Information
-
Patent Grant
-
6472806
-
Patent Number
6,472,806
-
Date Filed
Thursday, December 16, 199925 years ago
-
Date Issued
Tuesday, October 29, 200222 years ago
-
Inventors
-
Original Assignees
-
Examiners
- Patel; Nimeshkumar D.
- Roy; Sikha
Agents
- Leydig, Voit & Mayer, Ltd.
-
CPC
-
US Classifications
Field of Search
US
- 313 402
- 313 403
- 313 407
- 313 408
- 313 409
- 313 348
- 313 269
-
International Classifications
-
Abstract
A tensioned shadow mask for a cathode ray tube (CRT), including: a series of parallel strips separated by slits having a predetermined interval; a plurality of tie bars interconnecting adjacent strips to define a plurality of slits at predetermined intervals; and a plurality of dummy bridges disposed between adjacent tie bars, extending from one of the strips to the other but not interconnecting the adjacent strips, wherein a length of the dummy bridges is greater than a length of the tie bars in the longitudinal direction of the strips.
Description
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a cathode ray tube (CRT), and more particularly, to a tensioned shadow mask with a color selection function.
2. Description of the Related Art
CRTs for television and computer displays employ a faceplate having on the inner side thereof a phosphor screen with a predetermined pattern, a mask and frame assembly which is an assembly of a shadow mask (hereinafter, simply referred to as a mask) and a frame, and is installed on the inner side of the faceplate, a funnel connected to the faceplate, which has a neck portion and a cone portion, and an electron gun inserted in the neck portion of the funnel, for emitting electron beams through apertures of the mask to excite the phosphor screen, and a deflection yoke installed around the cone portion of the funnel, for deflecting electron beams from the electron gun.
In a CRT having the above configuration, the mask for accurate landing of three electron beams emitted from the electron gun on each phosphor layer of the phosphor screen includes; a dot mask with substantially circular apertures a slot mask with parallel elongated apertures, and a tensioned mask to which tension is applied from opposite sides thereof, and having a series of parallel stripes separated by slits through which electron beams pass.
FIG. 1
shows an example of a tensioned mask. As shown in
FIG. 1
, the tensioned mask includes a plurality of strips
22
separated by slits
21
having a predetermined interval, and a plurality of tie bars
33
which interconnect the adjacent strips. The tensioned mask is supported in tension by a frame (not shown) of the tensioned mask.
In the mask, the tie bars
23
which interconnect the adjacent strips
22
can reduce a howling phenomenon, which occurs due to mask vibration from external impact, and unacceptable Poisson's contraction. However, if the vertical pitch of the tie bars
23
is too large, that is, if the vertical pitch (PV) of the tie bars
23
is twice or more the horizontal pitch (PH) thereof, a reflection image of the tie bars
23
is shown on the screen, which is unpleasant to viewers.
To avoid this problem, U.S. Pat. No. 4,926,089 discloses a tensioned mask as shown FIG.
2
. As shown
FIG. 2
, the tensioned mask includes a plurality of strips
31
separated by slits
32
having a predetermined interval, and tie bars
33
which interconnect the adjacent strips
31
. Also, dummy bridges
34
, which extend partially between but not interconnecting adjacent strips, are disposed between the adjacent tie bars
34
and separate each slit
32
into sub-slits having a predetermined interval.
In the tensioned mask, due to a technical problem in mask pattern formation, the width W
1
of the dummy bridges
34
is smaller than the width W
2
of the tie bars
33
. Thus, the reflection images by the dummy bridges
34
and the tie bars
33
have a slight difference in intensity of light. This difference raises the problem of tie bar visibility, thus deteriorating display image and making viewing unpleasant.
SUMMARY OF THE INVENTION
To solve the above problems, an object of the present is to provide a tensioned shadow mask for a cathode ray tube (CRT), capable of eliminating the problem of tie bar visibility while enhancing display image visibility.
In one embodiment of the present invention, there are provided a tensioned shadow mask for a CRT, comprising: a series of parallel strips separated by slits having a predetermined interval; a plurality of tie bars interconnecting adjacent strips to define a plurality of slits at predetermined intervals; and a plurality of dummy bridges disposed between adjacent tie bars, extending from one of the strips to the other but not interconnecting the adjacent strips, wherein the dummy bridges are longer than the tie bars in the longitudinal direction of the strips.
