Information
-
Patent Grant
-
6822543
-
Patent Number
6,822,543
-
Date Filed
Wednesday, September 24, 200321 years ago
-
Date Issued
Tuesday, November 23, 200420 years ago
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Inventors
-
Original Assignees
-
Examiners
Agents
-
CPC
-
US Classifications
Field of Search
-
International Classifications
- H01H7116
- H01H7140
- H01H7704
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Abstract
A trip system for a circuit breaker includes a current sensor and a stop surface, the current sensor having a contact surface, a first end that is supported, and a second end with a degree of freedom. The current sensor, arranged for receiving an electric current, undergoes a first deflection in response to a first current and a second deflection in response to a second current, the first deflection resulting in clearance between the contact surface and the stop surface, and the second deflection resulting in contact between the contact surface and the stop surface.
Description
BACKGROUND OF THE INVENTION
The present disclosure relates generally to a trip system for a circuit breaker, and particularly to a system and method for controlling the mechanical stress at a thermal-magnetic trip unit of a circuit breaker.
Electrical circuit breakers may employ a variety of trip systems for sensing an electrical current and for initiating a tripping action at the circuit breaker, including bimetallic, magnetic, and thermal/magnetic trip units. Magnetic trip units may include c-shaped magnets, oil-filled dashpots, coil-type solenoids, and the like. Thermal trip units may include bimetals, shape memory alloys, and the like. Each phase of a multi-phase circuit breaker has a separate current sensor for that phase, which interfaces with an operating mechanism through a common trip bar and latch arrangement. Motion at an individual trip unit is transferred to the common trip bar, which is then driven to release a latch coupled to the operating mechanism, thereby resulting in a trip condition. To properly set the trip unit tripping characteristics, circuit breaker manufacturing processes employ a calibration routine that coordinates the responsiveness of the trip unit to an electrical current and adjusts for dimensional variations and tolerances among and between the circuit breaker components. One such calibration routine involves the adjustment of a calibration screw that biases the bimetal to an initial position. However, during a short circuit condition, excessive resistance heating or magnetic repulsion forces may result in excessive deflection and cause mechanical stress at the trip unit, which may have the drawback of introducing variation into the calibration setting. Shunting contacts or flux shunts may be employed to redirect the electrical current or magnetic flux, respectively, under a short circuit condition, thereby reducing the resultant mechanical stress seen at the trip unit, but the shunting contacts and flux shunt may not be sufficient to prevent an overstress condition at the trip unit under a high short circuit condition. Accordingly, there is a need in the art for a trip system for a circuit breaker that overcomes these drawbacks.
SUMMARY OF THE INVENTION
In one embodiment, a trip system for a circuit breaker includes a current sensor and a stop surface, the current sensor having a contact surface, a first end that is supported, and a second end with a degree of freedom. The current sensor, arranged for receiving an electric current, undergoes a first deflection in response to a first current and a second deflection in response to a second current, the first deflection resulting in clearance between the contact surface and the stop surface, and the second deflection resulting in contact between the contact surface and the stop surface.
In another embodiment, a method for controlling the mechanical stress at a current sensor assembly of a circuit breaker is disclosed. One end of a current sensor of the current sensor assembly is restrained and the current sensor energized. The unrestrained portion of the energized current sensor is permitted to deflect freely, but prevented from deflecting freely prior to the mechanical stress level at the current sensor reaching the mechanical yield point stress of the current sensor material.
BRIEF DESCRIPTION OF THE DRAWINGS
Referring to the exemplary drawings wherein like elements are numbered alike in the accompanying Figures:
FIG. 1
depicts an isometric view of an exemplary circuit breaker for applying an embodiment of the invention;
FIG. 2
depicts an isometric view of an exemplary trip system in accordance with an embodiment of the invention;
FIG. 3
depicts a side view of the trip system of
FIG. 2
with some parts removed for clarity; and
FIG. 4
depicts a side view of a portion of the trip system of
FIG. 2
with an energized portion shown in phantom.
