Tensioned shadow mask for cathode ray tube including tie bars having dummy bridges

Information

  • Patent Grant
  • 6472806
  • Patent Number
    6,472,806
  • Date Filed
    Thursday, December 16, 1999
    25 years ago
  • Date Issued
    Tuesday, October 29, 2002
    22 years ago
Abstract
A tensioned shadow mask for a cathode ray tube (CRT), including: a series of parallel strips separated by slits having a predetermined interval; a plurality of tie bars interconnecting adjacent strips to define a plurality of slits at predetermined intervals; and a plurality of dummy bridges disposed between adjacent tie bars, extending from one of the strips to the other but not interconnecting the adjacent strips, wherein a length of the dummy bridges is greater than a length of the tie bars in the longitudinal direction of the strips.
Description




BACKGROUND OF THE INVENTION




1. Field of the Invention




The present invention relates to a cathode ray tube (CRT), and more particularly, to a tensioned shadow mask with a color selection function.




2. Description of the Related Art




CRTs for television and computer displays employ a faceplate having on the inner side thereof a phosphor screen with a predetermined pattern, a mask and frame assembly which is an assembly of a shadow mask (hereinafter, simply referred to as a mask) and a frame, and is installed on the inner side of the faceplate, a funnel connected to the faceplate, which has a neck portion and a cone portion, and an electron gun inserted in the neck portion of the funnel, for emitting electron beams through apertures of the mask to excite the phosphor screen, and a deflection yoke installed around the cone portion of the funnel, for deflecting electron beams from the electron gun.




In a CRT having the above configuration, the mask for accurate landing of three electron beams emitted from the electron gun on each phosphor layer of the phosphor screen includes; a dot mask with substantially circular apertures a slot mask with parallel elongated apertures, and a tensioned mask to which tension is applied from opposite sides thereof, and having a series of parallel stripes separated by slits through which electron beams pass.





FIG. 1

shows an example of a tensioned mask. As shown in

FIG. 1

, the tensioned mask includes a plurality of strips


22


separated by slits


21


having a predetermined interval, and a plurality of tie bars


33


which interconnect the adjacent strips. The tensioned mask is supported in tension by a frame (not shown) of the tensioned mask.




In the mask, the tie bars


23


which interconnect the adjacent strips


22


can reduce a howling phenomenon, which occurs due to mask vibration from external impact, and unacceptable Poisson's contraction. However, if the vertical pitch of the tie bars


23


is too large, that is, if the vertical pitch (PV) of the tie bars


23


is twice or more the horizontal pitch (PH) thereof, a reflection image of the tie bars


23


is shown on the screen, which is unpleasant to viewers.




To avoid this problem, U.S. Pat. No. 4,926,089 discloses a tensioned mask as shown FIG.


2


. As shown

FIG. 2

, the tensioned mask includes a plurality of strips


31


separated by slits


32


having a predetermined interval, and tie bars


33


which interconnect the adjacent strips


31


. Also, dummy bridges


34


, which extend partially between but not interconnecting adjacent strips, are disposed between the adjacent tie bars


34


and separate each slit


32


into sub-slits having a predetermined interval.




In the tensioned mask, due to a technical problem in mask pattern formation, the width W


1


of the dummy bridges


34


is smaller than the width W


2


of the tie bars


33


. Thus, the reflection images by the dummy bridges


34


and the tie bars


33


have a slight difference in intensity of light. This difference raises the problem of tie bar visibility, thus deteriorating display image and making viewing unpleasant.




SUMMARY OF THE INVENTION




To solve the above problems, an object of the present is to provide a tensioned shadow mask for a cathode ray tube (CRT), capable of eliminating the problem of tie bar visibility while enhancing display image visibility.




In one embodiment of the present invention, there are provided a tensioned shadow mask for a CRT, comprising: a series of parallel strips separated by slits having a predetermined interval; a plurality of tie bars interconnecting adjacent strips to define a plurality of slits at predetermined intervals; and a plurality of dummy bridges disposed between adjacent tie bars, extending from one of the strips to the other but not interconnecting the adjacent strips, wherein the dummy bridges are longer than the tie bars in the longitudinal direction of the strips.




