. Moreover, since the signal line length can be shortened, the insertion loss of the electrostatic relay can be reduced, so that an excellent high frequency property can be obtained.




Consequently, according to the electrostatic relay of the present invention, even when the size of the electrostatic relay is the same, the insertion loss can be reduced by reducing the electric resistance of the signal lines by shortening the signal line length. Moreover, according to the electrostatic relay, the electric resistance of the signal lines is suppressed without the contact resistance between the contacts increased, so that the insertion loss property of the electrostatic relay can be improved.




Moreover, according to the electrostatic relay of the present invention, since the fixed contacts and the movable contact are sealed by the third substrate, the atmosphere (kind of gas, degree of vacuum) in the gap between the fixed contacts and the movable contact can be controlled by atmosphere setting at the time of bonding to the stationary substrate, the movable substrate and the like. Further, since the fixed contacts and the movable contact are protected by the sealing, intrusion of foreign objects from outside and deterioration caused by corrosive gases can be prevented, so that reliability and the life of the relay can be improved.




In an embodiment of the present invention, at least one of the signal lines connecting to the fixed contacts is passed through the stationary substrate from the obverse surface to the reverse surface thereof, and an opening, on a movable substrate bonded side, of a through hole through which the signal line is passed is hermetically sealed by bonding it to the movable substrate or to the third substrate through a metal layer formed around the opening. According to this embodiment, since the through hole is used as the through portion where the signal line is provided, the degree of freedom of the position where the through portion is disposed increases. Further, according to this embodiment, since the number of signal lines formed on the stationary substrate is reduced, the areas of the fixed electrode and the movable electrode can be increased without the size of the electrostatic relay increased. Since this increases the electrostatic attraction acting between the fixed electrode and the movable electrode, the contact pressure of the movable contact and the fixed contacts increases, so that the insertion loss of the electrostatic relay can be reduced. Moreover, the driving voltage of the movable substrate can be suppressed by increasing the fixed electrode and the movable electrode in size.




In another embodiment of the present invention, at least one of the signal lines passed through the stationary substrate from the obverse surface to the reverse surface thereof may be formed vertically to the stationary substrate. By forming at least one of the signal lines provided on the stationary substrate vertically to the stationary substrate, the length of the signal line is minimized, so that the effect of improving the insertion loss property can be maximized.




In still another embodiment of the present invention, at least one of wiring conductors provided on the stationary substrate, except for the signal lines connecting to the fixed electrodes being passed through the stationary substrate from the obverse surface to the reverse surface thereof, and an opening on the movable substrate bonded side of a through hole through which the wiring conductor is passed, is hermetically sealed by bonding it to the movable substrate or to the third substrate through a metal layer formed around the opening. According to this embodiment, since the wiring conductor area on the stationary substrate is reduced, the area of the electrostatic relay can be reduced. Moreover, since the fixed contacts and the movable contact are protected by the sealing, intrusion of foreign objects from outside and deterioration caused by corrosive gases can be prevented, so that reliability and the life of the relay can be improved.




In still another embodiment of the present invention, at least one ground line for a high frequency is formed between at least one pair of signal lines or wiring conductors of the signal lines or the wiring conductors formed on the stationary substrate. According to this embodiment, since the capacitive coupling between the signal lines or the wiring conductors can be suppressed by connecting the signal lines or the wiring conductors by the ground line for a high frequency, the isolation property of the electrostatic relay improves.




The isolation property shows the degree of signal leakage caused between the signal lines when the contacts are opened. Improvement of the isolation property indicates reduction in signal leakage.




In an electrostatic relay according to still another embodiment of the present invention, at least one of the signal lines or the wiring conductors is formed in the through hole formed in the stationary substrate, and at least part of the signal line or the wiring conductor is formed only on part of the through hole. According to this embodiment, even when the signal lines or the wiring conductors are opposed to each other, the capacitive coupling between the signal lines or the wiring conductors can be suppressed by partially removing the opposing parts of the signal lines or the wiring conductors, so that the isolation property of the electrostatic relay can be improved.




According to still another embodiment of the present invention, a bump is provided at an end situated on a substrate reverse surface side of at least one of the signal lines or the wiring conductors formed on the stationary substrate. According to this embodiment, since the bump is provided on the reverse surface of the stationary substrate, the electrostatic relay can directly be mounted on the circuit board by the bump. Moreover, since it is unnecessary to form wire pads on the stationary substrate, the element can be reduced in size. In general, a higher packaging density can be realized. Further, since no wire is used, the insertion loss property can be improved.




According to still another embodiment of the present invention, the opening is disposed outside an area on the stationary substrate opposed to the movable electrode or the movable contact. According to this embodiment, since the opening does not overlap the movable electrode or the movable contact, the member for closing the opening does not readily interfere with the movable electrode or the movable contact, so that the degree of freedom of the member for closing the opening increases.




According to still another embodiment of the present invention, the third substrate is bonded to the stationary substrate by a convex portion formed on a side bonded to the stationary substrate. According to this embodiment, since the third substrate has a convex portion for bonding to the stationary substrate, the movable contact and the fixed contacts can be sealed in the concave portion surrounded by the convex portion, so that a simple sealing structure can be realized.




According to still another embodiment of the present invention, at least one of the openings is disposed in a position opposed to the convex portion of the third substrate. According to this embodiment, since the opening can be closed by the convex portion provided on the third substrate, the number of members can be reduced, so that assembly of the electrostatic relay can be facilitated and the cost is reduced.




According to still another embodiment of the present invention, since the through portion is disposed in a peripheral part of the stationary substrate, the through portion can be processed easily. In particular, when the through portion has a concave shape having an opening on a periphery of the stationary substrate, the through portion can be processed more easily. For example, even when the stationary substrate is made of a glass substrate or the like, the through portion can be provided by a method such as sandblasting.




According to still another embodiment of the present invention, since the through portion is formed vertically to a plane of the stationary substrate, the effect of improving the insertion loss property can be maximized.




According to still another embodiment of the present invention, since the third substrate is bonded to the stationary substrate and the through portion is provided on the stationary substrate in a neighborhood outside an area of bonding of the stationary substrate and the third substrate, the sealing structure between the stationary substrate and the third is never deteriorated by the through portion.




According to still another embodiment of the present invention, since at least one of the wiring conductors formed on the stationary substrate is connected to the through portion, not only the signal line length but also the wiring conductor length can be shortened, so that noise resistance increases and the operation of the movable electrode is stabilized.




