Claims
- 1. An impedance matching network comprising an adjustable-length transmission line connected in parallel with an input-output driver circuit having an output, wherein the length of the adjustable-length transmission line can be manually adjusted to provide impedance matching at the output of the driver circuit.
- 2. The impedance matching network of claim 1 wherein the adjustable-length transmission line comprises two parallel conductive lines connected at one end to the driver circuit and a movable stub, the adjustable-length transmission line electrically shorted by the movable stub.
- 3. The impedance matching network of claim 2 further comprising a system card and a semiconductor chip located on the system card, the driver circuit located on the semiconductor chip and the parallel conductive lines comprise stripes of conductive material formed directly on the system card.
- 4. The impedance matching network of claim 2 further comprising a receiver circuit having a resistance and being connected to the output of the driver circuit.
- 5. The impedance matching network of claim 2 wherein the length of the adjustable-length transmission line is adapted to be adjusted to precisely set the distance between the point where the parallel conductive lines are shorted by the moveable stub and the point where the parallel conductive lines are connected to the driver circuit to provide impedance matching at the driver circuit output.
- 6. The impedance matching network of claim 5 wherein the length of the adjustable-length transmission line is adapted to be adjusted using a vernier.
- 7. An impedance matching system, comprising:
a system card; a semiconductor chip located on the system card; a driver circuit located on the semiconductor chip and having an output and a capacitance; a driver connection having an inductance; an impedance matching network located on the system card and connected in parallel to the driver circuit; a receiver circuit having a resistance and a capacitance; a receiver connection having an inductance; and a transmission line connected at one end to both the impedance matching network and, through the driver connection, to the output of the driver circuit and connected on the opposite end through the receiver connection to the receiver circuit, the transmission line having a characteristic impedance and a dielectric constant.
- 8. The impedance matching system of claim 7 wherein the adjustable-length transmission line is located off-chip from the driver circuit.
- 9. The impedance matching system of claim 7 wherein impedance matching is provided for a receiver circuit resistance between about 50 and 100 mega ohms.
- 10. The impedance matching system of claim 7 wherein impedance matching is provided for a receiver connection inductance between about 1 and 8 nH.
- 11. The impedance matching system of claim 7 wherein impedance matching is provided for a driver connection inductance between about 1 and 16 nH.
- 12. The impedance matching system of claim 7 wherein impedance matching is provided for a receiver circuit capacitance in the range between about 1 and 12 pF.
- 13. The impedance matching system of claim 7 wherein impedance matching is provided for a driver circuit capacitance between about 1 and 12 pF.
- 14. The impedance matching system of claim 7 wherein impedance matching is provided for a dielectric constant for the transmission line in the range between about 2 and 6.
- 15. The impedance matching system of claim 7 wherein impedance matching is provided for a length of the transmission line in the range between about 50 and 125 mm.
- 16. The impedance matching system of claim 7 wherein impedance matching is provided for a characteristic impedance of the transmission line in the range between about 20 and 200 ohms.
- 17. A process for reducing overshoots and undershoots on a driver circuit by impedance matching, comprising the steps of:
detecting overshoots and undershoots on the output of the driver circuit using electronic monitoring equipment; locating a movable stub which is connected across two parallel conductive lines a distance determined by the magnitude of overshoots and undershoots detected, the parallel conductive lines being connected in parallel to the driver circuit at one end thereby forming an adjustable- length transmission line comprising the parallel conductive lines and the movable stub; and repeating the first and second steps until the adjustable-length transmission line is adjusted to a length at which the impedance at the driver circuit is matched and overshoots and undershoots are reduced to an acceptable magnitude.
- 18. The process of claim 17 wherein the movable stub is initially positioned such that the adjustable-length transmission line is at its maximum length.
- 19. The process of claim 17 wherein the position of the movable stub is changed using a vernier device.
- 20. The process of claim 17 wherein the electronic monitoring equipment is connected to the output of the driver circuit throughout the adjustment of the adjustable-length transmission line and the first step and the second step are performed simultaneously.
- 21. An automatic impedance matching network providing impedance matching for a driver circuit located on a semiconductor chip on a system card and providing a voltage signal to a receiver circuit, the driver circuit having an output and the network comprising:
an adjustable-length transmission line located on the system card and connected in parallel with the driver circuit; a control circuit located on the system card and generating a control current varied in response to high and low transient voltages on the driver circuit output; and adjustment means located on the system card for adjusting the length of the adjustable-length transmission line proportionally to the control current generated by the control circuit.
- 22. The impedance matching network of claim 21 wherein the adjustable-length transmission line comprises two parallel conductive lines connected at one end to the driver circuit and a movable stub, the adjustable-length transmission line electrically shorted by the movable stub.
- 23. The impedance matching network of claim 22 wherein the adjustment means comprises:
an electromagnetic coil creating a force in a first direction proportional to the control current; a return spring creating a force in a second direction opposite to the first direction; and a magnetic core, attached to the moveable stub, having a position determined by the equilibrium of the force created by the electromagnetic coil and the force created by the return spring.
- 24. The impedance matching network of claim 21 wherein the control circuit comprises:
an n-bit counter; a source of internal power; a CONTROL CURRENT node; a quantity “n” N-type field effect transistors connected in parallel between the source of internal power and the CONTROL CURRENT node, said N-type field effect transistors having control gates connected to the n-bit counter; a positive detect circuitry incrementally increasing the n-bit counter when an overshoot occurs on the driver circuit output; and a negative detect circuitry incrementally increasing the n-bit counter when an undershoot occurs on the driver circuit output.
