The present invention relates to a test probe, in particular to a test probe with a dual switching probe tip used in a multi-meter.
Multi-meter is an electronic measuring instrument generally providing different measuring functions including the functions of an ammeter, a voltmeter, and an ohmmeter, and this is also known as a universal meter, a multi-purpose meter, or a multi-functional electric meter. Such instrument is usually operated together with one or more test probes for a connection and a measurement, and thus the instrument will not be restricted by the space and the using place, and it can be used extensively for measuring various types of electronic products.
A conventional test probe mainly includes a soft external sheath, a hard internal sheath, a conductive wire and a probe tip, and an end of conductive wire is passed into the hard internal sheath and electrically connected to an end of the probe tip, and another end of the probe tip is passed out and exposed from the hard internal sheath, and the soft external sheath is sheathed on the exterior of the hard internal sheath to form the test probe.
Although the conventional test probe has the function of measuring various types of electronic products, the probe tip is fixed onto the hard internal sheath directly, and the test probe will be unusable if the probe tip is worn out or damaged, and thus causing unnecessary wastes. Furthermore, the probe tips of this sort are applicable for a single specification or district only, and it is necessary to have test probes of another specification for the use in different districts or regions, and thus incurring a higher manufacturing cost for making different molds and a higher management cost for keeping the inventory and classifying products. Obviously, the conventional test probe requires improvements.
Therefore, the present invention is to provide a test probe with a dual switching probe tip, and the test probe having the dual switching probe tips installed at an insulating sheath can extend the using life of the test probes and meet the requirements for various different specifications.
The present invention discloses a test probe with a dual switching probe tip, and the test probe comprises an insulating sheath, a conductive wire and a composite probe tip, wherein an end of the conductive wire is passed and connected into the insulating sheath, and the complex probe tip includes a connecting section and a first measuring head and a second measuring head extended in opposite directions from both ends of the connecting section, and the first measuring head and the second measuring head are electrically connected, and the first measuring head and the second measuring head are measuring heads of two different specifications, and the connecting section can be selectively combined with the insulating sheath, and the first measuring head can be exposed from the insulating sheath or accommodated in the insulating sheath and electrically connected to the conductive wire.
The present invention provides a test probe with a dual switching probe tip, and the test probe comprises an insulating sheath, a conductive wire and a complex probe tip, wherein an end of the conductive wire is passed and connected into the insulating sheath, and the complex probe tip includes a connecting section, and a first measuring head and a second measuring head extended in opposite directions from both ends of the connecting section, and the first measuring head and the second measuring head are electrically connected to each other, and the connecting section can be selectively combined with the insulating sheath, and the first measuring head can be exposed from the insulating sheath or accommodated in the insulating sheath and electrically connected to the conductive wire.
The present invention also achieves the following effects. The probe tip and the insulating sheath are connected with each other by threads to assure a secured positioning effect of the probe tip. An elastic connector is designed for providing a good electric connection contact of the probe tip with the conductive wire. The latch between the positioning pillar and the through hole is designed for preventing the probe tip from falling out from the insulating sheath easily.
The technical characteristics and contents of the present invention will become apparent with the following detailed description accompanied with related drawings. The drawings are provided for the purpose of illustrating the present invention only, but not intended for limiting the scope of the invention.
With reference to
The insulating sheath 10 is made of a highly insulating material such as plastic and substantially in the shape of a strip, and the interior of the insulating sheath 10 is comprised of a tubular first internal diameter 11, a tubular second internal diameter 12 greater than the first internal diameter 11, and a scalene conical third internal diameter 13. A hook 121 is protruded inwardly towards a mid-section area of the second internal diameter 12, and an internal thread 131 is formed at a mid-section area of the third internal diameter 13, and a through hole 132 is formed at the insulating sheath 10 on an external side of the internal thread 131 and interconnected to the third internal diameter 13, and a protruding ring 14 is protruded from the exterior of the insulating sheath 10 and disposed at a position corresponding to the internal thread 131.
The conductive wire 20 is comprised of a bare wire 21 and an enameled wire 22 covered on an external surface of the bare wire 21, and the conductive wire 20 is passed through an end of the first internal diameter 11 of the insulating sheath 10 and connected into the insulating sheath 10.
In
In a preferred embodiment, the test probe further comprises an elastic connector 40 for electrically connecting the conductive wire 20 and the complex probe tip 30, and the elastic connector 40 includes a conducting terminal 41, a piston 42, a compression spring 43 and a cap 44, wherein each of the aforementioned components is made of a conductive material, and an end of the conducting terminal 41 is clamped and connected to the bare wire 21, and a tube body is formed at another end of the conducting terminal 41 for passing and connecting the piston 42, and the compression spring 43 is connected between the piston 42 and the cap 44, and a hook portion 441 is formed at the external periphery of the cap 44 and latched and fixed with the hook 121, and a pit 442 is stamped and formed at a distal portion of the cap 44 for embedding and fixing each of the tips 322, 332.
During the assembling process, the conductive wire 20 is passed into an end of the first internal diameter 11 of the insulating sheath 10 and then passed out from an end of the third internal diameter 13, and the conducting terminal 41 is clamped onto the bare wire 21, and an end of the piston 42 is passed and fixed to the conducting terminal 41. After the cap 44 is passed and connected to an end of the compression spring, another end of the compression spring 43 is sheathed on the piston 42 and then a tool (not shown in the figure) is used to push the cap 44 into the second internal diameter 12 of the insulating sheath 10, and latch and fix the hook portion 441 of the cap 44 onto an internal side of the hook 121.
In
With reference to
When use, the second external thread 312 of the connecting section 31 is aligned precisely and screwed with the internal thread 131 of the insulating sheath 10, and the tip 332 of the second measuring head 33 is inserted into the tube body 401 and elastically clamped by the tapered neck section 402, and the positioning pillar 313 is embedded precisely and latched into the through hole 132 of the insulating sheath 10. Now, the first measuring head 32 is exposed from the insulating sheath 10, and the second measuring head 33 is electrically connected to the conductive wire 20 (as shown in
With reference to
When use, the second external thread 3013 of the connecting section 301 is aligned precisely with the internal thread 404a of the connector 400a. Since the first and second external threads 3012, 3013 are electrically conductively connected with the first measuring head 32 and the second measuring head 33, and the first measuring head 32 is exposed from the insulating sheath 10, the second measuring head 33 is electrically conductively coupled to the conductive wire 20 through the connector 400a (as shown in
In summation of the description above, the present invention improves over the prior art and complies with the patent application requirements, and thus is duly filed for patent application. While the invention has been described by means of specific embodiments, numerous modifications and variations could be made thereto by those skilled in the art without departing from the scope and spirit of the invention set forth in the claims.