According to still another embodiment of the present invention, since an electrode film is provided on the reverse surface of the stationary substrate and the reverse surface electrode film is divided into a plurality of areas isolated from each other, by a slit formed on the reverse surface of the stationary substrate, the steps of manufacturing the reverse surface electrode film are simple compared to a case where the reverse surface electrode film is independently formed.




According to still another embodiment of the present invention, since a bump electrically continuous with at least one of the signal lines or the wiring conductors formed on the stationary substrate is provided on the reverse surface of the stationary substrate, the electrostatic relay can be surface-mounted by the bump, so that no lead frame or the like is necessary for mounting.




The stationary substrate and the movable substrate according to still another embodiment of the present invention are made of single-crystal silicon. It is preferable that the stationary substrate and the movable substrate be both made of single-crystal silicon, as all of the steps of manufacturing the electrostatic relay can be almost entirely processed by semiconductor processing steps.




The electrostatic relay of the present invention which is small in insertion loss and excellent in high frequency property is particularly suitable for use in a communications apparatus as a switching element switching transmission/reception signals of an antenna or an internal circuit.




The above-described elements of the present invention may be arbitrarily combined as far as possible.











BRIEF DESCRIPTION OF THE DRAWINGS





FIG. 1

is an exploded perspective view showing the structure of the conventional electrostatic microrelay;





FIG. 2

is a cross-sectional view schematically showing the structure of the electrostatic microrelay shown in

FIG. 1

;





FIG. 3

is a schematic view explaining a mounting configuration of the electrostatic microrelay shown in FIG.


1


;





FIG. 4

is an exploded perspective view of an electrostatic microrelay according to an embodiment of the present invention;





FIG. 5

is a cross-sectional view taken on the line X—X of

FIG. 4

;





FIG. 6

is a perspective view of a stationary substrate used in the electrostatic microrelay of

FIG. 4

when viewed from the reverse surface side;





FIG. 7

is a perspective view of a cap used in the electrostatic microrelay of

FIG. 4

when viewed from the reverse surface side;




FIGS.


8


(


a


),


8


(


b


) and


8


(


c


) are schematic cross-sectional views for explaining the operation of the electrostatic microrelay shown in

FIG. 4

;




FIG.


9


(


a


) through FIG.


9


(


e


) are schematic views explaining the steps of manufacturing an intermediate product of a movable substrate;




FIG.


10


(


a


) through FIG.


10


(


e


) are schematic views explaining the steps of manufacturing the stationary substrate;




FIGS.


11


(


a


) and


11


(


b


) are schematic views explaining the steps of manufacturing the cap;




FIG.


12


(


a


) through FIG.


12


(


e


) are schematic views explaining the steps of manufacturing the electrostatic microrelay by joining together the movable substrate, the stationary substrate and the cap manufactured according to the steps of FIG.


9


through

FIG. 11

;





FIG. 13

is a stepped cross-sectional view showing the structure of an electrostatic microrelay according to another embodiment of the present invention;





FIG. 14

is an exploded perspective view showing the structure of an electrostatic microrelay according to still another embodiment of the present invention;





FIG. 15

is a schematic cross-sectional view of the electrostatic microrelay shown in

FIG. 14

;





FIG. 16

is a perspective view of a reverse surface side of a stationary substrate used in the electrostatic microrelay of

FIG. 14

;





FIG. 17

is a perspective view of a movable substrate used in the electrostatic microrelay of

FIG. 14

;




FIGS.


18


(


a


),


18


(


b


) and


18


(


c


) are schematic views explaining the operation of the electrostatic microrelay of

FIG. 14

;




FIG.


19


(


a


) through FIG.


19


(


e


) are schematic views explaining the steps of manufacturing the movable substrate used in the electrostatic microrelay of

FIG. 14

;




FIG.


20


(


a


) through FIG.


20


(


e


) are schematic views for explaining the steps of manufacturing the stationary substrate used in the electrostatic microrelay of

FIG. 14

;




FIG.


21


(


a


) and FIG.


21


(


b


) are schematic views explaining the steps of manufacturing a cap used in the electrostatic microrelay of

FIG. 14

;




FIG.


22


(


a


) through FIG.


22


(


e


) are schematic views explaining the steps of manufacturing the electrostatic microrelay by joining together the movable substrate, the stationary substrate and the cap manufactured according to the steps of

FIG. 19

, FIG.


20


and

FIG. 21

;





FIG. 23

is an exploded perspective view showing the structure of an electrostatic microrelay according to still another embodiment of the present invention;





FIG. 24

is a reverse surface view of a movable substrate used in the electrostatic microrelay of

FIG. 23

;





FIG. 25

is a cross-sectional view of the electrostatic microrelay shown in

FIG. 23

;





FIG. 26

is a view showing a case where the microrelay of the present invention is used as a changeover switch in a wireless communications terminal such as a mobile telephone; and





FIG. 27

is a view showing an example in which the electrostatic microrelay of the present invention is used in a wireless communications base station.











DETAILED DESCRIPTION OF THE INVENTION




Preferred embodiments of the present invention will be described in detail with reference to the drawings.





FIG. 4

is an exploded perspective view showing the structure of an electromagnetic microrelay according to an embodiment of the present invention.

FIG. 5

is a stepped cross-sectional view taken on the line X—X of FIG.


4


. The electrostatic microrelay mainly comprises a stationary substrate


20


, a movable substrate


40


, and a cap


50


. The movable substrate


40


is attached to the upper surface of the stationary substrate


20


so as to be integrated therewith. The upper surface of the stationary substrate


20


and the movable substrate


40


are sealed between the stationary substrate


20


and the cap


50


.

FIG. 6

is a perspective view of the stationary substrate


20


viewed from the reverse surface side.

FIG. 7

is a perspective view of the cap


50


viewed from the inner surface side.