DETAILED DESCRIPTION OF THE INVENTION
An embodiment of the invention provides a trip system for a circuit breaker having a current sensor assembly and a stop surface, the stop surface being arranged for preventing a mechanical stress level at the current sensor assembly from exceeding the mechanical yield point stress of the material used in the current sensor assembly. While the embodiment described herein depicts a three-pole circuit breaker as an exemplary circuit breaker, it will be appreciated that the disclosed invention is also applicable to other circuit breakers, such as single-phase, two-pole, and four-pole circuit breakers for example.
FIG. 1
depicts an exemplary embodiment of a three-phase circuit breaker
100
having a housing
105
, and an operating handle
110
for actuating an operating mechanism
115
for opening and closing a current path
120
. A trip system
200
having phase components, such as a thermal-magnetic trip system
300
discussed later, and intraphase components
205
, such as a crossbar or a trip bar (not shown), is in mechanical communication with operating mechanism
115
for tripping circuit breaker
100
and opening current path
120
.
Referring now to
FIG. 2
, a thermal-magnetic trip system (alternatively referred to as a trip unit or current sensor assembly)
300
for one of the three phases of circuit breaker
100
is depicted as part of current path
120
. Other parts of current path
120
that are shown include a flexible conductor
125
, such as a copper braid for example, and a line strap
130
. Current path parts not shown are omitted for clarity but may be readily contemplated by one skilled in the art. Trip system
300
includes a current sensor
305
, such as a bimetal or a shape memory alloy for example, a terminal
310
, a stationary flux path (alternatively referred to as a magnetic yoke or simply as a magnet)
315
, a movable flux path (alternatively referred to as an armature)
320
, a bias spring
325
, a calibration screw
330
, and a stop surface
335
. Stop surface
335
may be a stop pin, such as a roll pin or a machined pin, or of any other suitable configuration for engaging bimetal
305
, and may be made of steel or any other suitable material for stopping the deflection of bimetal
305
. A first end
306
of bimetal
305
is bonded, brazed for example, to terminal
310
, which provides a means of support for holding first end
306
stationary during bimetal deflection. First end
306
may also be supported by molded detail in housing
105
. A second end
307
of bimetal
305
is bonded, brazed for example, to braid
125
, and is unsupported, thereby providing a degree of freedom for second end
307
to deflect away from terminal
310
in response to bimetal
305
being resistively heated from an electric current in current path
120
. Magnet
315
and armature
320
provide a flux path around bimetal
305
, shown also in
FIG. 3
, and are coupled together at pivot
340
and pole faces
345
,
350
. Bias spring
325
is arranged to maximize the air gap between pole faces
345
,
350
. Magnet
315
may be attached to terminal
310
via a rivet
355
or other suitable attachment means, best seen in FIG.
3
.
Referring now to
FIG. 3
, the position of stop pin
335
relative to bimetal
305
in the absence of an electric current in current path
120
is depicted having an air gap
360
between stop pin
335
and a contact surface
308
on bimetal
305
. To establish the initial air gap
360
, which reduces as bimetal
305
deflects in response to resistive heating, the center of stop pin
335
is positioned at a distance X
1
from bimetal contact surface
308
and Y
1
from first end
306
of bimetal
305
. In comparison, calibration screw
330
is axially positioned perpendicular to terminal
310
at a distance Y
2
from first end
306
. In an embodiment, dimension Y
2
is equal to or less than dimension Y
1
, thereby placing calibration screw
330
closer to first end
306
than stop pin
335
, and dimension Y
1
is equal to or less than half the overall length of bimetal
305
, thereby placing stop pin
335
closer to first end
306
than to second end
307
. Stop pin
335
may be supported by a press fit arrangement in holes
316
in magnet
315
, as depicted in
FIGS. 2 and 3
, or by any other suitable support arrangement.
