Claims
- 1. In a method of producing thin films of superconductor materials of the beta-wolfram type having high transition temperatures, the steps comprising (a) assembling within a closed reactor a substrate and a composite containing at least two target materials which when reacted are capable of forming the beta-wolfram crystallographic structure, (b) evacuating the reactor to a pressure not in excess of 5 .times. 10.sup.-10 Torr while heating the components contained within the reactor to remove all volatile impurities therefrom under said conditions, (c) admitting an inert gas which will support sputtering to the reactor and adjusting the pressure within the reactor with said inert gas to the range between about 2 and 6 .times. 10.sup.-1 Torr, (d) heating the substrate to a temperature not in excess of about 1000.degree. C, (e) connecting the components within the reactor to a source of DC power while controlling the voltage within the range between about 600 and about 1000 volts and the cathode current density within the range between about 10 and about 50 milliamps per square inch, (f) continuing said sputtering until the desired film thickness is obtained on the substrate, said film having the beta-wolfram structure, and (g) thereafter quenching the deposited film to room temperature.
- 2. The method of claim 1, in which the inert gas is argon.
- 3. The method of claim 1, in which the target materials are niobium and germanium.
- 4. The method of claim 1, in which the voltage is within the range between about 700 and about 900 volts.
- 5. The method of claim 1, in which the cathode current density is within the range between about 10 and about 20 milliamps per square inch.
- 6. The method of claim 1, in which the substrate is maintained at a temperature within the range between about 700.degree. C and about 950.degree. C.
- 7. The method of claim 1, in which the substrate is maintained at a temperature not in excess of 700.degree. C, the additional step of annealing the quenched film at a temperature within the range between 700.degree. C and 1000.degree. C.
- 8. The method of claim 1, in which the quenched film is annealed at a temperature within the range between about 750.degree. C and about 1000.degree. C.
- 9. An elongated superconducting body having a transition temperature of about 22.degree. K formed of a plurality of turns containing the composition Nb.sub.3 Ge, said Nb.sub.3 Ge having been deposited by the method of claim 1.
- 10. In the method of producing a thin film superconductor having a transition temperature of about 22.degree. K, the steps comprising (a) assembling in spaced relation within a closed reactor a substrate and a composite containing niobium and germanium target materials, (b) evacuating the reactor to a pressure not in excess of 10.sup.-10 Torr while heating the components contained within the reactor to remove the volatile impurities therefrom, (c) admitting argon to the reactor and adjusting the pressure of argon within the reactor to a value within the range between about 3 and about 6 .times. 10.sup.-1 Torr, (d) heating the substrate to a temperature within the range between about 750.degree. C and about 950.degree. C, (e) connecting the components within the reactor to a source of DC power wherein the voltage is within the range between about 600 and about 900 volts and a corresponding cathode current density within the range between about 3 and 5 milliamperes per square centimeter, (f) continuing the sputtering until a Nb.sub.3 Ge film is deposited on the substrate of about 1 micron in thickness, and (g) quenching the film to room temperature.
- 11. The method of claim 10, in which the space between the substrate and the target materials is maintained ithin the range between about 1 and about 4 centimeters.
- 12. A thin film Type II superconductor of niobium-germanium said film having a beta-wolfram crystallographic structure of the required stoichiometry and a transition temperature at least 4 Kelvin degrees higher than the bulk material of the same gross stoichiometry.
- 13. The superconductor of claim 11, in which the ratio of niobium to germanium is 3 to 1.
- 14. In a method of producing thin films of materials requiring predetermined stoichiometry, the steps comprising, in sequence, (a) assembling within a closed reactor a substrate and a composite containing at least two materials for forming a predetermined composition which materials, when reacted, form the predetermined stoichiometrical composition (b) evacuating the reactor to a vacuum of at least 5 .times. 10.sup.-10 Torr while heating the components contained within the reactor to remove all volatile impurities therefrom, (c) admitting an inert gas to the reactor and adjusting the pressure within the reactor with said inert gas to a range between 2 and 6 .times. 10.sup.-1 Torr (d) heating the substrate to a temperature not in excess of about 1000.degree. C (e) connecting the components within the reactor to a source of DC power while controlling the voltage within the range between about 600 to about 1000 volts and the cathode current density within the range between about 10 and about 50 milliamps per square inch to effect sputter deposition of a thin film of the predetermined stoichiometry on the substrate (f) continuing said sputter deposition until the desired film thickness on the substrate, is obtained, and (g) thereafter quenching the deposited film to room temperature.
CROSS REFERENCE TO THE RELATED APPLICATION
The present application is a continuation-in-part of application Ser. No. 383,625 filed July 30, 1973, now abandoned and is closely related to application Ser. No. 271,884 filed July 14, 1972, now abandoned in favor of application Ser. No. 398,902 which has issued and is identified as U.S. Pat. No. 3,912,612.
US Referenced Citations (8)
Non-Patent Literature Citations (4)
Entry |
L. I. Maissel et al., "Handbook of Thin Film Technology", McGraw-Hill, N.Y., 1970, pp. 4-24, 4-25, 4-39. |
R. W. Berry et al., "Thin Film Technology", Van Nostrand Reinhold, N.Y., 1968, p. 226. |
J. J. Hanak et al., "Radio-Frequency Sputtered Films of B-Tungsten Structure Compounds", J. Appl. Phys., vol. 41, Nov. 1970, pp. 4958-4962. |
J. R. Gavaler et al., "Sputtering Techniques for Controlling Composition of Thin Films of High Tc. Superconducting Compounds", J. Vac. Sci. Tech., vol. 8, pp. 180-183. 1971. |
Continuation in Parts (1)
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Number |
Date |
Country |
Parent |
383625 |
Jul 1973 |
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