As shown in

FIG. 4

, in the stationary substrate


20


, a fixed electrode


22


and a pair of fixed contacts (


23


A,


24


A) are provided on the upper surface of a silicon substrate


21


having its surface thermally oxidized. The surface of the fixed electrode


22


is coated with an insulating film


25


. Moreover, in the stationary substrate


20


, signal lines


23


,


24


and wiring conductors


30


,


31


(through hole wiring conductors) are formed that comprise metal coatings provided on the inner surfaces of through holes


26


,


27


,


28


,


29


formed in the silicon substrate


21


. On the upper surface of the silicon substrate


21


, lands


23


A,


24


A,


30


A,


31


A are formed at edges of the signal lines


23


,


24


and the wiring conductors


30


,


31


, respectively. On the lower surface of the silicon substrate


21


, as shown in

FIG. 6

, lands


23


B,


24


B,


30


B,


31


B electrically continuous with the signal lines


23


,


24


and the wiring conductors


30


,


31


, respectively, are provided, and connection bumps


32


,


33


,


34


,


35


electrically continuous with the lands


23


B,


24


B,


30


B,


31


B, respectively, are provided. The fixed electrode


22


is electrically continuous with the land


30


A, and is connected to the connection bump


34


through the wiring conductor


30


and the land


30


B. The lands


23


A,


24


A are fixed contacts of the stationary substrate


20


(hereinafter, the lands


23


A,


24


A will be referred to as fixed contacts


23


A,


24


A). The fixed contacts


23


A,


24


A are connected to the connection bumps


32


,


33


through the signal lines


23


,


24


.




In the movable substrate


40


which is formed by processing a silicon substrate, a substantially rectangular movable electrode


43


is resiliently supported by anchors


41


A,


41


B through resilient bending portions


42


A,


42


B, and a movable contact portion


46


is resiliently supported through resilient supporting portions


45


A,


45


B in openings


44


formed inside the movable electrode


43


. The resilient bending portions


42


A,


42


B are formed by slits


49


formed along both side edges of the movable substrate


40


. The anchors


41


A,


41


B protrude downward from ends of the resilient bending portions


42


A,


42


B, respectively. The resilient supporting portions


45


A,


45


B and the movable contact portion


46


are formed by the openings


44


formed on both sides in the center of the movable electrode


43


. The resilient supporting portions


45


A,


45


B are narrow beams coupling the movable electrode


43


and the movable contact portion


46


, and are structured so that a larger resilience than that of the resilient bending portions


42


A,


42


B is obtained when the contacts are closed. In the movable contact portion


46


, a movable contact


48


made of metal is provided, with an insulating film


47


in between, on the lower surface of a flat portion (silicon substrate portion)


46


A directly supported by the resilient supporting portions


45


A,


45


B.




The movable substrate


40


is mounted on the stationary substrate


20


in the following manner: The anchors


41


A,


41


B protruding downward are fixed at two positions on the upper surface of the stationary substrate


20


, whereby the movable electrode


43


is supported so as to be floated above the stationary substrate


20


. At this time, one anchor


41


A is bonded onto the land


31


A of the stationary substrate


20


to hermetically seal the through hole


29


. Consequently, the movable electrode


43


is electrically connected to the connection bump


35


provided on the reverse surface of the stationary substrate


20


with the wiring conductor


31


in between. The other anchor


41


B is bonded to the upper surface of the silicon substrate


21


in a position isolated from the fixed electrode


22


and the like.




In a condition where the movable substrate


40


is mounted on the stationary substrate


20


, the movable electrode


43


is opposed to the fixed electrode


22


with the insulating film


25


in between. When a voltage is applied between the electrodes


22


and


43


through the connection bumps


34


,


35


and the wiring conductors


30


,


31


, the movable electrode


43


is attracted to the fixed electrode


22


by the electrostatic attraction caused between the fixed electrode


22


and the movable electrode


43


. The movable contact


48


is opposed to the fixed contacts


23


A,


24


A, and makes contact with the fixed contacts


23


A,


24


A to thereby close the fixed contacts


23


A,


24


A, so that the signal lines


23


,


24


are electrically connected. However, the movable contact


48


does not overhang the through holes


26


,


27


and makes contact only with a part of the lands so as not to interfere with fixed contact sealing portions


53


,


54


described later.




The cap


50


is made of a glass substrate such as Pyrex. As shown in

FIG. 7

, a concave portion


51


is formed on the lower surface of the cap


50


. A gap sealing portion


52


is formed on the periphery of the lower surface of the cap


50


. The fixed contact sealing portions


53


,


54


are provided inside the gap sealing portion


52


. Metal films


53


A,


54


A are provided on the lower surfaces of the fixed contact sealing portions


53


,


54


. The gap sealing portion


52


is hermetically fixed to the upper surface of the periphery of the stationary substrate


20


, and hermetically seals the through hole


28


where the land


30


A is provided. The fixed contact sealing portions


53


,


54


are hermetically fixed onto the fixed contacts


23


A,


24


A so as to close the through holes


26


,


27


where the fixed contacts


23


A,


24


A are provided. Since the anchor


41


A of the movable substrate


40


closes the through hole


29


of the land


31


A, the fixed electrode


22


, the movable substrate


40


and the like on the upper surface of the stationary substrate


20


are hermetically sealed between the stationary substrate


20


and the cap


50


to be protected from dust and corrosive gases.




Next, the operation of the electrostatic microrelay will be described with reference to FIG.


8


. In a condition where no voltage is applied between the fixed electrode


22


and the movable electrode


43


, as shown in FIG.


8


(


a


), the stationary substrate


20


and the movable substrate


40


are kept parallel to each other, and the movable contact


48


is separated from the fixed contacts


23


A,


24


A.




When a voltage is applied between the movable electrode


43


and the fixed electrode


22


from the connection bumps


34


,


35


, electrostatic attraction is caused between the electrodes


22


and


43


. Consequently, as shown in FIG.


8


(


b


), the movable electrode


43


approaches the fixed electrode


22


against the resilience of the resilient bending portions


42


A,


42


B, so that the movable contact


48


abuts against the fixed contacts


23


A,


24


A.




As shown in FIG.


8


(


c


), even after the movable contact


48


abuts against the fixed contacts


23


A,


24


A, the movable electrode


43


continues moving until abutting against the insulating film


25


on the fixed electrode


22


. The movable contact


48


exerts a resilience corresponding to the amount of bend of the resilient supporting portions


45


A,


45


B on the fixed contacts


23


A,


24


A to increase the contact pressure, so that the movable substrate


40


uniformly abuts against the stationary substrate


20


. As a result, a desired contact reliability is obtained when the contacts are closed.




When the applied voltage is removed, the movable electrode


43


is separated from the fixed electrode


22


by the resiliences of both of the resilient bending portions


42


A,


42


B and the resilient supporting portions


45


A,


45


B. Because of this, the separating operation is performed with reliability. Thereafter, the movable electrode


43


continues moving upward by the resilience of only the resilient bending portions


42


A,


42


B, and the movable contact


48


is separated from the fixed contacts


23


A,


24


A to return to its initial state.




