This application is a Continuation of application Ser. No. 08/055,597 filed May 3, 1993 now abandoned.
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Number | Date | Country |
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2257528 | Jan 1993 | GBX |
Entry |
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U.S. Patent application S.N. 07/696,457, entitled "An Apparatus and Method for Non-destructive Testing Using Multi-frequency Eddy Currents" by Kristina H. Hedengren, filed May 6, 1991. |
U.S. Patent Application S.N. 07/865,786, entitled "Flexible High Density Interconnect Structure and Flexibly Interconnected System" by C.W. Eichelberger et al, filed Apr. 7, 1992. |
U.S. Patent Application S.N. 07/696,455, entitled "Flexible Eddy Current Surface Measurement Array for Detecting Near Surface Flaws in a Conductive Part" by K.H. Hedengren et al., filed May 6, 1991. |
Number | Date | Country | |
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Parent | 55597 | May 1993 |