The present invention will be elucidated hereinbelow with reference to the accompanying drawings, in which:
The invention provides for the arrangement of a current measuring element 8, for instance in the form of a resistor with a low ohmic value and a cumulation circuit 9. Cumulation circuit 9 is adapted to repeatedly perform a measurement of the current flowing through current measuring element 8; in other words to sample this current. This thus obtained sample value is then converted by cumulation circuit 9 into a count value, for which purpose algorithms to be elucidated below can be used. The thus obtained count values are cumulated in cumulation circuit 9 and, when a predetermined cumulation value is reached, cumulation circuit 9 generates a signal to control circuit 7 which is used for instance to switch off the switch or to control the semiconductor 5 such that the current flowing through the semiconductor is reduced. Other operations are not precluded.
It is noted by the way that the measurement is an operation which takes place periodically. It is necessary here to take into account the periodicity of the switching operations of the thyristor, this periodicity depending on the frequency of the mains power supply in order to prevent a synchronization occurring which would disrupt the sampling as a result of a measurement always taking place at the same phase.
It is however also possible that the cumulation circuit 9 is adapted to integrate the current during a certain short period of time and to compare this value with a predetermined value. Preferably use is made of a same period of time as during which the current is integrated and measured but it is also possible that these periods of time are mutually different, which can be compensated for in the next process, for instance to divide the integrated value by the period of time during which the integration took place.
The above stated embodiment relates to a mains-powered tool, wherein the cumulation circuit is adapted to measure the current flowing through the semiconductor and the motor.
The operation of cumulation circuit 9 in both circuits elucidated in the foregoing will be discussed with reference to
Besides it is also possible to make use of a integration of the quantity to be measured incorporated into the measurement.
This embodiment makes use of a fixed sampling frequency; it is however also possible to make use of a variable sampling frequency, for instance a sampling frequency dependent on the measured value. In such a situation the period of time between the measurement and the subsequent measurement depends on the measured value. The more extreme the measured value, this being after all an indication of dynamic behaviour, the shorter the period of time which will generally be chosen here until the subsequent measurement.
It will be apparent that there are numerous other possibilities of algorithms performed by the cumulation circuit, also subject to the application and the dynamic behaviour of the quantity to be monitored.
Number | Date | Country | Kind |
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20000144 | Jul 2006 | NL | national |