The present disclosure relates generally to systems and methods for monitoring components, and in particular to systems and methods which provide non-contact monitoring.
Throughout various industrial applications, apparatus components are subjected to numerous extreme conditions (e.g., high temperatures, high pressures, large stress loads, etc.). Over time, an apparatus's individual components may suffer creep and/or deformation that may reduce the component's usable life. Such concerns might apply, for instance, to some turbomachines.
Turbomachines are widely utilized in fields such as power generation and aircraft engines. For example, a conventional gas turbine system includes a compressor section, a combustor section, and at least one turbine section. The compressor section is configured to compress air as the air flows through the compressor section. The air is then flowed from the compressor section to the combustor section, where it is mixed with fuel and combusted, generating a hot gas flow. The hot gas flow is provided to the turbine section, which utilizes the hot gas flow by extracting energy from it to power the compressor, an electrical generator, and other various loads.
During operation of a turbomachine, various components (collectively known as turbine components) within the turbomachine and particularly within the turbine section of the turbomachine, such as turbine blades, may be subject to creep due to high temperatures and stresses. For turbine blades, creep may cause portions of or the entire blade to elongate so that the blade tips contact a stationary structure, for example a turbine casing, and potentially cause unwanted vibrations and/or reduced performance during operation.
Accordingly, components may be monitored for creep. One approach to monitoring components for creep is to configure strain sensors on the components, and analyze the strain sensors at various intervals to monitor for deformations associated with creep strain. While such approaches are useful and accurate, one drawback is the labor and cost associated with applying the strain sensors to the components. Further, such analysis in some cases can only be performed by removing the components from an associated assembly, such as a turbomachine, for analysis.
The need for improved component monitoring is not limited to stain sensor applications. Such need exists in other component applications. For example, improved monitoring of cooling holes defined in the exterior surface of a component and/or other surface features configured on the exterior surface of a component may be useful.
Accordingly, alternative systems and methods for monitoring components are desired in the art. In particular, system and methods which provide accurate measurements while not requiring contact with or component mounting on the components, and which can be performed without requiring component removal from an associated assembly, would be advantageous.
Aspects and advantages of the invention will be set forth in part in the following description, or may be obvious from the description, or may be learned through practice of the invention.
In accordance with one embodiment of the present disclosure, a method for monitoring a component is provided. The component has an exterior surface. The method includes projecting structured light onto a predetermined location on the exterior surface of the component. The structured light is emitted from a structured light emitter. The method further includes detecting the structured light after the structured light is reflected by the exterior surface. The method further includes calculating at least one characteristic of the detected structured light.
In accordance with another embodiment of the present disclosure, a system for monitoring a component is provided. The component has an exterior surface. The system includes a data acquisition device, the data acquisition device including a structured light emitter and a detector. The data acquisition device is configured for projecting structured light onto a predetermined location on the exterior surface of the component, and detecting the structured light after the structured light is reflected by the exterior surface. The system further includes a computing device in operable communication with the data acquisition device, the computing device configured for calculating at least one characteristic of the detected structured light.
These and other features, aspects and advantages of the present invention will become better understood with reference to the following description and appended claims. The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.
A full and enabling disclosure of the present invention, including the best mode thereof, directed to one of ordinary skill in the art, is set forth in the specification, which makes reference to the appended figures, in which:
Reference now will be made in detail to embodiments of the invention, one or more examples of which are illustrated in the drawings. Each example is provided by way of explanation of the invention, not limitation of the invention. In fact, it will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the scope or spirit of the invention. For instance, features illustrated or described as part of one embodiment can be used with another embodiment to yield a still further embodiment. Thus, it is intended that the present invention covers such modifications and variations as come within the scope of the appended claims and their equivalents.
Referring now to
The casing 120 may include defined therein one or more access ports 126 (see also
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Data acquisition device 140 may be a component of a system 150 (see also
Computing device 152 may include one or more processor(s) and associated memory device(s) configured to perform a variety of computer-implemented functions. As used herein, the term “processor” refers not only to integrated circuits referred to in the art as being included in a computer, but also refers to a controller, a microcontroller, a microcomputer, a programmable logic controller (PLC), an application specific integrated circuit, and other programmable circuits. Additionally, the memory device(s) may generally comprise memory element(s) including, but not limited to, computer readable medium (e.g., random access memory (RAM)), computer readable non-volatile medium (e.g., a flash memory), a floppy disk, a compact disc-read only memory (CD-ROM), a magneto-optical disk (MOD), a digital versatile disc (DVD) and/or other suitable memory elements. Such memory device(s) may generally be configured to store suitable computer-readable instructions that, when implemented by the processor(s), configure the computing device 152 to perform various functions as discussed herein.
