Claims
- 1. A system for measuring stress exerted on an optical fiber, comprising:a light source emitting a light having a predetermined frequency; a first photo detector coupled to the light source that produces a first electrical signal proportional to the light; a first amplifier coupled to the first photo detector to amplify the first electrical signal therefrom; an optical sensor coupled to the light source by the optical fiber to transmit at least a portion of the light to the optical sensor; a second photo detector coupled to the optical sensor to detect at least a portion of the light reflected from the optical sensor, and produces a second electrical signal proportional thereto; a second amplifier coupled to the second photo detector to amplify the second electrical signal therefrom; a comparator coupled to the first and second photo detectors to compare the second electrical signal with the first electrical signal, and produce a first output voltage in response to the first electrical signal exceeding the second electrical signal, and produce a second output voltage in response to the first electrical signal not exceeding the second electrical signal; a microcontroller coupled to the comparator to generate a plurality of trigger signals at a fixed frequency, each initiating a modulation cycle and further that generates a control signal in response to detecting a predetermined transition between the first and second output voltages; a modulator coupled to the light source and to the microcontroller to modulate the frequency of the light source in a periodic manner in response to receiving a trigger signal from the microcontroller; a source of clock pulses; and a counter coupled to the source of clock pulses and to the microcontroller begin counting clock pulses in response to receiving a trigger signal, and end counting clock pulses in response to receiving the control signal from the microcontroller to generate a count value; wherein when the optical fiber and the fiber optic sensor is exposed to various stresses associated with a process by moving the optical fiber and the fiber optic sensor through the process to be measured the microcontroller computes the stress exerted on the optical fiber in response to receiving the count value for each modulation cycle.
- 2. The system of claim 1, wherein the optical sensor is an optical fiber interferometer.
- 3. The system of claim 2, wherein the interferometer is a Fabry-Perot Interferometer.
- 4. The system of claim 1, wherein the fiber optic sensor is a Bragg grating.
Parent Case Info
This application is a Div. of U.S. Ser. No. 09/407,579 filed Sep. 28, 1999, now U.S. Pat. No. 6,314,214.
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Non-Patent Literature Citations (1)
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Patent Abstracts of Japan, JP 09-079827, Mar. 28, 1997, T. Satoru, Furukawa Electric Co. Ltd. |