Number | Name | Date | Kind |
---|---|---|---|
2916694 | Hanysz et al. | Dec 1959 | |
3407352 | Smith | Oct 1968 | |
3441840 | Randle | Apr 1969 | |
3878457 | Rodgers | Apr 1975 | |
4752739 | Wang | Jun 1988 | |
4893079 | Kustra et al. | Jan 1990 |
Number | Date | Country |
---|---|---|
564585 | Nov 1977 | SUX |
Entry |
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Hanysz, Eugene A.; Swept Frequency Eddy-Current Device to Measure Overlay Thickness, The Review of Scientific Instruments; vol. 29, No. 5, May 1958 pp. 411-415. |