In the tensioned shadow mask according to the present invention, the area of the dummy bridges is equal to that of the tie bars, or the area difference between the dummy bridges and the tie bars is in a predetermined range. The dummy bridges may extend from a strip to the next strip but not intersecting the adjacent strips, or the dummy bridges may alternately extend from the adjacent strips such that a first dummy bridge extends from one of the adjacent strips and the next dummy bridge extends from the other of the adjacent strips.
BRIEF DESCRIPTION OF THE DRAWING
The above object and advantages of the present invention will become more apparent by describing in detail preferred embodiments thereof with reference to the attached drawings in which:
FIG. 1
is a plan view of a conventional tensioned mask for a color cathode ray tube (CRT);
FIG. 2
is a partial enlarged view of the conventional tensioned mask, illustrating an aperture configuration thereof;
FIG. 3
is an exploded perspective view illustrating a state where a tensioned mask for a CRT according to the present invention is secured to a frame;
FIG. 4
is a partial enlarged view of the tensioned mask of
FIG. 3
, illustrating an aperture configuration thereof;
FIG. 5
is a partial enlarged plan views illustrating examples of the tensioned mask according to the present invention; and
FIGS. 6 through 15
are photos illustrating the visibility of tie bars reflected on a phosphor screen with respect to the area difference between the tie bars and dummy bridges of tensioned masks.
DESCRIPTION OF THE PREFERRED EMBODIMENTS
Referring to
FIGS. 3 and 4
, a tensioned mask and frame assembly includes a tensioned mask
40
and a frame
50
for supporting the tensioned mask
40
in tension. In the tension mask
40
, which is formed of a 50-100 μm-thick foil, a series of strips
41
each having a width W
1
of 190 μm are separated by slits
42
having a width of 60 μm. The slits
42
are separated by tie bars
43
which interconnect adjacent strips
41
′ and
41
″. The tie bars
43
are arranged in a staggered fashion in the transverse direction of the tensioned mask
40
. Also, a plurality of dummy bridges
44
, by which each slit
42
is separated into sub-slits having a predetermined interval, are disposed between the tie bars
43
, wherein the dummy bridges
44
extend from one of the adjacent strips
41
′ and
41
″ to the other but not interconnecting the adjacent strips
41
′ and
41
″.
FIG. 5
shows another tensioned mask having the strips with dummy bridges arranged in a different manner from that of FIG.
3
. As shown in
FIG. 5
, dummy bridges
45
alternately extend from one of the adjacent strips
41
′ and
41
″ such that a first dummy bridge extends from one of the adjacent strips
41
′ and
41
″ and the next dummy bridge extends from the other of the adjacent strips
41
′ and
41
″.
In the above embodiments, the length L
1
of the dummy bridges
44
and
45
is larger than the length L
2
of the tie bars
43
, and the width W
4
of the dummy bridges
44
or
45
is smaller than the width W
5
of the tie bars
43
. However, the area A
1
(=L
1
×W
4
) of the dummy bridges
44
is equal to the area A
2
(=L
2
×W
5
) of the tie bars
43
, or the area difference between the dummy bridges
44
and the tie bars
43
is in a predetermined range. The area of the dummy bridges
44
or
45
may differ from that of the tie bars
43
. However, it is preferable that the area of the dummy bridges
44
or
45
is equal to that of the tie bars
43
, so that the tie bars will not visibly stand out. Also, the area of the dummy bridges
44
or
45
may be smaller or larger than that of the tie bars
43
, as long as the area difference is in the range of 30 percent, which is expressed by |(A
1
−A
2
)|/A
2
≦0.3.
Also, as shown in
FIG. 3
, the frame
50
of the tensioned mask and frame assembly comprises a pair of supports
51
and
52
spaced a predetermined distance, for supporting the longer side edges of the tensioned mask
40
, and a pair of elastic members
53
and
54
for applying tension to the tension mask
40
, wherein both ends of the elastic members
53
and
54
are fixed to the supports
51
and
52
. The frame configuration is not limited to the above configuration, and any configuration capable of acting tension on the tensioned mask can be adopted.
