BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a front view illustrating an embodiment of the present invention.
FIG. 2 is a sectional view taken along the V-V line in FIG. 1.
FIG. 3 is a sectional view taken along the W-W line in FIG. 1.
FIG. 4 is a sectional view illustrating a crystalline magnesium layer formed on a thin-film magnesium layer in the embodiment.
FIG. 5 is a sectional view illustrating a thin-filmmagnesium layer formed on a crystalline magnesium layer in the embodiment.
FIG. 6 is a SEM photograph of a magnesium oxide single crystal having a cubic single-crystal structure.
FIG. 7 is a SEM photograph of a magnesium oxide single crystal having a cubic polycrystal structure.
FIG. 8 is a graph showing the residual image characteristics of a conventional PDP for comparison.
FIG. 9 is a graph showing the residual image characteristics of the PDP of the embodiment.
FIG. 10 is a graph showing a comparison between the discharge delay characteristics of the PDP of the embodiment and of a conventional PDP.
FIG. 11 is another graph showing a comparison between the discharge delay characteristics of the PDP of the embodiment and of a conventional PDP.
FIG. 12 is a graph showing a comparison between the light-emitting efficiencies of the PDP of the embodiment and of a conventional PDP.
FIG. 13 is a graph showing the relationship between the particle size of a magnesium oxide single-crystal and the wavelength of a CL emission in the embodiment.
FIG. 14 is a graph showing the relationship between the particle size of a magnesium oxide single-crystal and the intensity of a CL emission at 235 nm in the embodiment.
FIG. 15 is a graph showing the state of the wavelength of a CL emission from a magnesium oxide layer formed by vapor deposition.
FIG. 16 is a graph showing the relationship between the discharge delay and the peak intensity of a CL emission at 235 nm from the magnesium oxide single crystal.
FIG. 17 is a graph showing a comparison between the discharge delay characteristics of the case when the protective layer is constituted only of the magnesium oxide layer formed by vapor deposition and that when the protective layer has a double layer structure made up of a crystalline magnesium layer and a thin-film magnesium layer formed by vapor deposition.