Next, a method for manufacturing the electrostatic microrelay having the above-described structure will be described with reference to FIG.


9


through FIG.


10


. First, an intermediate product of the movable substrate


40


is made according to the steps of FIG.


9


. That is, as shown in FIG.


9


(


a


), an SOI (Silicon On Insulator) wafer


64


comprising an Si layer


61


, an SiO


2


layer (oxide film)


62


and an Si layer


63


from below is prepared. Then, to form the anchors


41


A,


41


B on the lower surface of the Si layer


61


, the lower surface of the Si layer


61


is wet-etched, for example, with a silicon oxide film


65


as a mask and TMAH as the etchant, thereby forming the anchors


41


A,


41


B protruding downward as shown in FIG.


9


(


b


). Then, as shown in FIG.


9


(


c


), after the insulating film


47


made of SiO


2


is formed by thermally oxidizing the lower surface of the silicon layer


61


, the lower surface of one anchor


41


A is exposed from the insulating film


47


, and P (phosphorus) is poured into the exposed surface to form a conductive layer. Then, as shown in FIG.


9


(


d


), after the lower surface of the other anchor


41


B is opened, a metal film


66


of Au or the like is provided on the lower surface of each of the anchors


41


A,


41


B, and at the same time, the movable contact


48


of Au or the like is formed on the insulating film


47


substantially in the center of the lower surface of the Si layer


61


. Then, the insulating film


47


is removed by etching. The insulating film


47


on the lower surface of the movable contact


48


is left without being etched, because it is covered with the movable contact


48


. Consequently, a two-layer structure of the insulating film


47


and the movable contact


48


is formed.




Next, the stationary substrate


20


is formed according to the steps of FIG.


10


. That is, the silicon substrate


21


as shown in FIG.


10


(


a


) is prepared, and the through holes


26


,


27


,


28


,


29


are formed in four positions by deep-etching the silicon substrate


21


. As shown in FIG.


10


(


b


), an insulating coating


67


of SiO


2


is formed on the surface of the silicon substrate


21


by thermally oxidizing the silicon substrate


21


. Then, by depositing an electrode metal on the insulating coating


67


and patterning the electrode metal, the fixed electrode


22


is formed in each fixed electrode formed position as shown in FIG.


10


(


c


). Likewise, the fixed contacts


23


A,


24


A and the lands


30


A,


31


A are formed by use of Au or the like at the edges of the through holes


26


,


27


,


28


,


29


by photolithography as shown in FIG.


10


(


d


). Then, the surface of the fixed electrode


22


is covered with the insulating film


25


as shown in FIG.


10


(


e


) to complete the stationary substrate


20


.




The cap


50


is formed according to the steps of FIG.


11


. The fixed contact sealing portions


53


,


54


are formed on the lower surface of a prepared glass substrate


68


as shown in FIG.


11


(


a


). For example, the glass substrate


68


is wet-etched from below with Cr as the mask and HF as the etchant to thereby form the concave portion


51


on the lower surface of the glass substrate


68


. Therefore, the gap sealing portion


52


is provided on the periphery of the lower surface of the glass substrate


68


, and the fixed contact sealing portions


53


,


54


protruding downward are formed. Then, the metal films


53


A,


54


A of Au or the like are formed on the lower surface of the fixed contact sealing portions


53


,


54


to complete the cap


50


as shown in FIG.


11


(


b


).




Then, as shown in FIG.


12


(


a


), the anchors


41


A,


41


B of the SOI wafer


64


are integrally bonded onto the stationary substrate


20


by Au/Au bonding or the like. Then, as shown in FIG.


12


(


b


), the upper surface of the SOI wafer


64


is etched with an alkaline etchant such as TMAH or KOH. The upper surface of the SOI wafer


64


is etched until the SiO


2


layer


62


is reached so that the SiO


2


layer


62


is exposed. Consequently, the Si layer


61


which is thin is formed above the stationary substrate


20


except for parts of the anchors


41


A,


41


B.




Then, after the oxide film


62


on the Si layer


61


is removed by use of a fluorine etchant so that the Si layer


61


that becomes the movable contact


43


is exposed, the unnecessary parts on the periphery is removed by performing mold etching by dry etching using RIE or the like, and the slits


49


and the openings


44


are provided to form the resilient bending portions


42


A,


42


B, the resilient supporting portions


45


A,


45


B and the movable contact portion


46


to complete the movable substrate


40


on the stationary substrate


20


as shown in FIG.


12


(


c


).




Then, as shown in FIG.


12


(


d


), the cap


50


is placed over the stationary substrate


20


integrally bonded to the movable substrate


40


, and the fixed contact sealing portions


53


,


54


are integrally bonded to the fixed contacts


23


A,


24


A by Au/Au bonding or the like and the gap sealing portion


52


is integrally bonded to the periphery of the upper surface of the stationary substrate


20


and the land


30


A. Then, the signal lines


23


,


24


and the wiring conductors


30


,


31


are formed in the through holes


26


,


27


,


28


,


29


, and the lands


23


B,


24


B,


30


B,


31


B and the connection bumps


32


,


33


,


34


,


35


are formed on the lower surface of the stationary substrate


20


to complete the electrostatic microrelay as shown in FIG.


12


(


e


).




As is apparent from the description given above, according to the electrostatic microrelay of the present invention, since the signal lines


23


,


24


are passed through the silicon substrate


21


from the obverse surface to the reverse surface thereof, the signal line length can be shortened, so that the insertion loss of the electrostatic microrelay can be reduced. In particular, since the signal lines


23


,


24


are formed vertically to the plane of the substrate, the effect of improving the insertion loss property can be maximized. Moreover, since the openings of the through holes


26


,


27


,


28


,


29


are bonded to the fixed contact sealing portions


53


,


54


, the gap sealing portion


52


and the anchor


41


A, and the fixed contacts


23


A,


24


A and the movable contact


48


are protected by sealing, reliability and the life of the electrostatic microrelay can be improved.




Moreover, since the wiring conductor


31


for driving the movable electrode


43


and the wiring conductor


30


for earthing the fixed electrode


22


are also passed through the silicon substrate


21


from the obverse surface to the reverse surface thereof, the signal lines


23


,


24


and the wiring conductors


30


,


31


are not formed on the upper surface of the stationary substrate


20


and the area of the fixed electrode


22


can be increased accordingly, so that the driving voltage can be suppressed.




