Substrate for spectroscopic analysis

Information

  • Patent Grant
  • D835802
  • Patent Number
    D835,802
  • Date Filed
    Friday, September 30, 2016
    7 years ago
  • Date Issued
    Tuesday, December 11, 2018
    5 years ago
  • CPC
  • US Classifications
    Field of Search
    • US
    • D24 216
    • D24 222-226
    • D24 231
    • D24 232
    • D24 169
    • D10 80
    • D10 81
    • 422 502-507
    • 422 430000
    • 422 560-566
    • 422 068100
    • 422 069000
    • 422 547000
    • 435 2882-2885
    • 435 283100
    • 435 289100
    • 435 044000
    • 435 046000
    • CPC
    • B01J19/0046
    • B01J2219/00596
    • G01N1/405
    • G01N35/00009
    • G01N1/312
    • B01L2300/0816
    • B01L2400/0406
    • B01L9/54
    • B01L9/06
    • B01L9/52
    • B01L9/543
    • B01L9/00
    • B01L3/5085
    • B01L3/5027
  • International Classifications
    • 2402
    • Term of Grant
      15Years
Abstract
Description

1. Substrate for spectroscopic analysis



1.1 : Perspective



1.2 : Front



1.3 : Back



1.4 : Top



1.5 : Bottom



1.6 : Left



1.7 : Right



1.8 : SECTIONAL VIEW



1.9 : SECTIONAL VIEW


The broken line showing the substrate for spectroscopic analysis is for the purpose of illustrating environmental structure and forms no part of the claimed design.


The dot-dash broken lines define the bounds of the claimed design and form no part thereof.


Claims
  • The ornamental design for a substrate for spectroscopic analysis, as shown and described.
Priority Claims (1)
Number Date Country Kind
2016-009313 Apr 2016 JP national
US Referenced Citations (24)
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D500142 Crisanti et al. Dec 2004 S
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D683045 Domack May 2013 S
D692578 Kikuhara et al. Oct 2013 S
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D754871 Morrell-Falvey Apr 2016 S
20050237607 Tenney Oct 2005 A1