Notably, analysis of a component (such as a rotor blade 112, 116 or other suitable component as discussed herein) by a system 150 may, in some embodiments, be performed when the component is in situ. A component is in situ when it disposed within an assembly, such as a turbomachine, such as within a section 102, 104, 106 of the gas turbine 100. Notably, in some embodiments the entire casing 120 may surround the component 10 when such in situ analysis is occurring. In these embodiments, analysis may occur via extension of a portion of the system 150 (and data acquisition device 140 thereof) through a port 126 and/or via at least a portion of the system 150 (and data acquisition device 140 thereof) being disposed within the turbomachine. In other embodiments, a portion of the casing 120, such as the first shell 122 or second shell 124, may be removed. Alternatively, the component may be removed from the assembly, such as the turbomachine, for analysis, and may for example be positioned in a measurement jig for analysis.
A component 10 (and more specifically the substrate of the overall component 10) can comprise a variety of types of components used in a variety of different applications, such as, for example, components utilized in high temperature applications (e.g., components comprising nickel or cobalt based superalloys). In some embodiments, the component 10 may comprise an industrial gas turbine or steam turbine component such as a combustion component or hot gas path component. In some embodiments, the component 10 may comprise a turbine blade, compressor blade, vane, nozzle, shroud, rotor, transition piece or casing. In other embodiments, the component 10 may comprise any other component of a turbine such as any other component for a gas turbine, steam turbine or the like. In some embodiments, the component may comprise a non-turbine component including, but not limited to, automotive components (e.g., cars, trucks, etc.), aerospace components (e.g., airplanes, helicopters, space shuttles, aluminum parts, etc.), locomotive or rail components (e.g., trains, train tracks, etc.), structural, infrastructure or civil engineering components (e.g., bridges, buildings, construction equipment, etc.), and/or power plant or chemical processing components (e.g., pipes used in high temperature applications). As shown, the component 10 has an exterior surface 11.
As discussed, data acquisition device 140 includes a structured light emitter 142 and a detector 144. The emitter 142 generally emits structured light 146 therefrom. As is generally understood, structured light is light emitted in a predetermined pattern and projected onto a target surface in this pattern. The structured light 146 may, for example, be projected onto one or more predetermined locations (or regions) 148 on the exterior surface 11 of the component 10.
A predetermined location 148 on the exterior surface 11 may, for example, be a location at which monitoring is desired. For example, as discussed above, the component 10 may be a blade, vane, nozzle, shroud, rotor, transition piece or casing. In such embodiments, the predetermined location may be a location known to experience various forces during turbomachine operation such as on or proximate airfoils, platforms, tips or any other suitable location. Moreover, a predetermined location may be a location known to experience elevated temperatures. For example, a predetermined location may be in a hot gas path and/or on a combustion component 10.
The structured light 146 projected onto the exterior surface 11 and in the predetermined location 148 may include one or more structured light fiducials 20. The fiducials 20 can be utilized to measure one or more characteristics of the structured light that is projected onto the exterior surface 11 and in the predetermined location, as discussed herein. For example, in some embodiments, a characteristic may be a distance 22 between two fiducials 20. Fiducials 20 may, for example, be projected on the exterior surface 11 at a variety of distances and in a variety of locations with a predetermined location. Additionally or alternatively, a characteristic may be a shape of a fiducial 20 or plurality of fiducials 20. Measurement of a shape may include, for example measurement of an area of the shape or various dimensions of the shape such as a length, width, etc. As should be appreciated to those skilled in the art, these measurements can help determine the amount of strain, strain rate, creep, fatigue, stress, etc. at the region of the predetermined location of the component 10.
The structured light that is emitted from emitter 142 may be reflected by the exterior surface 11 of the component 10. Detector 144 may detect the structured light after the structured light is reflected by the exterior surface 11. Data received by the detector 144 may then be transmitted to the computing device 152 for analysis thereof.