Moreover, in the electrostatic microrelay of the present invention, since the bumps


32


,


33


,


34


,


35


electrically continuous with the signal lines


23


,


24


and the wiring conductors


30


,


31


on the reverse surface side of the stationary substrate


20


are provided, the electrostatic microrelay can be directly mounted on the circuit board. That is, bonding wires for connection to the circuit board are unnecessary, so that a more excellent insertion loss property can be obtained. Further, since wire pads for connecting bonding wires, lead frames of the package and the like are unnecessary, the electrostatic microrelay and its mounting configuration can be reduced in size.




Further, by constructing the stationary substrate


20


and the movable substrate


40


of single-crystal silicon, all the manufacturing steps can be processed by semiconductor processing steps, so that dimensional accuracy variations can be suppressed. Moreover, since single-crystal silicon has high fatigue resistance and high creep resistance, longevity can be improved. Furthermore, since the stationary substrate


20


is made of single-crystal silicon, the through holes


26


,


27


,


28


,


29


can be formed in the silicon substrate


21


with little dependence on substrate thickness by wet etching using DRIE or a (110) wafer.




Next, another embodiment of the present invention will be described.

FIG. 13

is a cross-sectional view (a view of a stepped cross section corresponding to the cross section taken on X—X of

FIG. 4

) showing the structure of an electrostatic microrelay according to the embodiment of the present invention. In this embodiment, a ground line


69


for a high frequency is formed between the signal lines


23


and


24


electrically continuous with the fixed electrode


22


to thereby suppress the capacitive coupling between the signal lines


23


and


24


. By thus suppressing the capacitive coupling between the signal lines


23


and


24


, an excellent isolation property can be obtained. Moreover, this embodiment may be structured so that the signal lines


23


,


24


and the wiring conductors


30


,


31


are formed not on the entire circumferences of the through holes


26


,


27


,


28


,


29


but on parts of the through holes


26


,


27


,


28


,


29


, that is, the signal lines


23


,


24


or the wiring conductors


30


,


31


are not formed on the halves on the sides close to each other. With this structure, the capacitive coupling between the signal lines


23


and


24


or the wiring conductors


30


and


31


can be suppressed, so that an excellent isolation property can be obtained.




In the above-described embodiments, when the movable substrate


40


is bonded to the stationary substrate


20


and when the cap


50


is bonded to the stationary substrate


20


integrated with the movable substrate


40


, Au/Si bonding, anode bonding or silicon fusion bonding may be used.




Moreover, a glass substrate may be used as a substitute for the silicon substrate


21


constituting the stationary substrate


20


. Since glass is an insulator, the capacitive coupling between the wiring conductors


30


and


31


can be suppressed by the use of a glass substrate




Next, still another embodiment of the present invention will be described.

FIG. 14

is an exploded perspective view showing the structure of an electrostatic microrelay according to the embodiment of the present invention.

FIG. 15

is a cross-sectional view in a condition where the electrostatic microrelay is assembled. The electrostatic microrelay mainly comprises a stationary substrate


120


, a movable substrate


140


, and a cap


150


. The movable substrate


140


is attached to the upper surface of the stationary substrate


120


so as to be integrated therewith. The upper surface of the stationary substrate


120


and the movable substrate


140


are sealed between the stationary substrate


120


and the cap


150


.

FIG. 16

is a perspective view of the stationary substrate viewed from the reverse surface side.

FIG. 17

is a perspective view of the movable substrate


140


.




In the stationary substrate


120


, a fixed electrode


122


and a pair of fixed contacts


136


,


137


are provided on the upper surface of a glass substrate


121


. The fixed electrode


122


is surrounded by insulators


125


in a U shape. The insulators


125


are higher than the fixed electrode


122


, and protrude above the surface of the fixed electrode


122


. The pair of fixed electrodes


122


situated on both sides of the fixed contacts


136


,


137


are connected through the gap between the fixed contacts


136


and


137


. Moreover, in the stationary substrate


120


, signal lines


123


,


124


and wiring conductors


130


,


131


are formed that comprise metal coatings provided on the inner surfaces of through grooves


126


,


127


,


128


,


129


formed on sides and corners of the glass substrate


121


. On the upper surface of the glass substrate


121


, lands


123


A,


124


A,


130


A,


131


A are formed at edges of the signal lines


123


,


124


and the wiring conductors


130


,


131


, respectively. The lands


123


A,


124


A, and the lands


130


A,


131


A are electrically isolated from each other.




Electrode films


123


B,


124


B,


130


B,


131


B isolated from one another are provided on the lower surface of the glass substrate


121


as shown in FIG.


16


. The electrode films


123


B,


124


B,


130


B,


131


B are electrically continuous with the signal lines


123


,


124


and the wiring conductors


130


,


131


, and are provided with connection bumps


132


,


133


,


134


,


135


, respectively. The fixed electrode


122


is electrically continuous with the land


130


A, and is connected to the connection bump


134


through the wiring conductor


130


and the electrode film


130


B. The fixed contacts


136


,


137


of the stationary substrate


120


are electrically continuous with the lands


123


A,


124


A, respectively, and are connected to the connection bumps


132


,


133


through the signal lines


123


,


124


and the electrode films


123


B,


124


B, respectively.




The movable substrate


140


is formed by processing a substantially rectangular silicon substrate; and as shown in

FIG. 17

, resiliently supports a pair of substantially rectangular movable electrodes


143


by the anchors


141


A,


141


B through resilient bending portions


142


A,


142


B. The resilient bending portions


142


A,


142


B are formed by slits


149


formed along both side edges of the movable substrate


140


. The anchors


141


A,


141


B protrude downward from the ends of the resilient bending portions


142


A,


142


B, respectively. The resilient supporting portions


145


A,


145


B and a movable contact portion


146


are formed between the movable electrodes


143


. The resilient supporting portions


145


A,


145


B are narrow beams coupling the movable electrodes


143


and the movable contact portion


146


, and are structured so that a larger resilience than that of the resilient bending portions


142


A,


142


B is obtained when the contacts are closed. In the movable contact portion


146


, a movable contact


148


made of metal is provided, with an insulating film


147


in between, on the lower surface of a flat portion (silicon substrate portion)


146


A directly supported by the resilient supporting portions


145


A,


145


B.