In the tensioned shadow mask according to the present invention, the area of the dummy bridges is equal to that of the tie bars, or the area difference between the dummy bridges and the tie bars is in a predetermined range. The dummy bridges may extend from a strip to the next strip but not intersecting the adjacent strips, or the dummy bridges may alternately extend from the adjacent strips such that a first dummy bridge extends from one of the adjacent strips and the next dummy bridge extends from the other of the adjacent strips.











BRIEF DESCRIPTION OF THE DRAWING




The above object and advantages of the present invention will become more apparent by describing in detail preferred embodiments thereof with reference to the attached drawings in which:





FIG. 1

is a plan view of a conventional tensioned mask for a color cathode ray tube (CRT);





FIG. 2

is a partial enlarged view of the conventional tensioned mask, illustrating an aperture configuration thereof;





FIG. 3

is an exploded perspective view illustrating a state where a tensioned mask for a CRT according to the present invention is secured to a frame;





FIG. 4

is a partial enlarged view of the tensioned mask of

FIG. 3

, illustrating an aperture configuration thereof;





FIG. 5

is a partial enlarged plan views illustrating examples of the tensioned mask according to the present invention; and





FIGS. 6 through 15

are photos illustrating the visibility of tie bars reflected on a phosphor screen with respect to the area difference between the tie bars and dummy bridges of tensioned masks.











DESCRIPTION OF THE PREFERRED EMBODIMENTS




Referring to

FIGS. 3 and 4

, a tensioned mask and frame assembly includes a tensioned mask


40


and a frame


50


for supporting the tensioned mask


40


in tension. In the tension mask


40


, which is formed of a 50-100 μm-thick foil, a series of strips


41


each having a width W


1


of 190 μm are separated by slits


42


having a width of 60 μm. The slits


42


are separated by tie bars


43


which interconnect adjacent strips


41


′ and


41


″. The tie bars


43


are arranged in a staggered fashion in the transverse direction of the tensioned mask


40


. Also, a plurality of dummy bridges


44


, by which each slit


42


is separated into sub-slits having a predetermined interval, are disposed between the tie bars


43


, wherein the dummy bridges


44


extend from one of the adjacent strips


41


′ and


41


″ to the other but not interconnecting the adjacent strips


41


′ and


41


″.





FIG. 5

shows another tensioned mask having the strips with dummy bridges arranged in a different manner from that of FIG.


3


. As shown in

FIG. 5

, dummy bridges


45


alternately extend from one of the adjacent strips


41


′ and


41


″ such that a first dummy bridge extends from one of the adjacent strips


41


′ and


41


″ and the next dummy bridge extends from the other of the adjacent strips


41


′ and


41


″.




In the above embodiments, the length L


1


of the dummy bridges


44


and


45


is larger than the length L


2


of the tie bars


43


, and the width W


4


of the dummy bridges


44


or


45


is smaller than the width W


5


of the tie bars


43


. However, the area A


1


(=L


1


×W


4


) of the dummy bridges


44


is equal to the area A


2


(=L


2


×W


5


) of the tie bars


43


, or the area difference between the dummy bridges


44


and the tie bars


43


is in a predetermined range. The area of the dummy bridges


44


or


45


may differ from that of the tie bars


43


. However, it is preferable that the area of the dummy bridges


44


or


45


is equal to that of the tie bars


43


, so that the tie bars will not visibly stand out. Also, the area of the dummy bridges


44


or


45


may be smaller or larger than that of the tie bars


43


, as long as the area difference is in the range of 30 percent, which is expressed by |(A


1


−A


2


)|/A


2


≦0.3.




Also, as shown in

FIG. 3

, the frame


50


of the tensioned mask and frame assembly comprises a pair of supports


51


and


52


spaced a predetermined distance, for supporting the longer side edges of the tensioned mask


40


, and a pair of elastic members


53


and


54


for applying tension to the tension mask


40


, wherein both ends of the elastic members


53


and


54


are fixed to the supports


51


and


52


. The frame configuration is not limited to the above configuration, and any configuration capable of acting tension on the tensioned mask can be adopted.




The tensioned mask is installed at the inner side of the faceplate, at a predetermined distance from the phosphor screen, being supported by the frame, provides a color selection function for accurate passage through the slits


42


and landing on the phosphor screen of the electron beams emitted from the electron gun.