The tensioned mask is installed at the inner side of the faceplate, at a predetermined distance from the phosphor screen, being supported by the frame, provides a color selection function for accurate passage through the slits
42
and landing on the phosphor screen of the electron beams emitted from the electron gun.
The electron beams may be shielded by the tie bars
43
which define the slits
42
at predetermined intervals, or by the dummy bridges
44
or
45
, which hinders complete excitation of the phosphor screen, thus resulting in a reflection image on the screen. However, the length L
2
of the tie bars
43
is larger than the length L
1
of the dummy bridges
44
or
45
, and the area of the tie bars
43
is nearly equal to that of the dummy bridges
44
or
45
, so that the reflection image area due to the tie bars
43
, which corresponds to a nonexcited region of the phosphor screen, is nearly the same as that due to the dummy bridges
44
or
45
. As a result, a real image and a reflection image are uniformly distributed over the screen, so that viewers scarcely perceive the reflection image, thereby improving appearance uniformity. The reflection image distribution can be controlled by varying the number of tie bars
43
and dummy bridges
44
or
45
.
The tensioned mask of a CRT according to the present invention, having the above structure, is characterized in that the area of the dummy bridges is equal or similar to that of the tie bars, so that a decrease in resolution due to the reflection image of the tie bars can be avoided with an improved appearance uniformity.
The following embodiments are provided so that this disclosure will be thorough and complete.
EXPERIMENTAL EXAMPLE 1
The appearance uniformity with respect to the area difference between the tie bars and the dummy bridges was observed by varying the length of the dummy bridges relative to the length of the tie bars in a tensioned mask of a CRT for monitors. The result is shown in Table 1.
TABLE 1
|
|
Tie bar
Dummy bridge
|
Length
Width
Area
Length
Width
Area
Area
Appearance
|
Sample
(μm)
(μm)
(μm
2
)
(μm)
(μm)
(μm
2
)
ratio (%)
Uniformity
|
|
1
60
60
3,600
60
30
1,800
50
poor
|
2
60
60
3,600
90
30
1,800
75
moderate
|
3
60
60
3,600
120
30
1,800
100
good
|
4
60
60
3,600
150
30
1,800
125
moderate
|
|
As can be noted from Table 1, the appearance uniformity is acceptable when the area of the tie bars is in a range greater than 70% and less than 130% of the area of the tie bars.
FIGS. 6 through 11
are photos illustrating the visibility of tie bars reflected on the phosphor screen, with respect to the area difference between the tie bars and dummy bridges of tensioned masks shown in Table 1. In particular,
FIG. 7
is a macro photo in a case when the area of the dummy bridges is 50% of that of the tie bars (Sample 1 of Table 1), and
FIG. 6
is a 20×-magnified photo of FIG.
7
. As shown in
FIGS. 6 and 7
, distinct tie bar shadows appear on the phosphor screen.
FIG. 9
is a macro photo showing the tie bar visibility on the phosphor screen when the area of the dummy bridges is 75% of that of the tie bar (Sample 2 of Table 1), and
FIG. 8
is a 20×-magnified photo of FIG.
9
. As shown in
FIG. 8
, the sizes of the reflection image by the tie bars and the dummy bridges appear to be equal to each other, showing a slight difference in intensity of light therebetween. Also, as shown in
FIG. 9
, it is difficult to distinguish the tie bar shadows on the phosphor screen from the dummy bridges shadows thereon.
FIG. 11
is a macro photo showing the tie bar visibility on the phosphor screen when there is no difference in area between the tie bars and the dummy bridges (Sample 3 of Table 1), and
FIG. 10
is a 20×-magnified photo of FIG.
11
. In
FIG. 10
, the dummy bridges that are enlarged in the longitudinal direction so as to make the area of the dummy bridges equal to that of the tie bars are visible. As shown in
FIG. 11
, it is difficult to distinguish the tie bar shadows from the dummy bridges shadows, and the reflection images of the tie bars and dummy bridges show uniform intensity of light.
Although photos of the Sample 4 in Table 1, in which the area of the dummy bridges is 125% of that of the tie bars, were not taken, the size of the reflection image of the dummy bridges on the phosphor screen was large whereas that of the tie bars was small, compared to the Sample 3. Furthermore, the reflection image of the tie bars were shown as white dots on the screen.
