Patent Grant
8769314
1. Technical Field
Embodiments of the present disclosure relate to test technology, and particularly to a test fixture and a method for automatically turning on computers according to commands of a control computer.
2. Description of Related Art
Testing computers usually includes a power button test. The power button test is performed by pressing a power button of a computer thousand times, to turn on and shut down the computer. Previously, the power button was manually tested, which was time consuming and wasteful of manpower.
For solving the above problem, an improved method was introduced. Referring to
However, in the improved method, the test fixture 1 can only handle one computer at a time. In addition, different computers may have different button configurations. For example, as shown in
The application is illustrated by way of examples and not by way of limitation in the figures of the accompanying drawings in which like references indicate similar elements. It should be noted that references to “an” or “one” embodiment in this disclosure are not necessarily to the same embodiment, and such references mean at least one.
Referring to one embodiment of the circuit diagram of the test fixture 6 illustrated in
The first connector 60 communicates with the control computer 4 through a cable 7 for receiving commands to turn on the one or more test computers 5 sent by the control computer 4. The second connector 61 communicates with the one or more test computers 5 through one or more cables 8 to turn on the one or more test computers 5 according to the commands sent by the control computer 4.
Each test computer 5 includes an auto shutdown software 51 programmed for shutting down the test computer 5 after the test computer 5 has been turned on.
In block S10, the control computer 4 sends a command to turn on the one or more test computers 5 to the test fixture 6.
In block S11, the test fixture 6 sets a high level voltage (logical 1, for example) for the connected fourth pins of the first connector 60 and the second connector 61 or for the connected seventh pins of the first connector 60 and the second connector 61.
In block S12, the test fixture 6 sets a low level voltage (logical 0, for example) for the power pin 50 of each test computer 5, to turn on each test computer 5.
In block S13, each test computer 5 executes the auto shutdown software 51, to shut down the test computer 5.
In block S14, the test fixture 6 sets a high level voltage (logical 1, for example) for the connected eighth pins of the first connector 60 and the second connector 61, and sets a low level voltage (logical 0, for example) for the connected fourth pins or the connected seventh pins of the first connector 60 and the second connector 61.
In block S14, the control computer 4 determines whether to turn on the one or more test computers 5 one more time according to pre-received parameters, such as the number of times the test computers 5 need to be turned on. Block S10 is repeated if the determination result is to turn on the test computers 5 again. Otherwise, the flow ends if the determination result is not to turn on the test computers 5 one more time.
Although certain inventive embodiments of the present disclosure have been specifically described, the present disclosure is not to be construed as being limited thereto. Various changes or modifications may be made to the present disclosure without departing from the scope and spirit of the present disclosure.
| Number | Date | Country | Kind |
|---|---|---|---|
| 2010 1 0160106 | Apr 2010 | CN | national |
| Number | Name | Date | Kind |
|---|---|---|---|
| 5664204 | Wang | Sep 1997 | A |
| 20040256915 | Phinney | Dec 2004 | A1 |
| 20100031043 | Burger et al. | Feb 2010 | A1 |
| Number | Date | Country |
|---|---|---|
| 1484147 | Mar 2004 | CN |
| Number | Date | Country | |
|---|---|---|---|
| 20110270565 A1 | Nov 2011 | US |
