Claims
- 1. A surface acoustic wave device comprising a piezoelectric substrate of lithium tetraborate single crystal, and a metal film formed on a surface of the piezoelectric substrate for exciting, receiving, reflecting and/or propagating surface acoustic waves,
- the metal film being so formed that a cut angle of the surface of the piezoelectric substrate and propagation direction of the surface acoustic wave are an Eulerian angle representation of (0.degree.-45.degree., 38.degree.-55.degree., 80.degree.-90.degree.) and directions equivalent thereto,
- a propagation velocity of the surface acoustic wave being higher than a propagation velocity of a fast shear bulk wave propagating in the same direction as the surface acoustic wave and not exceeding that of a longitudinal bulk wave.
- 2. A surface acoustic wave device according to claim 1, wherein the metal film are so formed that a cut angle of the surface of the piezoelectric substrate and propagation direction of the surface acoustic wave are an Eulerian angle representation of (0.degree.-45.degree., 45.degree.-50.degree., 80.degree.-90.degree.) and directions equivalent thereto.
- 3. A surface acoustic wave device according to claim 2, wherein the metal film are so formed that a cut angle of the surface of the piezoelectric substrate and propagation direction of the surface acoustic wave are an Eulerian angle representation of (0.degree.-2.degree., 45.degree.-50.degree., 88.degree.-90.degree.) and directions equivalent thereto.
- 4. A surface acoustic wave device according to claim 1, wherein the metal film are formed of a metal containing aluminium as the main component, and the metal film have a normalized film thickness of below about 8%.
- 5. A surface acoustic wave device according to claim 2, wherein the metal film are formed of a metal containing aluminium as the main component, and the metal film have a normalized film thickness of below about 8%.
- 6. A surface acoustic wave device according to claim 4, wherein the metal film are formed of a metal containing aluminium as the main component, and the metal film have a normalized film thickness of 0.5-3.5%.
- 7. A surface acoustic wave device according to claim 5, wherein the metal film are formed of a metal containing aluminium as the main component, and the metal film have a normalized film thickness of 0.5-3.5%.
- 8. A surface acoustic wave device according to claim 1, wherein the surface acoustic wave device is a transversal filter having a electrode formed of the metal film.
- 9. A surface acoustic wave device according to claim 2, wherein the surface acoustic wave device is a transversal filter having a electrode formed of the metal film.
- 10. A surface acoustic wave device according to claim 1, wherein the surface acoustic wave device is a delay line having a electrode formed of the metal film.
- 11. A surface acoustic wave device according to claim 2, wherein the surface acoustic wave device is a delay line having a electrode formed of the metal film.
- 12. A surface acoustic wave device comprising a piezoelectric substrate of lithium tetraborate single crystal, and a metal film formed on a surface of the piezoelectric substrate for exciting, receiving, reflecting and/or propagating surface acoustic waves,
- the metal film being so formed that a cut angle of the surface of the piezoelectric substrate and propagation direction of the surface acoustic wave area are an Eulerian angle representation of (0.degree.-45.degree., 30.degree.-75.degree., 40.degree.-90.degree.) and directions equivalent thereto,
- a propagation velocity of the surface acoustic wave being higher than a propagation velocity of a fast shear bulk wave propagating in the same direction as the surface acoustic wave and not exceeding that of a longitudinal bulk wave.
- 13. A surface acoustic wave device comprising a piezoelectric substrate of lithium tetraborate single crystal, and a metal film formed on a surface of the piezoelectric substrate for exciting, receiving, reflecting and/or propagating surface acoustic waves,
- the metal film being so formed that a cut angle of the surface of the piezoelectric substrate and propagating direction of the surface acoustic wave are an Eulerian angle representation of (0.degree.-45.degree., 30.degree.-75.degree., 40.degree.-90.degree.) and directions equivalent thereto,
- a propagation velocity of the surface acoustic wave being higher than a propagating velocity of a fast shear bulk wave propagating in the same direction as the surface acoustic wave and not exceeding that of a longitudinal bulk wave.
- 14. A surface acoustic wave device comprising a piezoelectric substrate of lithium tetraborate single crystal, and a metal film formed on a surface of the piezoelectric substrate for exciting, receiving, reflecting and/or propagating surface acoustic waves,
- the metal film being so formed that a cut angle of the surface of the piezoelectric substrate and propagation direction of the surface acoustic wave are an Eulerian angle representation of (0.degree.-45.degree., 30.degree.-90.degree., 40.degree.-65.degree.) and directions equivalent thereto,
- a propagation velocity of the surface acoustic wave being higher than a propagation velocity of a fast shear bulk wave propagating in the same direction as the surface acoustic wave and not exceeding that of a longitudinal bulk wave.