The movable substrate


140


is mounted on the stationary substrate


120


in the following manner: The anchors


141


A,


141


B protruding downward are fixed at two positions on the upper surface of the stationary substrate


120


, whereby the movable electrodes


143


are supported so as to be floated above the stationary substrate


120


. At this time, one anchor


141


A is bonded onto the land


131


A of the stationary substrate


120


. Consequently, the movable electrodes


143


are electrically connected to the connection bump


135


provided on the reverse surface of the stationary substrate


120


with the wiring conductor


131


in between. The other anchor


141


B is bonded to the upper surface of the glass substrate


121


.




In the condition where the movable substrate


140


is mounted on the stationary substrate


120


in this manner, the movable electrodes


143


are opposed to the fixed electrode


122


and the insulator


125


. When a voltage is applied between the electrodes


122


and


143


through the connection bumps


134


,


135


and the wiring conductors


130


,


131


, the movable electrodes


143


are attracted to the fixed electrode


122


by the electrostatic attraction caused between the fixed electrode


122


and the movable electrodes


143


. The movable contact


148


is opposed to the fixed contacts


136


,


137


, and makes contact with the fixed contacts


136


,


137


to thereby close the fixed contacts


136


,


137


, so that the signal lines


123


,


124


are electrically connected.




The cap


150


is made of a glass substrate such as Pyrex. As shown in

FIG. 15

, a concave portion


151


is formed on the lower surface of the cap


150


. A gap sealing portion


152


surrounding the concave portion


151


is formed on the entire periphery of the cap


150


. The gap sealing portion


152


is hermetically fixed to the upper surface of the periphery of the stationary substrate


120


. Consequently, the fixed contacts


136


,


137


, the movable substrate


140


and the like on the upper surface of the stationary substrate


120


are hermetically sealed between the stationary substrate


120


and the cap


150


to be protected from dust and corrosive gases.




Next, the operation of the electrostatic microrelay will be described with reference to FIG.


18


. In a condition where no voltage is applied between the fixed electrode


122


and the movable electrodes


143


, as shown in FIG.


18


(


a


), the stationary substrate


120


and the movable substrate


140


are kept parallel to each other, and the movable contact


148


is separated from the fixed contacts


136


,


137


.




When a voltage is applied between the movable electrodes


143


and the fixed electrode


122


from the connection bumps


134


,


135


, electrostatic attraction is caused between the electrodes


122


and


143


. Consequently, as shown in FIG.


18


(


b


), the movable electrodes


143


approach the fixed electrode


122


against the resilience of the resilient bending portions


142


A,


142


B, so that the movable contact


148


abuts against the fixed contacts


136


,


137


.




As shown in FIG.


18


(


c


), even after the movable contact


148


abuts against the fixed contacts


136


,


137


, the movable electrodes


143


continue moving until abutting against the insulator


125


around the fixed electrode


122


. Because of this, the movable contact


148


exerts a resilience corresponding to the amount of bend of the resilient supporting portions


145


A,


145


B on the fixed contacts


136


,


137


to increase the contact pressure, so that the movable substrate


140


uniformly abuts against the stationary substrate


120


. As a result, a desired contact reliability is obtained when the contacts are closed.




When the applied voltage is removed, the movable electrodes


143


are separated from the fixed electrode


122


by the resiliences of both of the resilient bending portions


142


A,


142


B and the resilient supporting portions


145


A,


145


B. Because of this, the separating operation is performed with reliability. Thereafter, the movable electrodes


143


continue moving upward by the resilience of only the resilient bending portions


142


A,


142


B, and the movable contact


148


is separated from the fixed contacts


136


,


137


to return to the initial state.




Next, a method for manufacturing the electrostatic microrelay having the above-described structure will be described with reference to FIG.


19


through FIG.


22


. First, an intermediate product of the movable substrate


140


is made according to FIG.


19


. That is, as shown in FIG.


19


(


a


), an SOI (Silicon On Insulator) wafer


164


comprising an Si layer


161


, an SiO


2


layer (oxide film)


162


and an Si layer


163


from below is prepared. Then, to form the anchors


141


A,


141


B on the lower surface of the Si layer


161


, the lower surface of the Si layer


161


is wet-etched, for example, with a silicon oxide film


165


as the mask and TMAH as the etchant, thereby forming the anchors


141


A,


141


B protruding downward as shown in FIG.


19


(


b


). Then, as shown in FIG.


19


(


c


), after the insulating film


147


made of SiO


2


is formed by thermally oxidizing the lower surface of the silicon layer


161


, the lower surface of one anchor


141


B is exposed out of the insulating film


147


, and P (phosphorus) is poured into the exposed surface to form a conductive layer


144


. Then, as shown in FIG.


19


(


d


), after the lower surface of the other anchor


141


A is opened, a metal film


166


of Au or the like is provided on the lower surface of the anchor


141


B, and at the same time, the movable contact


148


of Au or the like is formed on the insulating film


147


substantially in the center of the lower surface of the Si layer


161


. Then, the insulating film


147


is removed by etching. The insulating film


147


on the lower surface of the movable contact


148


is left without being etched, because it is covered with the movable contact


148


. Consequently, a two-layer structure of the insulating film


147


and the movable contact


148


is formed.




Next, the stationary substrate


120


is formed according to the steps of FIG.


20


. That is, the glass substrate


121


as shown in FIG.


20


(


a


) is prepared, and sandblasting is performed on the glass substrate


121


to thereby form the through grooves


126


,


127


,


128


,


129


in a total of four positions on both sides and the corners as shown in FIG.


20


(


b


). Then, as shown in FIG.


20


(


c


), electrode films


138


,


139


are formed on the obverse and reverse surfaces of the glass substrate


121


by a method such as sputtering, vapor deposition or plating. At the same time, electrode films are formed on the inner surfaces of the through grooves


126


,


127


,


128


,


129


by a method such as sputtering, vapor deposition or plating to thereby form the signal lines


123


,


124


and the wiring conductors


130


,


131


. Then, as shown in FIG.


20


(


d


), the fixed contacts


136


,


137


, the fixed electrode


122


and the lands


123


A,


124


A,


130


A,


131


A are formed by patterning the electrode film


138


on the surface of the glass substrate


121


, and as shown in FIG.


20


(


e


), the insulators


125


are formed around the fixed electrode


122


.




The cap


150


is formed according to the steps of FIG.


21


. For this, a glass substrate


168


as shown in FIG.


