Field of the Disclosure
The present disclosure relates to manufacturing and tuning a near field communication antenna. More specifically, the present disclosure relates to tuning a near field communication antenna by adjusting the location of a stamped metal antenna relative to a ferrite substrate.
Related Art
Near field communication (NFC) antennas and antenna assemblies are commonly used in a variety of electronic devices, and more specifically in smartphones. In such devices, the antenna is affixed to a ferrite substrate. The antenna can be formed on the ferrite substrate through a chemical etching process. Ferrite substrates have porosity which is inconsistent across different batches of ferrite and which affects certain functional properties of the antenna assembly, such as inductance.
What would be desired but has not yet been provided is an efficient and effective method for tuning or optimizing an antenna assembly to obtain desired functional properties thereof.
The present disclosure relates to a method for tuning an NFC (near field communication) antenna. More specifically, the disclosure relates to a method for tuning and/or optimizing an NFC antenna assembly by adjusting/modifying the placement of a stamped metal antenna relative to a ferrite substrate. The placement could be performed by a robotic system and the method could utilize an adaptive and/or manual feedback system.
The features of the disclosure will be apparent from the following Detailed Description, taken in connection with the accompanying drawings, in which:
The present disclosure relates to a method for tuning an NFC (near field communication) antenna, as discussed in detail below in connection with the figures.
At the coil and contacts station 30, coil and contacts for a wireless charger are added and the coil is laser soldered to the contacts. At the antenna application and tuning station 34, the one or more individual (e.g., singulated) antennas are each applied to one or more ferrite substrates respectively. At the press station 36, the position of the antenna relative to the ferrite is pressed to ensure and further solidify a solid contact between each of the antennas and ferrite substrates. At the visual inspection station 38, an individual and/or a computer system (e.g., with artificial intelligence) visually inspects the antennas applied to the ferrite (e.g., for any obvious defects). At the test station 40, the individual antennas are tested (e.g., manually or automatically) for compliance and quality control to ensure that they meet the desired specifications. Any antennas found to be defective or deficient are separated and put aside for further analysis.
Many of the foregoing stations are interchangeable so that they could be performed in a variety of orders (e.g., the ferrite station could be after the antenna station, etc.). Further, some stations could be combined into one station (e.g., the ferrite station and antenna station could be combined into a loading station), or a single station could be separated into multiple stations (e.g., the coil and contacts station could be separated into a coil and contacts loading station and a laser solder station). Additionally, some of the foregoing stations could be omitted completely (e.g., coil and contacts station, etc.).
In step 58, an antenna biscuit having one or more antennas is loaded onto the pallet. In step 60, the antennas are separated from the biscuit into individual antennas. Biscuit scraps (e.g., from the biscuit frame) are removed from the pallet (e.g., by vacuum). In step 64, coil and contacts for a wireless charger could be added to the pallet, each of the antennas, and/or each of the ferrite substrate. In step 66, the coil is soldered to the contacts for the wireless charger.
In step 68, discussed in more detail below, the antenna is applied to the ferrite and the location of the antenna relative to the ferrite is adjusted. In step 70, the antenna is re-pressed to ensure that the antenna assembly has set and to further solidify the contact between the antennas and the ferrite substrates. In step 72, the antennas are tested for quality control. In step 74, the antennas that passed the quality control test are separated from those that failed.
The robotic arm 132 lifts the glue cards from the holding tray 126 and positions the glue cards over the antennas 112. The robotic arm 132 lowers the glue cards onto the antennas 112, thereby adhering the antennas 112 to the glue cards. The robotic arm 132 then lifts the antennas 112 secured to the glue cards and positions the antennas 112 and glue cards over the ferrite substrates 108. Once the antennas 112 are in a desired position relative to the ferrite substrates 108, the antennas 112 are lowered onto the ferrite substrates 108. The robotic arm 132 positions the antennas 112 before the antennas 112 contact the ferrite substrates 108. The robotic arm 132 can shift the antennas 112 relative to the ferrite substrates 108 (e.g., by nanometers) before adhering the antennas 112 to the ferrite 108. Such movement could be side-to-side, for example, to tune and adjust functional properties of the final antenna assembly (e.g., frequency, inductance) to compensate for changes in ferrite porosity among different ferrite batches. Changing the inductance changes the frequency of the antenna assembly because there is a correlation between the two properties.
The antenna assembly can then be optimized by measuring the inductance for changes in the position of the antenna 112 relative to the ferrite substrate 108. More specifically, the antenna assembly is optimized by applying the antenna 112 in a specific position relative to a ferrite substrate 108 for a particular ferrite batch, and testing the functional properties of that particular assembly. The position of the antenna 112 relative to the ferrite substrate 108 is recalibrated based on the results of the tests, and then retested (although alternatively a different antenna and a different ferrite substrate from the same ferrite batch could be used). Recalibration and retesting continues until the functional properties of the antenna assembly have been optimized for a particular ferrite batch, and then that particular position is applied to all antenna assemblies for the particular ferrite batch (ferrite substrates 108 in each ferrite batch usually have the same, or very similar, properties). This optimization procedure is repeated for each ferrite batch, because the properties of ferrite substrates 108 vary between different ferrite batches. The antenna assemblies are then monitored and tested (as described below) to ensure that each has the desired optimized functional properties, and the system can be recalibrated if a problem arises. An adaptive feedback system could also be employed to make positioning adjustments.
Having thus described the invention in detail, it is to be understood that the foregoing description is not intended to limit the spirit or scope thereof. It will be understood that the embodiments of the present invention described herein are merely exemplary and that a person skilled in the art may make any variations and modification without departing from the spirit and scope of the invention. All such variations and modifications, including those discussed above, are intended to be included within the scope of the invention.
This application claims priority to U.S. Provisional Patent Application No. 61/910,642, filed on Dec. 2, 2013, the entire disclosure of which is expressly incorporated herein by reference.
Number | Name | Date | Kind |
---|---|---|---|
20090179812 | Nakamura et al. | Jul 2009 | A1 |
20120040128 | Finn | Feb 2012 | A1 |
20120227248 | Orihara et al. | Sep 2012 | A1 |
20120237728 | Kimura et al. | Sep 2012 | A1 |
20120282857 | Zhang | Nov 2012 | A1 |
Number | Date | Country |
---|---|---|
103715501 | Apr 2014 | CN |
Entry |
---|
International Search Report of the International Searching Authority dated Nov. 4, 2015, issued in connection with International Application No. PCT/US15/35768 (5 pages). |
Written Opinion of the International Searching Authority dated Nov. 4, 2015, issued in connection with International Patent Appln. No. PCT/US15/35768 (7 pages). |
Supplementary Partial European Search Report dated Jan. 2, 2018 issued in connection with European Patent Application No. 15809953 (18 pages). |
Number | Date | Country | |
---|---|---|---|
20150155612 A1 | Jun 2015 | US |
Number | Date | Country | |
---|---|---|---|
61910642 | Dec 2013 | US |