9461759 Olsen In this SBIR Phase I Sensors Unlimited, Inc. explores the design and optimization of a high-performance avalanche photodiode for the 1.0-1.65 micron spectral region. The innovation uses strained epitaxial layers combined with multiquantum-well (MQW) InGaAsP/InP layers. A strained layer distorts the valence band of the multiplying (gain) region to reduce the field at which ionization occurs. This reduces device operating voltage and would also increase the ratio of hole/electron ionization coefficients (compared to the unstrained case) and thus decrease noise. A strained layer InGaAsP/InP MQW device will be constructed, and ionization coefficients will be measured and compared with the unstrained case. In Phase II, fabrication and optimization of a reliable planar structure for light response out to 1.65 micron are planned to explore the advantages of low voltage, low noise operation, high gain, and high yield.