Under a first operating condition, a first level of current passes through current path
120
and bimetal
305
, resulting in resistive heating and a first deflection of bimetal
305
, with the deflection generally being in a direction away from terminal
310
. The first level of current may or may not be sufficient to cause tripping of operating mechanism
115
, depending on whether a trip threshold has been met or not, but is insufficient to result in contact between contact surface
308
and stop pin
335
. Accordingly, the first level of current maintains some degree of air gap
360
between contact surface
308
and stop pin
335
, with the air gap
360
at the first level of current being sufficient to permit trip unit
300
to trip operating mechanism
115
for opening current path
120
. In contrast, and under a second operating condition, a second level of current passes through current path
120
and bimetal
305
, resulting in resistive heating and a second deflection of bimetal
305
, the second current level being substantially greater than the first current level and resulting in a second deflection that causes contact surface
308
to contact stop pin
335
. In an embodiment, the first current level may be, for example, 50%, 100%, or 200% of the steady state current rating of trip unit
300
, while the second current level may be, for example, 10,000% of the steady state current rating of trip unit
300
. A second current level of 10,000% is referred to as a short circuit current and may be at a level of other than 10,000%. While flux paths
315
,
320
are designed to be responsive to such short circuit currents for quickly tripping operating mechanism
115
to open current path
120
, bimetal
305
, being in the current path, is still exposed to such high current levels for a short period of time, which results in rapid resistive heating and deflection of bimetal
305
. In the absence of stop pin
335
, bimetal
305
may deflect to the point where either bimetal
305
generally, or terminal
310
at brazed end
306
, generates a mechanical stress level that is in excess of the mechanical yield point stress of the respective material. However, with the use of stop pin
335
, such overstressing may be avoided. Accordingly, in an embodiment having stop pin
335
, the exemplary second deflection of bimetal
305
results in a mechanical stress level at bimetal
305
or terminal
310
that is less than the mechanical yield point stress of the respective material.
FIG. 4
depicts in phantom bimetal
305
′ at the exemplary second deflection where deflected contact surface
308
′ is in contact with stop pin
335
. By appropriately dimensioning X
1
, Y
1
, and Y
2
, overstressing at bimetal
305
and terminal
310
may be avoided without adversely effecting the calibration and operation of trip unit
300
, and without adversely changing the calibration of trip unit
300
after exposure to an exemplary second current level.
By applying an arrangement in accordance with an embodiment described above, the mechanical stress at current sensor assembly
300
may be controlled by: restraining brazed end
306
of current sensor
305
via terminal
310
or mold detail in housing
105
; energizing current sensor
305
either electrically, thermally, or magnetically, to cause deflection of current sensor
305
; permitting free deflection of the unrestrained portion of the energized current sensor
305
; and, preventing free deflection via stop pin
335
of the unrestrained portion of the energized current sensor
305
prior to the mechanical stress level at current sensor
305
or terminal
310
reaching the mechanical yield point stress of the respective material. As also discussed above, further control of the mechanical stresses at current sensor
305
and terminal
310
may be achieved by preventing free deflection of current sensor
305
at a point on current sensor
305
that is closer to first end
306
than to second end
307
, and by preventing free deflection of current sensor
305
at a point on current sensor
305
that is further away from first end
306
than is the point of an applied calibration force from calibration screw
330
.
As disclosed herein, some embodiments of the invention may include some of the following advantages: reduced bimetal stress in response to high current let through; reduced stress at the brazed joint of bimetal to terminal in response to high current let through; reduced variation in calibration after short circuit; reduced variation in trip unit response generally after short circuit; and, utilization of existing parts, such as the magnet, with added functionality.
