Testing device for electronic component

Information

  • Patent Grant
  • D573495
  • Patent Number
    D573,495
  • Date Filed
    Thursday, December 28, 2006
    17 years ago
  • Date Issued
    Tuesday, July 22, 2008
    16 years ago
  • US Classifications
    Field of Search
    • US
    • D10 46
    • D10 75- 77
    • 073 007000
    • 324 158100
    • 324 210000
    • 324 212000
    • 360 106000
    • 360 031000
    • 369 223000
  • International Classifications
    • 1004
    • Term of Grant
      14Years
      Disclaimer
      This patent is subject to a terminal disclaimer.
Abstract
Description


FIG. 1 is a perspective view of a testing device for electronic component in accordance with the present design;



FIG. 2 is a front elevational view thereof;



FIG. 3 is a rear elevational view thereof;



FIG. 4 is a left side elevational view thereof;



FIG. 5 is a right side elevational view thereof;



FIG. 6 is a top plan view thereof; and,



FIG. 7 is a perspective view thereof, with a display screen in an open position and a drawer being drawn out.


(Broken line portions are only included to show the intended use environment and do not constitute a part of the claimed design.)


Claims
  • The ornamental design for a testing device for electronic component, substantially as shown and described.
Priority Claims (1)
Number Date Country Kind
2006 3 0153988 Oct 2006 CN national
US Referenced Citations (7)
Number Name Date Kind
D271136 Bollinger et al. Oct 1983 S
D335822 Yamamuro et al. May 1993 S
D339586 Ito et al. Sep 1993 S
D362845 Ito et al. Oct 1995 S
D365291 Chitty Dec 1995 S
D383405 Horn et al. Sep 1997 S
20080049351 Yamanaka et al. Feb 2008 A1