Claims
- 1. A process for synthesizing a porous crystalline material method which comprises the steps of:
(i) preparing a mixture capable of forming said material, said mixture comprising sources of water, an oxide of a tetravalent element Y, an oxide of a trivalent element X, wherein X is selected from the group consisting of aluminum, boron, gallium, iron, and indium, fluoride ions, and an organonitrogen cation RNm+ capable of directing the synthesis of said material, wherein the molar ratio of fluoride ions to organonitrogen cations RNm+ in said mixture is greater than 1.15 m but less than 2.5 m; (ii) maintaining said mixture under crystallization conditions until crystals of said material are formed; and (iii) recovering said crystalline material from step (ii).
- 2. The process of claim 1, wherein the molar ratio of fluoride ions to organonitrogen cations RNm+ in said mixture is from about 1.25 m to about 1.8 m.
- 3. The process of claim 1, wherein the molar ratio of the components of said mixture are as follows:
- 4 The process of claim 1, wherein the molar ratio of the components of said mixture are as follows:
- 5. The process of claim 1, wherein said tetravalent element Y includes silicon.
- 6. The process of claim 5, wherein said mixture contains an inorganic source of silica.
- 7. The process of claim 1, wherein said crystallization conditions include a temperature of about 100° C. to about 200° C. for a time of about 36 hours to about 30 days.
- 8. The process of claim 1, wherein said porous crystalline material is selected from the group consisting of zeolite beta, chabazite, CIT-5, ITQ-3, ITQ-4, ITQ-7, ITQ-9, ITQ-10, ITQ-12, SSZ-23, SSZ-24, SSZ-31 and ZSM-12.
- 9. The process of claim 1, wherein said porous crystalline material has the X-ray diffraction pattern set out in Table 2 of the specification.
- 10. The process of claim 1, wherein said porous crystalline material has the X-ray diffraction pattern set out in Table 4 of the specification.
- 11. The process of claim 1, wherein said porous crystalline material has the X-ray diffraction pattern set out in Table 6 of the specification.
Parent Case Info
[0001] This is a Non-Provisional Application of Provisional U.S. Serial No. 60/364,452 filed Mar. 15, 2002.
Provisional Applications (1)
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Number |
Date |
Country |
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60364452 |
Mar 2002 |
US |