The invention will be better understood from a reading of the following detailed description of a preferred embodiment of the invention in conjunction with the drawing figures in which like reference designations are utilized to designate like elements, and in which:
The term “N-MOS” as used herein refers to MOS components that reside in regions of an integrated circuit substrate that have been doped with positively charged impurities. The term “P-MOS” as used herein refers to MOS components that reside in regions of an integrated circuit substrate that have been doped with negatively charged impurities.
Turning now to
The prior art solution to preventing the parasitic body diode 7 from conducting and injecting current into substrate 1 is to couple an external Schottky diode across the FET. In the prior art solution shown, Schottky diode 9 is connected to terminals 2 and 6. Schottky diode 9 is external to substrate 1. Schottky diode 9 is selected to have a lower forward voltage drop than that of the body diode 7. When FET 3 is off, if the voltage at the drain D goes below ground, the external Schottky diode 9 conducts and clamps drain D to the forward voltage drop of Schottky diode 9, thereby preventing the injection of a substrate current via body diode 7.
In an embodiment in accordance with the principles of the invention shown in
A load 5 is coupled to motor drive circuit 20 via terminal or pad 2. A switched conductive path from a voltage source V connected to load 5 is completed to the ground of the voltage source via terminal or pad 6. The switched conductive path includes FET 3 having a first or drain terminal D coupled to load 5 via pad 2 and a second or source terminal S coupled to the substrate 21 and connected to the other terminal or ground of the of the voltage source via pad 6. A control or gate terminal G of FET 3 is used to switch FET 3 between conductive and non-conductive states. A parasitic body diode 7 exists across the first terminal D and second terminal S of FET 3.
A voltage comparator or detector 23 is formed on the substrate 21. Voltage comparator or detector 23 has a first input coupled to FET first terminal D and a second input coupled to the substrate. Voltage comparator 23 has an output coupled to the control terminal G of FET 3 via one input 31 of a gate 29. Gate 29 has another input 33 that is coupled to the other portions 35 of motor drive circuit 20 that selectively cause FET 3 to become conductive and non-conductive. Voltage comparator 23 provides a signal at its output that operates such that when the voltage at the first terminal D is a reverse voltage, voltage comparator 23 will provide a gating signal at its output. The voltage level at which voltage comparator 23 operates is selected to be less than the forward voltage drop of body diode 7.
When a reverse voltage pulse such as an inductively induced pulse occurs at the first terminal D of FET 3, voltage detector 23 detects the reverse voltage before it reaches the forward voltage drop of body diode 7 and generates a signal that is coupled via gate 31 to control terminal G of FET 3 to cause FET 3 to become conductive. Voltage detector 23, in effect utilizes FET 3 to prevent current injection via body diode 3 into substrate 21.
Turning now to
A parasitic body diode 7 exists in substrate 321 across the first terminal D and second terminal S of FET 3.
A first voltage comparator or detector 23 is formed on the substrate 321. First voltage comparator or detector 23 has a first input coupled to FET 3 first terminal D and a second input coupled to substrate 321. Voltage comparator 23 has an output coupled to the control terminal G of FET 3 via one input 31 of a gate 29. Gate 29 has another input 33 that is coupled to the other portions 335 of motor drive circuit 320 that selectively cause FET 3 to become conductive and non-conductive. Voltage comparator 23 provides a signal at its output that operates such that when the voltage at the first terminal D is a reverse voltage, voltage comparator 23 will provide a gating signal at its output. The voltage level at which voltage comparator 23 operates is selected to be less than the. forward voltage drop of body diode 7.
When a reverse voltage pulse such as an inductively induced pulse from winding. 5a occurs at the first terminal D of FET 3, voltage detector 23 detects the reverse voltage before it reaches the forward voltage drop of body diode 7 and generates a signal that is coupled via gate 31 to control terminal G of FET 3 to cause FET 3 to become conductive.
Motor drive circuit 320 includes a second power FET 3a having a first or drain terminal D coupled to a second load 5b via a terminal or pad 2a. FET 3a has a second or source terminal S coupled to the substrate 321 and coupleable to a voltage source second or ground terminal at pad 6. FET 3 is comprised of a plurality of individual FET cells 331a to provide higher current handling capability. Each cell 331a has its terminals connected in common with like terminals of the other cell or cells. Although three cells 331a are shown, it will be appreciated by those skilled in the art that the number of cells 331a may be more or less than three.
A parasitic body diode 7a exists in substrate 321 across the first terminal D and second terminal S of FET 3a.
A second voltage comparator or detector 23a is formed on the substrate 321. Second voltage comparator or detector 23 has a first input coupled to FET 3a first terminal D and a second input coupled to substrate 321. Voltage comparator 23a has an output coupled to the control terminal G of FET 3 via one input 31a of a gate 29a. Gate 29a has another input 33a that is coupled to the other circuit portions 335 of motor drive circuit 320 that selectively cause FET 3a to become conductive and non-conductive. Voltage comparator 23a provides a signal at its output that operates such that when the voltage at the first terminal D of FET 3a is a reverse voltage, voltage comparator 23a will provide a gating signal at its output. The voltage level at which voltage comparator 23a operates is selected to be less than the forward voltage drop of body diode 7a.
When a reverse voltage pulse such as an inductively induced pulse from winding 5b occurs at the first terminal D of FET 3a, voltage detector 23a detects the reverse voltage before it reaches the forward voltage drop of body diode 7a and generates a signal that is coupled via gate 31a to control terminal G of FET 3a to cause FET 3a to become conductive.
The invention has been described in conjunction with illustrative embodiments. It will be appreciated by those skilled in the art that various changes may be made to the embodiments shown and described without departing from the spirit or scope of the invention. By way of non-limiting example, although the invention has been described in terms of N-MOS type FET transistors, the principles of the invention apply equally well to embodiments in which P-MOS type FET transistors or other transistors or semiconductor switching devices are utilized.
It is not intended that the invention be limited in any manner to the specific embodiments shown and described. It is intended that the invention only be limited by the claims appended hereto.