Test device

Information

  • Patent Grant
  • D990334
  • Patent Number
    D990,334
  • Date Filed
    Wednesday, March 23, 2022
    2 years ago
  • Date Issued
    Tuesday, June 27, 2023
    a year ago
  • US Classifications
    Field of Search
    • US
    • D10 46
    • D10 216
    • D10 223
    • D10 224
    • D10 225
    • D10 226
    • D10 227
    • CPC
    • B01L2300/0809
    • B01L2300/0812
    • B01L2300/0816
    • B01L2300/0819
    • B01L2300/0822
    • B01L2300/0825
    • B01L2300/0829
    • B01L3/5088
    • B01L2300/0609
    • B01L2300/089
    • B01L2300/161
    • B01L2400/0415
    • G01N27/62
    • G01N1/31
    • G01N33/54373
    • G01N2035/1037
    • C12M25/01
  • International Classifications
    • 2402
    • Term of Grant
      15Years
Abstract
Description


FIG. 1 is a top front perspective view of a test device according to the present design;



FIG. 2 is a bottom perspective view of the test device of FIG. 1;



FIG. 3 is a top view of the test device of FIG. 1;



FIG. 4 is a bottom view of the test device of FIG. 1;



FIG. 5 is a left view of the test device of FIG. 1;



FIG. 6 is a back view of the test device of FIG. 1;



FIG. 7 is a front view of the test device of FIG. 1;



FIG. 8 is a top perspective view of the test device of FIG. 1 with a cover; and,



FIG. 9 is a bottom perspective view of the test device of FIG. 1 with a cover.


Claims
  • The ornamental design for a test device, as shown and described.
US Referenced Citations (2)
Number Name Date Kind
8691147 Leck Apr 2014 B2
D907243 Sekiguchi Jan 2021 S
Divisions (1)
Number Date Country
Parent 29699957 Jul 2019 US
Child 29831880 US