This application is a divisional of U.S. patent application Ser. No. 09/460,844, filed on Dec. 14, 1999 by Hekmatpour, and entitled A SYSTEM AND METHOD FOR DETECTING DESIGN ERRORS IN INTEGRATED CIRCUITS, and U.S. patent application Ser. No. 09/460,843, filed on Dec. 14, 1999 by Hekmatpour, and entitled A SYSTEM AND METHOD FOR RECOVERING FROM DESIGN ERRORS IN INTEGRATED CIRCUITS.
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Brandt, Y.; Jervis, B.W.; Maidon, Y.; Circuit multi-fault diagnosis and prediction error estimation using a committee of Bayesian neural networks, Testing Mixed Signal Circuits and Systems (Ref. No.: 1997/361), IEE Colloquium on , Oct. 23, 1997, pp. 7/1.* |
Wegener, C.; Kennedy, M.P.; Incorporation of hard-fault-coverage in model-based testing of mixed-signal Ics, Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings, Mar. 27, 2000, pp.: 765.* |
Cuviello, M.; Dey, S.; Xiaoliang Bai; Yi Zhao; Fault modeling and simulation for crosstalk in system-on-chip interconnects, Computer-Aided Design, 1999. Digest of Technical Papers. 1999 IEEE/ACM International Conference on, Nov. 7, 1999, pp.: 297.* |
Mao-Feng Lan; Geiger, R.; Impact of model errors on predicting performance of matching-critical circuits, Circuits and Systems, 2000. Proceedings of the 43rd IEEE Midwest Symposium on, vol.: 3, Aug. 8, 2000, pp.: 1324-1328 vol. 3. |