21


(


a


) is prepared, and the glass substrate


168


is wet-etched from below, for example, with Cr as the mask and HF as the etchant to thereby form the concave portion


151


on the lower surface of the glass substrate


168


, and the gap sealing portion


152


is formed therearound.




Then, as shown in FIG.


22


(


a


), the SOI wafer


164


is placed on the stationary substrate


120


, and the anchors


141


A,


141


B are integrally bonded to the land


131


A and the glass substrate


121


of the stationary substrate


120


. Then, the upper surface of the SOI wafer


164


is etched with an alkaline etchant such as TMAH or KOH. The upper surface is etched until the SiO


2


layer


162


is reached so that the SiO


2


layer


162


is exposed. Consequently, the Si layer


161


which is thin is formed above the stationary substrate


120


except for parts of the anchors


141


A,


141


B.




Then, the oxide film


162


on the Si layer


161


is removed by use of a fluorine etchant so that the Si layer


161


that becomes the movable electrodes


143


are exposed as shown in FIG.


22


(


b


). Then, the unnecessary portion on the periphery is removed by performing mold etching by dry etching using RIE or the like, and the slits


149


and the like are processed to form the resilient bending portions


142


A,


142


B, the resilient supporting portions


145


A,


145


B and the movable contact portion


146


to complete the movable substrate


140


on the stationary substrate


120


as shown in FIG.


22


(


c


).




Then, as shown in FIG.


22


(


d


), the cap


150


is placed over the stationary substrate


120


integrally bonded to the movable substrate


140


, and the gap sealing portion


152


is integrally bonded to the periphery of the upper surface of the stationary substrate


120


by frit bonding. Then, as shown in FIG.


22


(


e


), the connection bumps


132


,


133


,


134


,


135


are formed on the reverse surface of the stationary substrate


120


, and by forming electrode film separating slits


153


on the reverse surface of the stationary substrate


120


and separating the electrode film


139


on the reverse surface, the electrode films


123


B,


124


B,


130


B,


131


B are formed to complete the electrostatic microrelay.




According to this electrostatic microrelay, like the first embodiment, the signal line length can be shortened, so that the insertion loss of the electrostatic microrelay can be reduced. Consequently, the high frequency property improves. In particular, since the signal lines


123


,


124


are formed vertically to the plane of the substrate, the effect of improving the insertion loss property can be maximized. Moreover, since the through grooves


126


,


127


,


128


,


129


are provided on the periphery of the stationary substrate


120


and are situated outside the space sealed by the cap


150


, the fixed contacts


136


,


137


and the movable contact


148


are protected by sealing, so that reliability and the life of the electrostatic microrelay can be improved.




Moreover, in the electrostatic microrelay of the present invention, since the bumps


132


,


133


,


134


,


135


electrically continuous with the signal lines


123


,


124


and the wiring conductors


130


,


131


on the reverse surface side of the stationary substrate


120


are provided, the electrostatic microrelay can be directly mounted on the circuit board. That is, bonding wires for connection to the circuit board are unnecessary, so that a more excellent insertion loss property can be obtained. Further, since wire pads for connecting bonding wires, lead frames of the package and the like are unnecessary, the electrostatic microrelay and its mounting configuration can be reduced in size. Consequently, the mounting area can be significantly reduced, and an extremely excellent high frequency property (low insertion loss) can be realized because the transmission line length can be significantly reduced.




To bond the movable substrate


140


and the stationary substrate


120


, metal bonding such as Au/Au bonding may be used, or anode bonding may be used. Moreover, a silicon substrate or a ceramic substrate may be used as a substitute for the glass substrate


121


constituting the stationary substrate


120


. Moreover, when the stationary substrate


120


is made of a silicon substrate, anisotropic etching or dry etching may be used to form the through grooves. Further, when the stationary substrate


120


is obtained from a silicon wafer, the through grooves may be obtained by dividing through holes formed in the silicon wafer into two or four parts.




Next, still another embodiment of the present invention will be described.

FIG. 23

is an exploded perspective view of an electrostatic microrelay according to still another embodiment of the present invention. The stationary substrate


120


used in this electrostatic microrelay is the same as that used in the electrostatic microrelay of the third embodiment (FIG.


14


).

FIG. 24

is a bottom view of a movable substrate


171


used in this electrostatic microrelay. The movable substrate


171


is formed by processing a substantially rectangular silicon substrate or thin stainless steel plate, and four resilient bending portions


142


A,


142


B are formed by slits


149


on both ends of the movable substrate


171


. Moreover, elongate holes


173


for facilitating deformation of the movable substrate


171


are formed on both sides of the movable substrate


171


. Further, a movable contact


148


is formed, with an insulating film


147


in between, in the center of the lower surface of a movable electrode


143


provided on the movable substrate


171


.




The movable substrate


171


has a structure such that tip ends


172


A,


172


B of the resilient bending portions


142


A,


142


B are bonded to the top surface of a concave portion


151


of the cap


150


as shown in

FIG. 25

, and when electromagnetic attraction acts between the movable electrode


143


and the fixed electrode


122


, the resilient bending portions


142


A,


142


B are bent to move the movable electrode


143


and the movable contact


148


downward, so that the movable contact


148


makes contact with fixed contacts


136


,


137


.




The electrostatic microrelay of the present invention can be used in various apparatuses, in particular, in communications apparatuses. For example, it can be used as switching elements of mobile telephones, transmission/reception portions of wireless communications terminals, diversity antennas, indoor and outdoor antennas, multiband antennas and the like. By using the electrostatic microrelay for these purposes, the insertion loss is small compared to a case where a conventionally used MMIC switch or the like is used, so that the battery lives of communications terminals can be increased. Moreover, by using the electrostatic microrelay as various switching elements provided in antenna portions of wireless communications base stations of mobile telephones and the like, the switching elements are small in size compared to a case where a conventionally used electromagnetic relay is used, so that the base stations can be reduced in size.





FIG. 26

shows a case where the electrostatic microrelay of the present invention is used as a changeover switch in a wireless communications terminal


181


such as a mobile telephone. The electrostatic microrelay of the present invention is used as a transmission/reception switch


184


switching between a transmitting side circuit


182


and a receiving side circuit


183


. The electrostatic microrelay of the present invention is also used as a diversity switch


187


switching between a main antenna


185


and a diversity antenna


186


. Although not shown, the electrostatic microrelay of the present invention may be used as an antenna switch switching between a main antenna and an external antenna.





