Claims
- 1. An optical inspection system for inspecting for the presence of defects in a stream of materials having a distinctive color signature, said optical inspection system comprising:
- means for conveying said stream of materials;
- sensing means positioned near said stream of materials as said stream is conveyed by said conveying means to periodically sample the presence of a selected number of colors appearing in a predetermined field of view of said stream of materials, said sensing means producing a set of electrical signals for each of said colors sensed in said predetermined field of view from said stream of materials for each of said samples; and
- processing means connected to said sensing means for processing said electrical signals from said samples, said processing means further comprises:
- (a) means for generating a multi-dimensional color signature for said stream of materials based upon said selected colors, said multi-dimensional color signature being generated from a plurality of said samples of said stream of materials passing said sensing means,
- (b) means for comparing said electrical signals to said generated multi-dimensional color signature, said processing means issuing an error signal when a desired multi-color combination of said electrical signals does not match said multi-dimensional color signature.
- 2. The optical inspection system of claim 1 wherein said sensing means further comprises:
- an aperture for limiting light from said predetermined field of view;
- a pair of cylindrical lenses receiving said limited light from said aperture for collimating said limited light;
- a diffraction grating receiving said collimated light from said pair of cylindrical lenses for diffracting said collimated light;
- a spherical lens receiving a first order image of said diffracted light for focusing said first order image; and
- a detector array in the focal area of said first order image.
- 3. The optical inspection system of claim 2 wherein said sensing means further comprises a shutter controlled by said processing means for blocking said aperture to generate a reference set of said electrical signals from said detector array corresponding to a uniform dark condition.
- 4. The optical inspection system of claim 1 wherein said set of electrical signals comprises a first subset of color signals from a first sub-area of said field of view and a second subset of color signals from a second sub-area of said field of view.
- 5. The optical inspection system of claim 4 wherein said first subset of colors comprises: green, yellow, blue and red and wherein said second subset of colors comprises: green, yellow, blue and red.
- 6. The optical inspection system of claim 4 wherein said generating means provides separate two dimensional color signatures between said first and second subset of color signatures.
- 7. The optical inspection system of claim 1 wherein said generating means further provides dilation to said generated color signature so as to speed up said generation.
- 8. The optical inspection system of claim 1 wherein said stream of materials comprises a continuous web of material.
- 9. The optical inspection system of claim 1 wherein said stream of materials comprises a series of discrete sheets of printed matter.
- 10. The optical inspection system of claim 1 wherein said stream of materials comprises a series of discrete objects.
- 11. The optical inspection system of claim 1 wherein said stream of materials comprises a two dimensional web of discrete objects.
- 12. An optical inspection system for inspecting for the presence of defects in a stream of materials having a distinctive color signature, said optical inspection system comprising:
- means for conveying said stream of material in a production line;
- means positioned near said stream of material as said stream is conveyed by said production line to periodically sample the presence of a selected number of colors appearing in a predetermined field of view on said stream of material, said sensing means producing an electrical signal for each of said selected colors; and
- means connected to said sensing means for processing said electrical signals, said processing means further comprising:
- (a) generating a plurality of two color signatures based upon said selected number of colors, said two color signatures being generated from a plurality of said samples of said stream of materials passing said sensing means; and
- (b) comparing said electrical signals from subsequent samples to said generated plurality of two color signatures, said processing means issuing an error signal when a two color combination of said electrical signals does not match the corresponding two color signature.
- 13. The optical inspection system of claim 12 wherein said sensing means further comprises:
- an aperture for limiting light from said field of view;
- a pair of cylindrical lenses receiving said limited light from said aperture for collimating said limited light;
- a diffraction grating receiving said collimated light from said pair of cylindrical lenses for diffracting said collimated light;
- a spherical lens receiving a first order image of said diffracted light for focusing said first order image; and
- a detector array in the focal area of said first order image.