Any suitable light may be utilized as structured light in accordance with the present disclosure. For example, in some embodiments, the structured light may be laser light. Data acquisition device 140 may, for example, be a laser scanner. Laser scanners generally include lasers (one embodiment of an emitter 142) which emit light in the form of laser beams towards objects, such as in these embodiments components 10 generally. The light is then detected by a sensor (one embodiment of a detector 144) of the device 140. For example, in some embodiments, the light is then reflected off of surfaces which it contacts, and received by a sensor of the device 140. The round-trip time for the light to reach the sensor is utilized to determine measurements along the various axes. These devices are typically known as time-of-flight devices. In other embodiments, the sensor detects the light on the surface which it contacts, and determines measurements based on the relative location of the light in the field-of-view of the sensor. These devices are typically known as triangulation devices.
In other embodiments, the structured light may be blue light or white light. Data acquisition device 140 may, for example, be a structured light scanner. Structured light scanners generally emit light from included light-emitting diodes or other suitable light generating apparatus (embodiments of an emitter 142). In exemplary embodiments, the emitted light utilized by a structured light scanner is blue light or white light. In general, the emitted light is projected onto the component 10 generally in a particular pattern as discussed above. When the light contacts the exterior surface 11, the surface contour distorts the light. A digital representation of this distortion is captured in an image taken by a camera (one embodiment of a detector 144).
In some embodiments, data acquisition device 140 may be configured for detecting the structured light repeatedly at a predetermined interval. Detection at a predetermined interval may, for example, occur when the component 10 is in situ during monitoring thereof, such as when monitoring of the component 10 is occurring during operation of the associated assembly and thus rotation of the component 10. For example, in exemplary embodiments, the predetermined interval may correspond to (and thus be equal or approximately equal to) the rotational frequency of the component 10. This causes the detection to occur when the component 10 is in an identical or approximately identical position at each interval. In some embodiments, the rotational frequency may be between 3000 revolutions per minute and 5000 revolutions per minute, such as between 3500 revolutions per minute and 4500 revolutions per minute.
As discussed, system 150 may include a computing device 152 which is in communication with the data acquisition device 140. Data received by the data acquisition device 140 due to detection of reflected structure light by the data acquisition device 140 (such as images, laser data, etc.) may be communicated to the computing device 152 for analysis thereby. For example, the computing device 152 may be configured for calculating one or more characteristics of the detected structured light. As discussed, a characteristic may be a distance 22 between a first structured light fiducial 20 and a second structured light fiducial 20, or may be a shape of a structured light fiducial 20, or may be another suitable characteristic that may be utilized for deformation analysis.
Further, as discussed, analysis of a component 10 may occur at different times, such as at a first and second time (which may in some embodiments be the times of separate analyses that occur at a predetermined interval as discussed). Data based on the detected structured light at each time may be transmitted to the computing device 152. The computing device may, after calculating one or more characteristics of the detected structured light at each time, compare like characteristics from each time to determine if deformation within the analyzed predetermined location has occurred. Specifically, as illustrated in
Referring now to
A method 200 may further include, for example, the step 220 of detecting the structured light 146 after the light 146 is reflected by the exterior surface 11, as discussed herein. In some embodiments, the steps 210, 220 may be performed with the component 10 in situ, as discussed herein. Alternatively, the steps 210, 220 may be performed with the component 10 ex situ, and thus for example, removed from an associated assembly, as discussed herein.
Further, in some embodiments when the steps 210, 220 are performed in situ, the steps 210, 220 may be performed during rotation of the component 10 as discussed herein. For example, the step 220 (and, optionally the step 210) may be performed repeatedly at a predetermined interval, as discussed herein.
A method 200 may further include, for example, the step 230 of calculating at least one characteristic of the detected structured light 146, as discussed herein.
Further, method 200 may include the step of comparing like characteristics calculated at different times, such as at a first and second time, as discussed herein. Such comparison may be utilized to determine if deformation has occurred.
Use of systems 150 and methods 200 in accordance with the present disclosure allows for non-contact deformation monitoring, which can reduce the labor and cost associated with deformation monitoring. Further, use of systems 150 and methods 200 in accordance with the present disclosure allows for such monitoring to be performed in situ and, in some embodiments, during rotation of the components 10. A particular feature of monitoring during rotation is that both plastic and elastic deformation can be analyzed and monitored, thus facilitating improved life cycle monitoring and other such monitoring of the components 10.
This written description uses examples to disclose the invention, including the best mode, and also to enable any person skilled in the art to practice the invention, including making and using any devices or systems and performing any incorporated methods. The patentable scope of the invention is defined by the claims, and may include other examples that occur to those skilled in the art. Such other examples are intended to be within the scope of the claims if they include structural elements that do not differ from the literal language of the claims, or if they include equivalent structural elements with insubstantial differences from the literal languages of the claims.