Testing device

Information

  • Patent Grant
  • D1001309
  • Patent Number
    D1,001,309
  • Date Filed
    Wednesday, May 26, 2021
    4 years ago
  • Date Issued
    Tuesday, October 10, 2023
    2 years ago
  • US Classifications
    Field of Search
    • US
    • D10 46
    • D10 81
    • D24 216
    • D24 224
    • D24 225
    • D24 226
    • CPC
    • B01L3/502738
    • B01L3/502707
    • B01L2300/044
    • B01L2300/049
    • B01L2300/0672
    • B01L2300/0825
    • B01L2300/0867
    • B01L2400/0478
    • B01L2400/0481
    • B01L2400/065
    • B01L3/5023
    • B01L3/5029
    • A61B10/0045
    • G01N33/54388
    • G01N33/5308
  • International Classifications
    • 2402
    • Term of Grant
      15Years
Abstract
Description


FIG. 1 is a top perspective view a testing device;



FIG. 2 is a top view of the testing device;



FIG. 3 is a bottom view of the testing device;



FIG. 4 is a first end view of the testing device;



FIG. 5 is a second end view of the testing device;



FIG. 6 is a first side view of the testing device;



FIG. 7 is a second side view of the testing device;



FIG. 8 is a bottom perspective view of the testing device; and,



FIG. 9 is a top perspective exploded view of the testing device.


The broken lines in the figures depict portions of the testing device that form no part of the claimed design.


Claims
  • The ornamental design for a testing device, as shown and described.
US Referenced Citations (14)
Number Name Date Kind
D328134 Yang Jul 1992 S
D331807 Sodergren Dec 1992 S
D381515 Haynes Jul 1997 S
D420452 Cardy Feb 2000 S
D423678 Fisch Apr 2000 S
D431301 Fisch Sep 2000 S
6338969 Shareef Jan 2002 B1
6399398 Cunningham Jun 2002 B1
D500142 Crisanti Dec 2004 S
8877142 Ohman Nov 2014 B2
9689870 Ding Jun 2017 B2
D894422 Johnson Aug 2020 S
D921219 Johnson Jun 2021 S
D968639 Kim Nov 2022 S