Substrate for spectroscopic analysis

Information

  • Patent Grant
  • D835800
  • Patent Number
    D835,800
  • Date Filed
    Friday, September 30, 2016
    8 years ago
  • Date Issued
    Tuesday, December 11, 2018
    5 years ago
  • CPC
  • US Classifications
    Field of Search
    • US
    • D24 216
    • D24 222-226
    • D24 231
    • D24 232
    • D24 169
    • D10 80
    • D10 81
    • 422 502-507
    • 422 430000
    • 422 560-566
    • 422 068100
    • 422 069000
    • 422 547000
    • 435 2882-2885
    • 435 283100
    • 435 289100
    • 435 044000
    • 435 046000
    • CPC
    • B01J19/0046
    • B01J2219/00596
    • G01N1/405
    • G01N35/00009
    • G01N1/312
    • B01L2300/0816
    • B01L2400/0406
    • B01L9/54
    • B01L9/06
    • B01L9/52
    • B01L9/543
    • B01L9/00
    • B01L3/5085
    • B01L3/5027
  • International Classifications
    • 2402
    • Term of Grant
      15Years
Abstract
Description

1. Substrate for spectroscopic analysis



1.1 : Perspective



1.2 : Front



1.3 : Back



1.4 : Top



1.5 : Bottom



1.6 : Left



1.7 : Right



1.8 : SECTIONAL VIEW



1.9 : SECTIONAL VIEW



1.10 : PERSPECTIVE VIEW WITHOUT THE COVER PART


The broken line showing the substrate for spectroscopic analysis is for the purpose of illustrating environmental structure and forms no part of the claimed design.


The dot-dash broken lines define the bounds of the claimed design and form no part thereof.


Claims
  • The ornamental design for a substrate for spectroscopic analysis, as shown and described.
Priority Claims (1)
Number Date Country Kind
2016-009317 Apr 2016 JP national
US Referenced Citations (23)
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D500142 Crisanti et al. Dec 2004 S
D531321 Godfrey et al. Oct 2006 S
D683045 Domack May 2013 S
D692578 Kikuhara et al. Oct 2013 S
D702364 Iqbal Apr 2014 S
D733911 Ito Jul 2015 S
D733912 Ito Jul 2015 S
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D735877 Chang Aug 2015 S
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D754871 Morrell-Falvey Apr 2016 S
20050237607 Tenney Oct 2005 A1