Claims
- 1. A system, comprising:
a grid associater constructed and arranged to associate one or more grids with a probe array image based, at least in part, upon a positional placement of at least one of one or more control features; a grid aligner constructed and arranged to align at least one of the one or more grids with one or more pixels of the one or more control features based, at least in part, upon a metric value determined by one or more characteristics of the one or more pixels; and a cell intensity data generator constructed and arranged to generate one or more cell intensity values.
- 2. The system of claim 1, wherein:
the probe array image includes an image of a synthesized probe array or a spotted probe array.
- 3. The system of claim 1, wherein:
the probe array image includes a filtered probe array image.
- 4. The system of claim 1, wherein:
the one or more control features comprise one or more probe sets.
- 5. The system of claim 1, wherein:
the one or more control features comprise one or more chrome features.
- 6. The system of claim 1, wherein:
each of the one or more cell intensity values is based, at least in part, upon one or more pixel intensity values associated with an area defined by one of the one or more grids.
- 7. The system of claim 1, wherein:
the metric value includes an average intensity value, wherein the one or more characteristics includes a pixel intensity value.
- 8. The system of claim 1, wherein:
the metric value is compared to a predefined value or user selected value.
- 9. The system of claim 1, wherein:
the alignment is based, at least in part, upon the similarity between the metric value and the predefined or user selected value.
- 10. A method, comprising the acts of:
associating one or more grids with a probe array image based, at least in part, upon a positional placement of at least one of one or more control features; aligning at least one of the one or more grids with one or more pixels of the one or more control features based, at least in part, upon a metric value determined by one or more characteristics of the one or more pixels; and generating one or more cell intensity values.
- 11. The method of claim 10, wherein:
the probe array image includes an image of a synthesized probe array or a spotted probe array.
- 12. The method of claim 10, wherein:
the probe array image includes a filtered probe array image.
- 13. The method of claim 10, wherein:
the one or more control features comprise one or more probe sets.
- 14. The method of claim 10, wherein:
the one or more control features comprise one or more chrome features.
- 15. The method of claim 10, wherein:
each of the one or more cell intensity values is based, at least in part, upon one or more pixel intensity values associated with an area defined by one of the one or more grids.
- 16. The method of claim 10, wherein:
the metric value includes an average intensity value, wherein the one or more characteristics include a pixel intensity value.
- 17. The method of claim 10, wherein:
the metric value is compared to a predefined value or a user selected value.
- 18. The method of claim 17, wherein:
the act of aligning is based, at least in part, upon the similarity between the metric value and the predefined or user selected value.
- 19. A system for probe array image analysis, comprising:
a grid associater constructed and arranged to associate one or more grids with a probe array image based, at least in part, upon a positional placement of at least one of one or more control features; a grid data calculator constructed and arranged to determine a ratio of a first set of pixel intensity values and second set of pixel intensity values associated with each area of a plurality of areas defined by one of the one or more grids; and a grid position adjuster constructed and arranged to adjust the positional association of at least one of the one or more grids based, at least in part upon the determined ratio.
- 20. The system of claim 16, wherein:
the one or more probe arrays comprise synthesized probe arrays or spotted probe arrays.
- 21. The system of claim 16, wherein:
the one or more control features comprise one or more probe sets.
- 22. A method, comprising the acts of:
associating one or more grids with a probe array image based, at least in part, upon a positional placement of at least one of one or more control features; determining a ratio of a first set of pixel intensity values and second set of pixel intensity values associated with each area of a plurality of areas defined by one of the one or more grids; and adjusting the positional association of at least one of the one or more grids based, at least in part upon the determined ratio.
- 23. The method of claim 29, wherein:
the one or more probe arrays comprise synthesized probe arrays or spotted probe arrays.
- 24. The method of claim 16, wherein:
the one or more control features comprise one or more probe sets.
- 25. A system for probe array image analysis, comprising:
a grid associater constructed and arranged to associate one or more grids with a probe array image based, at least in part, upon a positional placement of at least one of one or more control features; and a cell intensity data generator constructed and arranged to generate one or more cell intensity values, wherein each cell intensity value is based, at least in part, upon one or more weighted pixel intensity values associated with an area defined by one of the one or more grids.
- 26. The system of claim 25, wherein:
the one or more probe arrays comprise synthesized probe arrays or spotted probe arrays.
- 27. The system of claim 25, wherein:
the weighted pixel intensity value associated with a pixel is based, at least in part, upon the length and width of the pixel.
- 28. A method for probe array image analysis, comprising:
associating one or more grids with a probe array image based, at least in part, upon a positional placement of at least one of one or more control features; and generating one or more cell intensity values, wherein each cell intensity value is based, at least in part, upon one or more weighted pixel intensity values associated with an area defined by one of the one or more grids.
- 29. The method of claim 28, wherein:
the one or more probe arrays comprise synthesized probe arrays or spotted probe arrays.
- 30. The method of claim 28, wherein:
the weighted pixel intensity value associated with a pixel is based, at least in part, upon the length and width of the pixel.
RELATED APPLICATIONS
[0001] The present application claims priority from Provisional Patent Application Serial No. 60/367,146, titled “Image Processing”, filed Mar. 21, 2002; Provisional Patent Application Serial No. 60/393,926, titled “System and Method for Processing Images From Biological Probe Arrays”, filed Jul. 3, 2002; Provisional Patent Application Serial No. 60/423,115, titled “System and Method for Local Grid Adjustment on Images of Biological Robe Arrays”, filed Nov. 1, 2002; and Provisional Patent Application Serial No. 60/423,911, titled “System and Method for Local Grid Adjustment on Images of Biological Robe Arrays”, filed Nov. 5, 2002, all of which are hereby incorporated herein by reference in their entireties for all purposes.
Provisional Applications (4)
|
Number |
Date |
Country |
|
60367146 |
Mar 2002 |
US |
|
60393926 |
Jul 2002 |
US |
|
60423115 |
Nov 2002 |
US |
|
60423911 |
Nov 2002 |
US |