Test chip

Information

  • Patent Grant
  • D968638
  • Patent Number
    D968,638
  • Date Filed
    Thursday, June 17, 2021
    3 years ago
  • Date Issued
    Tuesday, November 1, 2022
    2 years ago
  • US Classifications
    Field of Search
    • US
    • D24 107
    • D24 186
    • D24 216
    • D24 232
    • D24 233
    • D24 234
    • D24 121
    • D24 122
    • D24 223
    • D24 224
    • D24 225
    • D24 227
    • D24 231
    • D24 119
    • D24 133
    • D10 81
    • CPC
    • B01L3/5023
    • B01L3/523
    • B01L3/565
    • B01L2300/0809
    • B01L3/50229
    • B01L2300/0816
    • B01L2300/0819
    • B01L2300/0822
    • B01L2300/0825
    • A61B10/0038
    • A61B10/0216
    • G01N2001/028
  • International Classifications
    • 2401
    • Term of Grant
      15Years
Abstract
Description


FIG. 1 is a front view of a test chip;



FIG. 2 is a top view thereof;



FIG. 3 is a bottom view thereof;



FIG. 4 is a right side view thereof;



FIG. 5 is a left side view thereof; and,



FIG. 6 is a cross-sectional view taken along line 6-6 shown in FIG. 5.


The rear view is omitted since it is symmetrical to the front view. The broken lines represent portions of the test chip and form no part of the claimed design.


Claims
  • The ornamental design for a test chip, as shown and described.
Priority Claims (1)
Number Date Country Kind
2020-027421 D Dec 2020 JP national
US Referenced Citations (12)
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D420141 Casterlin Feb 2000 S
D477670 Jurik Jul 2003 S
D483496 Kjendlie Dec 2003 S
D694425 Markovsky Nov 2013 S
D800001 Winter Oct 2017 S
D889684 Johnson Jul 2020 S
D895140 Heron Sep 2020 S
20110030458 Park Feb 2011 A1
20190374945 Hallock Dec 2019 A1
20200376485 Azpiroz Dec 2020 A1