Priority is claimed from Korean Patent Application No.10-2013-0141255, the full disclosure of which is hereby incorporated by reference herein.
1. Technical Field
The present invention relates to a substrate for an optical device, more particularly to a substrate for an optical device for preventing electrical shorts among the elements in the substrate due to the burrs generated during the substrate cutting process.
2. Description of the Related Art
LEDs are being used as the light source of a back light unit (BLU) for a liquid crystal display (LCD) which is used in the flat panel displays such as TVs, computer monitors, and the like.
An optical device chip such as an LED is being mounted on the substrate for an optical device, and the individual optical devices are manufactured through a separation process i.e. sawing or dicing of the substrate for the optical devices.
However, according to the conventional methods, when a substrate for an optical device made by alternately stacking conductive plates and insulating films (or insulating layers) is being sawed or diced, burrs are generated during the dicing process, and there has been a problem in that electrical shorts are being occurred since the burrs generated due to the difference in the material hardness between the conductive plate and the insulating film are penetrating into the conductive plate by crossing the insulating film along the direction of cutting.
A substrate for an optical device is configured for preventing electrical shorts among the elements in the substrate occurring due to the burrs generated during the cutting process of the substrate for the optical device.
According to an aspect of the present invention, there is provided a substrate for an optical device including an optical device substrate including a plurality of conductive plates elongated along a length direction, wherein side surfaces of the conductive plates are bonded to each other with insulators interposed therebetween, the insulators being respectively formed on the side surfaces,
wherein a groove having a predetermined depth for preventing burrs is formed in a lower surface of the optical device substrate at each point where a cutting line is crossed with one of the insulators when the optical device substrate is cut in a length direction and in a vertical direction, the groove being formed in such a way that said one of the insulators is exposed to an inside of the groove.
It is preferable that a liquid insulation material is deposited and cured inside the groove.
It is preferable that a photosensitive solder resist (PSR) is deposited on an area of the insulator exposed to the lower surface of the optical device substrate and on an area of the liquid insulating material exposed to the lower surface of the optical device substrate.
It is preferable that the groove is formed such that at least a part of the insulator exposed to the lower surface of the optical device substrate is accommodated inside the groove.
It is preferable that the groove has a larger diameter than a width of each insulator.
It is preferable that a solder resist is deposited on an upper surface and the lower surface of the optical device substrate so as to increase an optical reflectivity.
It is preferable that a cavity reaching downwardly to a predetermined depth from the upper surface of the optical device substrate is formed in the optical device substrate in such a way that the insulator is exposed to a bottom surface of the cavity.
It is preferable that the substrate for an optical device further includes an optical device chip mounted on the optical device substrate at an inside of the cavity.
Objects, features and advantages of the present invention will become more apparent to those of ordinary skill in the art by describing in detail exemplary embodiments thereof with reference to the accompanying drawings, in which:
a,
1
b,
1
c, and 1d are the exemplary drawings showing the problem of burr generation which is to be solved in the present invention.
a,
3
b, and 3c are the drawings for describing the manufacturing process for a substrate for an optical device according to an exemplary embodiment of the present invention.
a,
4
b,
5, and 6 are the drawings for describing the location where a groove for preventing burrs is being formed in the substrate for an optical device according to an exemplary embodiment of the present invention.
a,
1
b, and 1c are the exemplary drawings showing the problem of burr generation which is to be solved.
In the exemplary embodiment, a substrate for an optical device is an array of a plurality of chip substrates having a predetermined size, and being utilized by cutting thereof into each individual chip substrates. At this time, the cross-section 10 is formed to have a top view as shown in
A structure for a substrate for an optical device is proposed for solving this problem. Hereinafter, a method for manufacturing a substrate for an optical device according to an exemplary embodiment of the present invention and a substrate for an optical device manufactured by using the method will be described with reference to
In stacking step S100, as shown in
Next, by vertically cutting the lump of conductive material produced using such a way as illustrated as a dotted line in
For reference, the dotted line in
Hereinafter, a forming step S200 for a groove for preventing burrs in a substrate for an optical device produced in the stacking step will be described with reference to
First, in a forming step S200 for a groove for preventing burrs, the side surfaces of a plurality of conductive plates A, which are elongated along the length direction thereof, are bonded with each other as illustrated in
That is, the optical device substrate includes the conductive plates A elongated along a length direction, wherein the side surfaces of the conductive plates A are bonded to each other with insulators B interposed therebetween, and the insulators A are respectively formed on the side surfaces of the conductive plates A. Further, a groove 110 having a predetermined depth for preventing burrs is formed in a lower surface of the optical device substrate at each point where a cutting line CL is crossed with the insulator B when the optical device substrate is cut in a length direction and in a vertical direction. The groove 110 is formed in such a way that the insulator B is exposed to the inside of the groove 110.
Preferably, the diameter of the groove (fit) 110 is larger than the width of the insulator B as shown in
Inside of such groove 110 for preventing burrs a liquid insulating material 130 is deposited and cured as illustrated in
In such a way, for a substrate for an optical device 100 with an insulator B formed therein, when a groove 110 having a predetermined depth for preventing burrs in the lower surface of the substrate at each point CP, wherein the cutting line CL and said insulators B are being crossed, is formed as shown in
Meanwhile, a cavity D, downwardly reaching to a predetermined depth from the upper surface of the substrate as illustrated in
For reference, in a forming step S200 for a groove 110 for preventing burrs, a groove 110 may be formed on the upper surface and the lower surface of the optical device wherein solder resist has been deposited. The reason why solder resist, preferably, white solder resist, is being deposited in such a way on the upper surface and the lower surface of the optical device substrate 100 prior to formation of the groove 110, is for enhancing optical reflection capability.
As described above, a chip substrate after cutting the substrate for an optical device wherein a groove 110 for preventing burrs and a cavity D is formed, is shown in
With reference to
In addition, under the substrate for an optical device according to an exemplary embodiment of the present invention, a resist portion, where solder resist is deposited on the exposed area of the insulator B under the substrate, is further included as illustrated in
The above description is merely an exemplary description. Various modifications, changes, and substitutions are possible for a person of skill in the art within the scope without deviating from the fundamental characteristics of the present invention. Therefore the scope of protection of the present invention must be interpreted according to the following claims, and it must be interpreted in such a way that all the technical spirits within the equivalent scope of the present invention are included in the scope of the rights of the present invention.
Number | Date | Country | Kind |
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10-2013-0141255 | Nov 2013 | KR | national |
Number | Name | Date | Kind |
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20080236870 | Kuwajima | Oct 2008 | A1 |
20110116271 | Ide et al. | May 2011 | A1 |
Number | Date | Country |
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2011-003626 | Jan 2011 | JP |
10-2011-0055401 | May 2011 | KR |
Entry |
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Korean Intellectual Property Office, Office Action—Notification of Grounds for Rejection regarding Korean Patent Application No. 10-2013-0141255, dated Dec. 2, 2014, 4 pages. |
Number | Date | Country | |
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20150138659 A1 | May 2015 | US |