IBM Technical Disclosure Bulletin, vol. 23, No. 7A, Dec. 1980, Logic-Array Isolation for Testing, P. Goel, pp. 2794-2799. |
IBM Technical Disclosure Bulletin, vol. 23, No. 1, Jun. 1980, Multiple Input Stage, K. Pollmann, R. Remshardt, H. Schettler & R. Zuehlke, pp. 207-208. |
IBM Technical Disclosure Bulletin, vol. 23, No. 9, Feb.1981, Testing of Tristate Driver Circuits, H. D. Schnurmann, L. J. Vidunas, Jr. & C. Y. Wong, pp. 4156-4158. |
IBM Technical Disclosure Bulletin, vol. 23, No. 8, Jan. 1981, Testing of Off-Chip Drivers in FET Designs, P. P. Puri & Y. K. Puri, pp. 3798-3799. |