System and method for color measurements or other spectral measurements of a material

Abstract

A system and method for color measurements or other spectral measurements of a material are provided. An illuminating device generates light for illuminating a sample of material. A detector detects light that has interacted with the sample and provides a measurement of the light that has interacted with the sample. A controller adjusts a duty cycle of the illuminating device to control the illumination of the sample. The measurement could be used by an analyzer to determine a spectral characteristic of the sample (such as a color of the sample). The determination of the spectral characteristic could be done without using any measurement of light that has not interacted with the sample. One or multiple light emitting diodes (LEDs) could be used to illuminate the sample, and the duty cycle of individual LEDs or groups of LEDs could be adjusted.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

For a more complete understanding of this disclosure, reference is now made to the following description, taken in conjunction with the accompanying drawings, in which:

FIG. 1 illustrates a first example color measurement system for measuring color according to one embodiment of this disclosure;

FIG. 2 illustrates a second example color measurement system for measuring color according to one embodiment of this disclosure;

FIG. 3 illustrates a third example color measurement system for measuring color according to one embodiment of this disclosure;

FIGS. 4A and 4B illustrate a first example method for measuring color according to one embodiment of this disclosure;

FIGS. 5A and 5B illustrate a second example method for measuring color according to one embodiment of this disclosure;

FIG. 6 illustrates a fourth example color measurement system for measuring color according to one embodiment of this disclosure;

FIG. 7 illustrates a fifth example color measurement system for measuring color according to one embodiment of this disclosure; and

FIG. 8 illustrates a third example method for measuring color according to one embodiment of this disclosure.

Claims

1. A system, comprising: an illuminating device operable to generate light for illuminating a sample of material;a detector operable to detect light that has interacted with the sample and to provide a measurement of the light that has interacted with the sample; anda controller operable to adjust a duty cycle of the illuminating device to control the illumination of the sample.

2. The system of claim 1, wherein the illuminating device includes at least one light emitting diode (LED).

3. The system of claim 2, wherein the illuminating device includes multiple LEDs, the controller operable to adjust the duty cycle of individual LEDs or groups of LEDs.

4. The system of claim 1, wherein: the illuminating device includes multiple illuminating devices; andthe detector includes multiple detectors.

5. The system of claim 1, further comprising at least one backing positioned on an opposing side of the sample as the illuminating device.

6. The system of claim 1, further comprising an analyzer operable to determine a spectral characteristic of the sample based on the measurement of the light that has interacted with the sample.

7. The system of claim 6, wherein the analyzer does not use, when determining the spectral characteristic of the sample, any measurement of light that has not interacted with the sample.

8. The system of claim 6, wherein the analyzer is further operable to control operation of the controller, thereby controlling the illumination of the sample.

9. The system of claim 6, wherein the analyzer is operable to determine the spectral characteristic of the sample based on multiple illuminations of the sample, the illuminations associated with different light generated by the illuminating device.

10. The system of claim 6, wherein the spectral characteristic includes a color of the sample.

11. The system of claim 6, wherein the controller is further operable to adjust at least one of a voltage and a current for driving the illuminating device to control the illumination of the sample.

12. The system of claim 11, further comprising a reference detector operable to measure a spectral power distribution of the light generated by the illuminating device; wherein the analyzer is further operable to cause the controller to adjust at least one of the duty cycle, the voltage, and the current until the measured spectral power distribution is within a specified threshold of a desired spectral power distribution.

13. The system of claim 1, wherein: the measurement of the light that has interacted with the sample includes a spectral power distribution of the light that has interacted with the sample; andthe duty cycle of the illuminating device represents a percentage of time that the illuminating device is generating light during a measurement interval.

14. A method, comprising: illuminating a sample of material using at least one light emitting diode (LED);detecting light that has interacted with the sample;providing a measurement of the light that has interacted with the sample; andadjusting a duty cycle of the at least one LED to control the illumination of the sample.

15. The method of claim 14, wherein: illuminating the sample includes using multiple LEDs to illuminate the sample; andadjusting the duty cycle includes adjusting the duty cycle of individual LEDs or groups of LEDs.

16. The method of claim 14, further comprising determining a spectral characteristic of the sample based on the measurement of the light that has interacted with the sample.

17. The method of claim 16, wherein determining the spectral characteristic of the sample includes determining the spectral characteristic of the sample without using any measurement of light that has not interacted with the sample.

18. The method of claim 14, further comprising adjusting at least one of a voltage and a current for driving the at least one LED to control the illumination of the sample.

19. The method of claim 18, further comprising: measuring a spectral power distribution of light generated by the at least one LED; andadjusting at least one of the duty cycle, the voltage, and the current until the measured spectral power distribution is within a specified threshold of a desired spectral power distribution.

20. A system, comprising: at least one light emitting diode (LED) operable to generate light for illuminating a sample of material;a detector operable to detect light that has interacted with the sample and to provide a measurement of the light that has interacted with the sample;an analyzer operable to determine a spectral characteristic of the sample using the measurement of the light that has interacted with the sample; anda controller operable to adjust the at least one LED to control the illumination of the sample;wherein the analyzer, to determine the spectral characteristic of the sample, does not use any measurement of light that has not interacted with the sample.

21. The system of claim 20, wherein the controller is operable to adjust a duty cycle of the at least one LED.