The electron beams may be shielded by the tie bars


43


which define the slits


42


at predetermined intervals, or by the dummy bridges


44


or


45


, which hinders complete excitation of the phosphor screen, thus resulting in a reflection image on the screen. However, the length L


2


of the tie bars


43


is larger than the length L


1


of the dummy bridges


44


or


45


, and the area of the tie bars


43


is nearly equal to that of the dummy bridges


44


or


45


, so that the reflection image area due to the tie bars


43


, which corresponds to a nonexcited region of the phosphor screen, is nearly the same as that due to the dummy bridges


44


or


45


. As a result, a real image and a reflection image are uniformly distributed over the screen, so that viewers scarcely perceive the reflection image, thereby improving appearance uniformity. The reflection image distribution can be controlled by varying the number of tie bars


43


and dummy bridges


44


or


45


.




The tensioned mask of a CRT according to the present invention, having the above structure, is characterized in that the area of the dummy bridges is equal or similar to that of the tie bars, so that a decrease in resolution due to the reflection image of the tie bars can be avoided with an improved appearance uniformity.




The following embodiments are provided so that this disclosure will be thorough and complete.




EXPERIMENTAL EXAMPLE 1




The appearance uniformity with respect to the area difference between the tie bars and the dummy bridges was observed by varying the length of the dummy bridges relative to the length of the tie bars in a tensioned mask of a CRT for monitors. The result is shown in Table 1.
















TABLE 1













Tie bar




Dummy bridge





















Length




Width




Area




Length




Width




Area




Area




Appearance






Sample




(μm)




(μm)




(μm


2


)




(μm)




(μm)




(μm


2


)




ratio (%)




Uniformity






















1




60




60




3,600




60




30




1,800




50




poor






2




60




60




3,600




90




30




1,800




75




moderate






3




60




60




3,600




120




30




1,800




100




good






4




60




60




3,600




150




30




1,800




125




moderate














As can be noted from Table 1, the appearance uniformity is acceptable when the area of the tie bars is in a range greater than 70% and less than 130% of the area of the tie bars.





FIGS. 6 through 11

are photos illustrating the visibility of tie bars reflected on the phosphor screen, with respect to the area difference between the tie bars and dummy bridges of tensioned masks shown in Table 1. In particular,

FIG. 7

is a macro photo in a case when the area of the dummy bridges is 50% of that of the tie bars (Sample 1 of Table 1), and

FIG. 6

is a 20×-magnified photo of FIG.


7


. As shown in

FIGS. 6 and 7

, distinct tie bar shadows appear on the phosphor screen.





FIG. 9

is a macro photo showing the tie bar visibility on the phosphor screen when the area of the dummy bridges is 75% of that of the tie bar (Sample 2 of Table 1), and

FIG. 8

is a 20×-magnified photo of FIG.


9


. As shown in

FIG. 8

, the sizes of the reflection image by the tie bars and the dummy bridges appear to be equal to each other, showing a slight difference in intensity of light therebetween. Also, as shown in

FIG. 9

, it is difficult to distinguish the tie bar shadows on the phosphor screen from the dummy bridges shadows thereon.





FIG. 11

is a macro photo showing the tie bar visibility on the phosphor screen when there is no difference in area between the tie bars and the dummy bridges (Sample 3 of Table 1), and

FIG. 10

is a 20×-magnified photo of FIG.


11


. In

FIG. 10

, the dummy bridges that are enlarged in the longitudinal direction so as to make the area of the dummy bridges equal to that of the tie bars are visible. As shown in

FIG. 11

, it is difficult to distinguish the tie bar shadows from the dummy bridges shadows, and the reflection images of the tie bars and dummy bridges show uniform intensity of light.




Although photos of the Sample 4 in Table 1, in which the area of the dummy bridges is 125% of that of the tie bars, were not taken, the size of the reflection image of the dummy bridges on the phosphor screen was large whereas that of the tie bars was small, compared to the Sample 3. Furthermore, the reflection image of the tie bars were shown as white dots on the screen.




EXPERIMENTAL EXAMPLE 2




The appearance uniformity with respect to the area difference between the tie bars and the dummy bridges was observed by varying the length of the dummy bridges relative to the length of the tie bars in a tensioned mask of a CRT for a television. The result is shown in Table 2.
















