BRIEF DESCRIPTION OF THE DRAWINGS
The teachings of the embodiments of the present invention can be readily understood by considering the following detailed description in conjunction with the accompanying drawings.
FIG. 1 is a block diagram illustrating a typical metal-insulator-metal (MIM) parallel plate configuration of a thin film BST capacitor according to one embodiment of the present invention.
FIG. 2 is a graph illustrating RF transmission measurements of the BST capacitor of FIG. 1 as a function of the frequency of the RF signal.
FIG. 3 is a graph illustrating RF transmission measurements of the BST capacitor of FIG. 1 as a function of the frequency of the RF signal under different DC bias voltages.
FIG. 4 is a diagram of an equivalent circuit modeling a piezo-electric transducer.
FIG. 5 illustrates the structure and use of the BST-based FBAR (Film Bulk Acoustic Resonator) according to one embodiment of the present invention.
FIG. 6 illustrates the structure of the BST-based FBAR, according to one embodiment of the present invention.
FIG. 7A illustrates the structure of the BST-based FBAR, according to another embodiment of the present invention.
FIG. 7B illustrates the various structures of the acoustic reflector that can be used with the BST-based FBAR of FIG. 7A.
FIG. 8 illustrates the structure of the BST-based FBAR device, according to still another embodiment of the present invention.
FIG. 9 illustrates the simulated behavior of a single BST-based FBAR device in series and shunt configurations.
FIG. 10A illustrates a band pass filter circuit implemented using the BST-based FBAR devices according to one embodiment of the present invention.
FIG. 10B is a graph illustrating RF transmission measurements, as a function of the frequency of the RF signal, of the band pass filter circuit of FIG. 10A implemented using the BST-based FBAR devices according to one embodiment of the present invention.
FIG. 10C is a graph illustrating how the RF transmission measurements of the band pass filter circuit of FIG. 10A implemented using the BST-based FBAR devices change depending upon different DC bias voltages.
FIG. 11 illustrates a duplexer implemented using the BST-based FBAR devices according to one embodiment of the present invention.
FIG. 12A illustrates a conventional switched filter bank.
FIG. 12B illustrates a switched filter bank implemented using the BST-based FBAR devices according to one embodiment of the present invention.