While the invention has been described with reference to exemplary embodiments, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted for elements thereof without departing from the scope of the invention. In addition, many modifications may be made to adapt a particular situation or material to the teachings of the invention without departing from the essential scope thereof. Therefore, it is intended that the invention not be limited to the particular embodiment disclosed as the best or only mode contemplated for carrying out this invention, but that the invention will include all embodiments falling within the scope of the appended claims. Moreover, the use of the terms first, second, etc. do not denote any order or importance, but rather the terms first, second, etc. are used to distinguish one element from another. Furthermore, the use of the terms a, an, etc. do not denote a limitation of quantity, but rather denote the presence of at least one of the referenced item.
Claims
- 1. A trip system for a circuit breaker, comprising:a current sensor having a contact surface, a first end that is supported and a second end with a degree of freedom, the current sensor arranged for receiving an electric current and for generating a displacement at the second end in response thereto; and a stop surface disposed at a first distance from the first end and at a second distance from the contact surface, the stop surface being disposed closer to the first end than to the second end; wherein the current sensor undergoes a first deflection in response to a first current and a second deflection in response to a second current, the first deflection resulting in clearance between the contact surface and the stop surface, and the second deflection resulting in contact between the contact surface and the stop surface.
- 2. The system of claim 1, wherein:the second deflection results in a mechanical stress level at the current sensor that is less than the mechanical yield point stress of the current sensor material.
- 3. The system of claim 1, wherein:the current sensor is a bimetal.
- 4. The system of claim 1, further comprising:a terminal connected to the current sensor at the first end and disposed proximate the current sensor for at least a portion of the length of the current sensor, the terminal being disposed such that the current sensor deflects away from the terminal in response to an electric current.
- 5. The system of claim 4, further comprising:a calibration screw axially disposed perpendicular to the terminal at a third distance from the first end, the third distance being equal to or less than the first distance.
- 6. The system of claim 4, wherein:the second deflection results in a mechanical stress level at the first end that is less than the mechanical yield point stress of the current sensor material and less than the mechanical yield point stress of the terminal material.
- 7. The system of claim 4, further comprising:a magnetic yoke defining a flux path proximate the current sensor, the magnetic yoke disposed in fixed relation to the current sensor and arranged for concentrating a magnetic flux associated with an electric current at the current sensor, the stop surface being supported by the magnetic yoke.
- 8. The system of claim 7, wherein:the magnetic yoke is connected to the terminal.
- 9. The system of claim 7, wherein:the stop surface is a pin made of steel.
- 10. A method for controlling the mechanical stress at a current sensor assembly of a circuit breaker, comprising:restraining one end of a current sensor of the current sensor assembly; energizing the current sensor to achieve a first deflection present a clearance between the current sensor and a stop surface; energizing the current sensor to achieve a second deflection absent a clearance between the current sensor and the stop surface; permitting free deflection of the unrestrained portion of the energized current sensor at the first deflection; preventing free deflection of the unrestrained portion of the energized current sensor at the second deflection prior to the mechanical stress level at the current sensor reaching the mechanical yield point stress of the current sensor material; and preventing free deflection of the current sensor at a point on the current sensor that is closer to the restrained end than to the unrestrained end of the current sensor.
- 11. The method of claim 10, wherein the current sensor assembly further comprises a terminal connected to the current sensor at the restrained one end, and further comprising:preventing free deflection of the unrestrained portion of the energized current sensor prior to the mechanical stress level at the terminal reaching the mechanical yield point stress of the terminal material.
- 12. The method of claim 10, wherein the current sensor is a bimetal.
- 13. The method of claim 10, wherein the energizing the current sensor, comprises:electrically energizing the current sensor, thermally energizing the current sensor, magnetically energizing the current sensor, or any combination comprising at least one of the foregoing.
- 14. The method of claim 10, further comprising:applying to the current sensor a calibration force; and preventing free deflection of the current sensor at a point on the current sensor that is further away from the restrained end than is the applied point of the calibration force.
US Referenced Citations (3)
Number |
Name |
Date |
Kind |
3858130 |
Misencik |
Dec 1974 |
A |
4616199 |
Oster |
Oct 1986 |
A |
5864266 |
Mickelson et al. |
Jan 1999 |
A |