TABLE 2













Tie bar




Dummy bridge





















Length




Width




Area




Length




Width




Area




Area




Appearance






Sample




(μm)




(μm)




(μm


2


)




(μm)




(μm)




(μm


2


)




ratio (%)




Uniformity






















1




80




195




15,600




80




145




 8,700




55




poor






2




80




195




15,600




80




145




11,600




74




moderate






3




80




195




15,600




108




145




15,660




100.3




good






4




80




195




15,600




140




145




20,300




130.1




moderate














As can be understood from Table 2, the appearance uniformity is acceptable when the area difference between the tie bars and dummy bridges is in the range of 30%.





FIGS. 12 through 15

are photos illustrating the visibility of tie bars reflected on the phosphor screen, with respect to the area difference between the tie bars and dummy bridges of tensioned masks shown in Table 2. In particular,

FIG. 13

is a macro photo in a case when the area of the dummy bridges is 55% of that of the tie bars (Sample 1 of Table 2), and

FIG. 12

is a 10×-magnified photo of FIG.


13


. As shown in

FIGS. 12 and 13

, although the resolution is poor, due to the large horizontal pitches of the phosphor pattern and the slits of the tensioned mask for a television, compared to those for monitors (Experimental Example 1), distinct tie bar shadows appear on the screen.





FIG. 15

is a macro photo showing the tie bar visibility on the phosphor screen when the area of the dummy bridges is 74% of that of the tie bars (Sample 2 of Table 2), and

FIG. 14

is a 10×-magnified photo of FIG.


15


. In

FIG. 14

, the dummy bridges that are enlarged in the longitudinal direction so as to make the area of the dummy bridges equal to that of the tie bars are distinct. As shown in

FIG. 15

, the reflection images of the tie bars and dummy tie bars have uniform intensity of light, so that it is difficult to distinguish the reflection image of the tie bars from that of the dummy tie bars, thus improving the appearance uniformity.




Although photos of the Sample 4 in Table 2, in which the area of the dummy bridges is 130% or more larger than that of the tie bars, were not taken, the size of the reflection image of the dummy bridges on the phosphor screen was large whereas that of the tie bars was small, compared to the samples described with reference to photos. Furthermore, the reflection image of the tie bars was shown as which dots the screen.




While the present invention has been illustrated and described with reference to specific embodiments, further modifications and alterations within the spirit and scope of this invention as defined by the appended claims will become evident to those skilled in the art.



Claims
  • 1. A tensioned shadow mask for a cathode ray tube (CRT), comprising:a series of parallel strips extending alone a longitudinal direction of the shadow mask and separated by respective longitudinal slits spaced from each other at an interval; a plurality of tie bars, each tie bar interconnecting, along the longitudinal direction, two of the slits and, along a transverse direction, interconnecting adjacent strips; and a plurality of dummy bridges, disposed between adjacent tie bars, extending from respective strips transversely into the slits toward, but not interconnecting, an adjacent strip, wherein the dummy bridges are longer than the tie bars along the longitudinal direction of the shadow mask.
  • 2. The tensioned shadow mask of claim 1, wherein each of the dummy bridges and the tie bars have respective areas, and the area of each dummy bridge is in a range greater than 70% and less than 130% of the area of each tie bar.
  • 3. The tensioned shadow mask of claim 1, wherein the dummy bridges alternately extend from the adjacent strips such that a first dummy bridge extends from one of the strips into a slit in a first transverse direction and the dummy bridge of the adjacent slit in the longitudinal direction extends from an adjacent strip into the slit in a second transverse direction opposite the first transverse direction.
Priority Claims (1)
Number Date Country Kind
99-25812 Jun 1999 KR
US Referenced Citations (7)
Number Name Date Kind
3973965 Suzuki et al. Aug 1976 A
4296189 Kuzminski Oct 1981 A
4727280 Fujimura Feb 1988 A
4926089 Moore May 1990 A
4942332 Adler et al. Jul 1990 A
5583391 Good et al. Dec 1996 A
6242855 Caronna et al. Jun 2001 B1
Foreign Referenced Citations (3)
Number Date Country
487106 May 1992 EP
57-065650 Apr 1982 JP
58225538 Dec 1983 JP