- 15. A surface acoustic wave device according to claim 12, wherein the metal film are formed of a metal containing aluminum as the main component, and the metal film have a normalized film thickness of below about 8%.
- 16. A surface acoustic wave device according to claim 13, wherein the metal film are formed of a metal containing aluminum as the main component, and the metal film have a normalized film thickness of below 8%.
- 17. A surface acoustic wage device according to claim 14, wherein the metal film are formed of a metal containing aluminum as the main component, and the metal film have a normalized film thickness of below about 8%.
- 18. A surface acoustic wave device according to claim 15, wherein the metal film are formed of a metal containing aluminum as the main component, and the metal film have a normalized film thickness of 0.5-3.5%.
- 19. A surface acoustic wave device according to claim 16, wherein the metal film are formed of a metal containing aluminum as the main component, and the metal film have a normalized film thickness of 0.5-3.5%.
- 20. A surface acoustic wave device according to claim 17, wherein the metal film are formed of a metal containing aluminum as the main component, and the metal film have a normalized film thickness of 0.5-3.5%.
- 21. A surface acoustic wave device according to claim 12, wherein the surface acoustic wave device is a transversal filter having a electrode formed of the metal film.
- 22. A surface acoustic wave device according to claim 19, wherein the surface acoustic wave device is a transversal filter having a electrode formed of the metal film.
- 23. A surface acoustic wave device according to claim 14, wherein the surface acoustic wave device is a transversal filter having a electrode formed of the metal film.
- 24. A surface acoustic wave device according to claim 12, wherein the surface acoustic wave device is a delay line having a electrode formed of the metal film.
- 25. A surface acoustic wave device according to claim 13, wherein the surface acoustic wave device is a delay line having a electrode formed of the metal film.
- 26. A surface acoustic wave device according to claim 14, wherein the surface acoustic wave device is a delay line having a electrode formed of the metal film.
- 27. A surface acoustic wave device comprising a piezoelectric substrate of lithium tetraborate single crystal, and a metal film formed on a surface of the piezoelectric substrate for exciting, receiving, reflecting and/or propagating surface acoustic waves,
- the metal film being so formed that a cut angle of the surface of the piezoelectric substrate and propagation direction of the surface acoustic wave are on Eulerian angle representation of (0.degree.-45.degree., 30.degree.-70.degree., 40.degree.-90.degree.) and directions equivalent thereto,
- a propagation velocity of the surface acoustic wave being higher than a propagation velocity of a fast shear bulk wave propagating in the same direction as the surface acoustic wave and not exceeding that of a longitudinal bulk wave.
- 28. A surface acoustic wave device comprising a piezoelectric substrate of lithium tetraborate single crystal, and a metal film formed on a surface of the piezoelectric substrate for exciting, receiving, reflecting and/or propagating surface acoustic waves,
- the metal film being so formed that a cut angle of the surface of the piezoelectric substrate and propagation direction of the surface acoustic wave are an Eulerian angle representation of (0.degree.-45.degree., 38.degree.-55.degree., 40.degree.-90.degree.) and directions equivalent thereto,
- a propagation velocity of the surface acoustic wave being higher than a propagation velocity of a fast shear bulk wave propagating in the same direction as the surface acoustic wave and not exceeding that of a longitudinal bulk wave.
Priority Claims (2)
Number |
Date |
Country |
Kind |
4-088409 |
Mar 1992 |
JPX |
|
5-042642 |
Mar 1993 |
JPX |
|
Parent Case Info
This application is a continuation of application Ser. No. 08/029,512, filed Mar. 11, 1993, now abandoned.
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4489250 |
Ebata et al. |
Dec 1984 |
|
4523119 |
Whatmore et al. |
Jun 1985 |
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4634913 |
Whatmore et al. |
Jan 1987 |
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4672255 |
Suzuki et al. |
Jun 1987 |
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Foreign Referenced Citations (1)
Number |
Date |
Country |
5-7124 |
Jan 1993 |
JPX |
Continuations (1)
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Number |
Date |
Country |
Parent |
29512 |
Mar 1993 |
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