EXPERIMENTAL EXAMPLE 2
The appearance uniformity with respect to the area difference between the tie bars and the dummy bridges was observed by varying the length of the dummy bridges relative to the length of the tie bars in a tensioned mask of a CRT for a television. The result is shown in Table 2.
TABLE 2
|
|
Tie bar
Dummy bridge
|
Length
Width
Area
Length
Width
Area
Area
Appearance
|
Sample
(μm)
(μm)
(μm
2
)
(μm)
(μm)
(μm
2
)
ratio (%)
Uniformity
|
|
1
80
195
15,600
80
145
8,700
55
poor
|
2
80
195
15,600
80
145
11,600
74
moderate
|
3
80
195
15,600
108
145
15,660
100.3
good
|
4
80
195
15,600
140
145
20,300
130.1
moderate
|
|
As can be understood from Table 2, the appearance uniformity is acceptable when the area difference between the tie bars and dummy bridges is in the range of 30%.
FIGS. 12 through 15
are photos illustrating the visibility of tie bars reflected on the phosphor screen, with respect to the area difference between the tie bars and dummy bridges of tensioned masks shown in Table 2. In particular,
FIG. 13
is a macro photo in a case when the area of the dummy bridges is 55% of that of the tie bars (Sample 1 of Table 2), and
FIG. 12
is a 10×-magnified photo of FIG.
13
. As shown in
FIGS. 12 and 13
, although the resolution is poor, due to the large horizontal pitches of the phosphor pattern and the slits of the tensioned mask for a television, compared to those for monitors (Experimental Example 1), distinct tie bar shadows appear on the screen.
FIG. 15
is a macro photo showing the tie bar visibility on the phosphor screen when the area of the dummy bridges is 74% of that of the tie bars (Sample 2 of Table 2), and
FIG. 14
is a 10×-magnified photo of FIG.
15
. In
FIG. 14
, the dummy bridges that are enlarged in the longitudinal direction so as to make the area of the dummy bridges equal to that of the tie bars are distinct. As shown in
FIG. 15
, the reflection images of the tie bars and dummy tie bars have uniform intensity of light, so that it is difficult to distinguish the reflection image of the tie bars from that of the dummy tie bars, thus improving the appearance uniformity.
Although photos of the Sample 4 in Table 2, in which the area of the dummy bridges is 130% or more larger than that of the tie bars, were not taken, the size of the reflection image of the dummy bridges on the phosphor screen was large whereas that of the tie bars was small, compared to the samples described with reference to photos. Furthermore, the reflection image of the tie bars was shown as which dots the screen.
While the present invention has been illustrated and described with reference to specific embodiments, further modifications and alterations within the spirit and scope of this invention as defined by the appended claims will become evident to those skilled in the art.
Claims
- 1. A tensioned shadow mask for a cathode ray tube (CRT), comprising:a series of parallel strips extending alone a longitudinal direction of the shadow mask and separated by respective longitudinal slits spaced from each other at an interval; a plurality of tie bars, each tie bar interconnecting, along the longitudinal direction, two of the slits and, along a transverse direction, interconnecting adjacent strips; and a plurality of dummy bridges, disposed between adjacent tie bars, extending from respective strips transversely into the slits toward, but not interconnecting, an adjacent strip, wherein the dummy bridges are longer than the tie bars along the longitudinal direction of the shadow mask.
- 2. The tensioned shadow mask of claim 1, wherein each of the dummy bridges and the tie bars have respective areas, and the area of each dummy bridge is in a range greater than 70% and less than 130% of the area of each tie bar.
- 3. The tensioned shadow mask of claim 1, wherein the dummy bridges alternately extend from the adjacent strips such that a first dummy bridge extends from one of the strips into a slit in a first transverse direction and the dummy bridge of the adjacent slit in the longitudinal direction extends from an adjacent strip into the slit in a second transverse direction opposite the first transverse direction.
Priority Claims (1)
Number |
Date |
Country |
Kind |
99-25812 |
Jun 1999 |
KR |
|
US Referenced Citations (7)
Foreign Referenced Citations (3)
Number |
Date |
Country |
487106 |
May 1992 |
EP |
57-065650 |
Apr 1982 |
JP |
58225538 |
Dec 1983 |
JP |