FIG. 27

shows an example in which the electrostatic microrelay of the present invention is used in a wireless communications base station


188


. In this example, an antenna


189


is connected to a power amplifier


190


for normal times and a power amplifier


191


for emergencies so as to be switchable by a switching element (switch)


192


in which the electrostatic microrelay of the present invention is used. In the event of an emergency such as a failure, switching from the power amplifier


190


for normal times to the power amplifier


191


for emergencies can be made swiftly.




INDUSTRIAL APPLICABILITY




The electrostatic relay of the present invention is used, for example, as switching elements of mobile telephones, transmission/reception portions of wireless communications terminals, diversity antennas, indoor and outdoor antennas, multiband antennas and the like. Moreover, the electrostatic relay of the present invention is also used as switching elements provided in antenna portions of wireless communications base stations of mobile telephones and the like.



Claims
  • 1. An electrostatic relay, comprising:a movable electrode of a movable substrate resiliently supported so as to be opposed to a fixed electrode formed on a stationary substrate, wherein the movable electrode is driven based on electrostatic attraction caused between the fixed electrode and the movable electrode; a plurality of fixed contacts provided on the stationary substrate and a movable contact provided on the movable substrate, wherein the fixed contacts and the movable contact are capable of being brought into contact with each other and separated from each other; a cap substrate having a portion that crosses a line connecting the fixed contacts and the movable contact outside a gap between the fixed contacts and the movable contact, and wherein the cap substrate is arranged to enclose at least the fixed contacts and the movable contact by sealing the moveable substrate between a top surface of the stationary substrate and the cap substrate; and a through portion in which at least one of the signal lines connecting to the fixed contacts is passed through the stationary substrate from an obverse surface to a reverse surface thereof and is disposed in a position not deteriorating a sealing condition of the cap substrate.
  • 2. An electrostatic relay according to claim 1, wherein at least one of the signal lines connecting to the fixed contacts is passed through the stationary substrate from the obverse surface to the reverse surface thereof, and an opening, on a movable substrate bonded side, of a through hole through which the signal line is passed is hermetically sealed by bonding it to the movable substrate or to the third substrate through a metal layer formed around the opening.
  • 3. An electrostatic relay according to claim 2, wherein at least one of the signal lines passed through the stationary substrate from the obverse surface to the reverse surface thereof is formed vertically to the stationary substrate.
  • 4. An electrostatic relay according to claim 2, wherein at least one of the wiring conductors provided on the stationary substrate, except for the signal lines connecting to the fixed electrodes being passed through the stationary substrate from the obverse surface to the reverse surface thereof, and an opening on the movable substrate bonded side of a through hole through which the wiring conductor is passed, is hermetically sealed by bonding it to the movable substrate or to the third substrate through a metal layer formed around the opening.
  • 5. An electrostatic relay according to claim 2 or 4, wherein at least one ground line for high frequency is formed between at least one pair of signal lines or wiring conductors of the signal lines or the wiring conductors formed on the stationary substrate.
  • 6. An electrostatic relay according to claim 2 or 4, wherein at least one of the signal lines or the wiring conductors is formed in the through hole formed in the stationary substrate, and at least one of the signal line or the wiring conductor is formed only on part of the through hole.
  • 7. An electrostatic relay according to claim 2 or 4, wherein at least one of bumps is provided at an end situated on a substrate's reverse surface side of at least one of the signal lines or the wiring conductors formed on the stationary substrate.
  • 8. An electrostatic relay according to claim 2, wherein the opening is disposed outside an area on the stationary substrate opposed to the movable electrode or the movable contact.
  • 9. An electrostatic relay according to claim 2, wherein the cap substrate is bonded to the stationary substrate by a convex portion formed on a side bonded to the stationary substrate.
  • 10. An electrostatic relay according to claim 9, wherein at least one of the openings is disposed in a position opposed to the convex portion of the cap substrate.
  • 11. An electrostatic relay according to claim 1, wherein the through portion is disposed in a peripheral part of the stationary substrate.
  • 12. An electrostatic relay according to claim 11, wherein the through portion is a concave shape having an opening on a periphery of the stationary substrate.
  • 13. An electrostatic relay according to claim 11, wherein the through portion is formed vertically to a plane of the stationary substrate.
  • 14. An electrostatic relay according to claim 11, wherein the cap substrate is bonded to the stationary substrate, and the through portion is provided on the stationary substrate in a neighborhood outside an area of bonding of the stationary substrate and the cap substrate.
  • 15. An electrostatic relay according to claim 11, wherein at least one of the wiring conductors formed on the stationary substrate is connected to the through portion.
  • 16. An electrostatic relay according to claim 11, wherein an electrode film is provided on the reverse surface of the stationary substrate, and the electrode film is divided into a plurality of areas isolated from each other, by a slit formed on the reverse surface of the stationary substrate.
  • 17. An electrostatic relay according to claim 11, wherein at least one of bumps electrically continuous with at least one of the signal lines or the wiring conductors formed on the stationary substrate is provided on the reverse surface of the stationary substrate.
  • 18. An electrostatic relay according to claim 1, wherein the stationary substrate and the movable substrate are made of single-crystal silicon.
  • 19. A communications apparatus having a switching element that switches transmission/reception signals of an antenna or an internal circuit, wherein the electrostatic relay according to claim 1 is used as the switching element.
Priority Claims (1)
Number Date Country Kind
2000-121549 Apr 2000 JP
PCT Information
Filing Document Filing Date Country Kind
PCT/JP01/03486 WO 00
Publishing Document Publishing Date Country Kind
WO01/82323 11/1/2001 WO A
Foreign Referenced Citations (6)
Number Date Country
0 887 879 Dec 1998 EP
6-44883 Feb 1994 JP
9-92116 Apr 1997 JP
9-180616 Jul 1997 JP
10-162713 Jun 1998 JP
11-74717 Mar 1999 JP
Non-Patent Literature Citations (4)
Entry
Patent Abstracts of Japan, Publication No.: 10-162713, published Jun. 19, 1998, 15 pages.
Patent Abstracts of Japan, Publication No.: 06-044883, published Feb. 18, 1994, 11 pages.
Patent Abstracts of Japan, Publicaton No. 09-092116, published Apr. 4, 1997, 18 pages.
Patent Abstracts of Japan, Publication No. 09-180616, published Jul. 11, 1997, 36 pages.