IBM Technical Disclosure Bulletin, vol. 33, No. 6B, Nov. 1990, "Knowledge-Based Test System", pp. 440-441, by Smith. |
IBM Technical Disclosure Bulletin, vol. 34, No. 6, Nov. 1991, "Declarative Product Data Base For A Design Verification Test Generation Expert System", pp. 53-56, by Reynolds. |
IBM Technical Disclosure Bulletin, vol. 30, No. 10, Mar. 1988, "Expert System To Ease Repair Of Printed Circuit Boards", pp. 314-316, by Walter. |
Virginia Polytechnic Institute And State University Model-Based Reasoning, "Expert Systems Without an Expert: Fault Diagnosis Based on Casual Reasoning", pp. 19-29, by Whitehead et al. |
IEEE Design and Test, "Mind: An Inside Look at an Expert System for Electronic Diagnosis", pp. 69-76, by Wilkinson. |
"An Expert System For Help To Fault Diagnosis On VLSI Memories", pp. 153-159, by Viacroze et al. |
arc Automated Reasoning Corporation, "Micro IN-ATE". |