- 25. A process for reducing overshoots and undershoots on the output of a driver circuit by impedance matching, comprising the steps of:
detecting overshoots on the output of the driver circuit using a positive detect circuitry and transmitting an incremental pulse to a counter; detecting undershoots on the output of the driver circuit using a negative detect circuitry and transmitting an incremental pulse to a counter; transmitting an activation voltage to the control gates of a quantity of N-type field effect transistors connected in parallel between an internal power source and a CONTROL CURRENT node, wherein the quantity of N-type field effect transistors so activated is proportional to the count of the counter; transmitting a control current from the CONTROL CURRENT node to an electromagnetic adjustment means, wherein the control current is proportional to the quantity of the N-type field effect transistors that are activated; and moving a moveable stub which is connected across two parallel conductive lines a distance proportional to the magnitude of the control current, the parallel conductive lines being connected in parallel to the driver circuit at one end thereby forming an adjustable-length transmission line comprising the parallel conductive lines and the moveable stub, whereby the adjustable-length transmission line is adjusted to a length at which the impedances at the output of the driver circuit are matched and overshoots and undershoots are reduced.
- 26. An automatic, self-resetting control circuit for an impedance matching network that detects overshoots and undershoots on a driver circuit output and provides, to an adjustment mechanism for the impedance matching network having an adjustable-length transmission line, a control current whose magnitude is proportional to the magnitude of overshoots and undershoots on the output of the driver circuit, the control circuit comprising:
positive detect circuitry detecting overshoots on the output of the driver circuit and providing an incremental pulse; negative detect circuitry detecting undershoots on the output of the driver circuit and providing an incremental pulse; a counter receiving the incremental pulses from the positive detect circuitry and the negative detect circuitry, counting the incremental pulses, calculating a count, and providing an activation voltage; a source of power; a system ground; a CONTROL CURRENT node; a quantity of N-type field effect transistors connected in parallel and having control gates connected to and receiving the activation voltage from the counter, wherein the quantity of N-type field effect transistors being activated is equal to the count of the counter; the N-type transistors drawing current, through the CONTROL CURRENT node, to system ground, thereby providing a control current at the CONTROL CURRENT node for adjusting the adjustable-length transmission line for impedance matching; and a CLK down generator providing a down pulse to the counter to prevent over-adjustment of the adjustable-length transmission line.
- 27. The automatic, self-resetting control circuit of claim 26 wherein:
(a) the positive detect circuitry comprises:
a node PULSE having a low state and a higher voltage state, a pulse up transistor activated by an overshoot on the output of the driver circuit, the pulse up transistor switching the node PULSE from the low state to the higher voltage state, the magnitude of the higher voltage state being proportional to the magnitude of the transient overshoot at the output of the driver circuit, a node UPC1 having a low and a high state, an up interrogate transistor activated when the node PULSE switches from the low state to the higher voltage state, the up interrogate transistor switching the node UPC1 from the high to the low state, a voltage keeper holding node UPC1 high until activation of the up interrogate transistor, a reset delay loop delaying a reset signal for a length of time greater than the duration of a voltage transient at the driver circuit output, a pulse reset transistor resetting node PULSE to its original low state, a UPC1 reset transistor resetting node UPC1 to its original high state, and a NOR gate having inputs connected to the node UPC1 and to the output of the CLK down generator and having an output connected to the counter, whereby the counter is incremented when an overshoot occurs unless the CLK down generator receives a down pulse; and (b) the negative detect circuitry comprises:
a node PULSE DOWN having a high state and a lower voltage state, a pulse down transistor activated by an undershoot on the output of the driver circuit, the pulse down transistor switching the node PULSE DOWN from the high state to the lower voltage state, the magnitude of the lower voltage state being proportional to the magnitude of the undershoot at the driver circuit output, a node UPC2 having a low and a high state, a down interrogate transistor activated when the node PULSE DOWN switches from the high state to the lower voltage state, the down interrogate transistor switching the node UPC2 from the low to the high state, a voltage keeper holding node UPC2 low until activation of the down interrogate transistor, a pulse down reset transistor resetting node PULSE DOWN to its original high state, a UPC2 reset transistor resetting node UPC2 to its original low state, and a NAND gate having inputs connected to the node UPC2 and to the inverted output of the CLK down generator and having an input connected to the counter, whereby the counter is incremented when an undershoot occurs unless the CLK down generator receives a down pulse.
- 28. The automatic, self-resetting control circuit of claim 27 further comprising:
a RESET node; a first isolating resistive device connected between the source of internal power and the RESET node; a second isolating resistive device connected between the system ground and the node PULSE; a RESET2 node; a third isolating resistive device connected between the system ground and the RESET2 node; and a fourth isolating resistive device connected between the internal power source and the node PULSE DOWN, thereby reducing the susceptibility of the control circuit to accidental switching due to system noise.
CROSS REFERENCE TO RELATED APPLICATIONS
1. The present application is a continuation-in-part of U.S. patent application Ser. No. 09/255,997, filed on Feb. 23, 1999, which is pending and is assigned to the assignee of the subject application.
Divisions (1)
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Number |
Date |
Country |
Parent |
09320902 |
May 1999 |
US |
Child |
09735679 |
Dec 2000 |
US |
Continuation in Parts (1)
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Number |
Date |
Country |
Parent |
09255997 |
Feb 1999 |
US |
Child |
09320902 |
May 1999 |
US |