- 14. The optical inspection system of claim 13 wherein said sensing means further comprises a shutter controlled by said processing means for blocking said aperture to generate a reference set of said electrical signals from said detector array corresponding to a uniform dark condition.
- 15. The optical inspection system of claim 12 wherein said electrical signals comprises a first subset of color signals from a first sub-area of said field of view and a second subset of color signals from a second sub-area of said field of view.
- 16. The optical inspection system of claim 15 wherein said generating means provides separate two dimensional color signatures for said first and second sub-areas of said field of view.
- 17. The optical inspection system of claim 12 wherein said generating means further provides dilation to said generated color signature so as to speed up said generation.
- 18. An optical inspection system for inspecting for the presence of defects in a stream of material having a distinctive color signature, said optical inspection system comprising:
- means for conveying said stream of material;
- means positioned near said stream of material for periodically sampling the presence of a selected number of colors appearing in a predetermined field of view on said stream of material and producing a set of signals for each of said selected colors during each sample, said sensing means also producing a set of reference signals for each of said selected number of colors corresponding to a uniform dark condition; and
- means connected to said sensing means for processing said sample signals and said reference signals, said processing means further comprising:
- (a) means receptive of said sample signals and said reference signals for correcting said sample signals for drift based upon said reference signals;
- (b) means receptive of said sample signals for generating a plurality of two color signatures based upon said corrected sample signals, said two color signatures being generated from a plurality of said corrected samples of said stream of materials passing said sensing means; and
- (c) means for comparing said subsequent sample signals to said two color signatures, said means issuing an error signal when a two color combination of said sample signals fails to match the corresponding two color signature.
- 19. A method for optical inspection of defects in a stream of material having a distinctive color signature, said method comprising the steps of:
- conveying the stream of material along a path;
- periodically sampling the presence of a selected number of colors appearing in a predetermined field of view as the stream of material moves along the path, and producing a set of sample signals for each of said selected colors;
- producing a reference signal for each of said selected colors corresponding to a uniform dark condition;
- correcting said sample signals for drift based upon said reference signals;
- generating a plurality of two color signatures based upon said selected colors of said corrected sample signals, said two color signatures being generated from a plurality of said corrected sample signals from said stream of material;
- comparing subsequent corrected sample signals to said generated plurality of two color signatures; and
- issuing an error signal when a two color combination of said corrected sample signals fails to match the corresponding two color signature.
- 20. A method for optical inspection of defects in a stream of material having a distinctive color signature, said method comprising the steps of:
- conveying the stream of material along a path;
- periodically sampling the presence of a selected number of colors appearing in a predetermined field of view as the stream of material moves in the path;
- producing a first set of signals for each of said selected colors from a first portion of said predetermined field of view during each sample;
- producing a second set of signals for each of said selected colors in a second portion of said predetermined field of view during each sample;
- generating a plurality of multi-color signatures based upon a plurality of samples from said first and second sets;
- comparing the first and second sets of signals for subsequent samples to said generated plurality of multi-color signatures; and
- issuing an error signal when the multi-color combination of said signals for a sample fails to match the corresponding multi-color combination signature.
RELATED APPLICATION
The present application is a continuation-in-part of applicant's co-pending U.S. patent application Ser. No. 07/890,670, filed on May 28, 1992, U.S. Pat. No. 5,245,399, which is a continuation of U.S. patent application Ser. No. 07/715,802, filed on Jun. 14, 1991, now U.S. Pat. No. 5,120,126, issued on Jun. 9, 1992.
US Referenced Citations (10)
Non-Patent Literature Citations (2)
Entry |
Cutler-Hammer Product Information, Eaton, Oct. 1990, 4 pages. |
"Multiple LED, Color Sensing for On-Line, Industrial Applications", by Gregory L. Nadolski, Eaton Corporation, 3 pages. |
Continuations (1)
|
Number |
Date |
Country |
Parent |
715802 |
Jun 1991 |
|
Continuation in Parts (1)
|
Number |
Date |
Country |
Parent |
890670 |
May 1992 |
|