Number | Name | Date | Kind |
---|---|---|---|
3107329 | McSkimin | Aug 1960 | |
3333187 | Whitfield | Mar 1964 | |
3675127 | McKiernan | Jul 1972 | |
3725785 | Barrot et al. | Apr 1973 | |
3761695 | Eichelberger | Sep 1973 | |
3783254 | Eichelberger | Jan 1974 | |
3896378 | Bedford | Jul 1975 | |
4063080 | Eichelberger et al. | Dec 1977 | |
4074851 | Eichelberger et al. | Feb 1978 | |
4097801 | Freeman et al. | Jun 1978 | |
4285059 | Burlage et al. | Aug 1981 | |
4293919 | Dasgupta et al. | Oct 1981 | |
4298980 | Hajdu et al. | Nov 1981 |
Entry |
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C. F. Megivern, Digital Delay Technique, IBM Technical Disclosure Bulletin, vol. 21, No. 7, Dec. 1978, pp. 2794-2795. |
R. C. Mitchell, Testing Multispeed LSI Chips, IBM Technical Disclosure Bulletin, vol. 20, No. 5, Oct. 1977, pp. 1801-1802. |
S. Das Gupta et al., LSI Design, Testing and Interfacing, 1978 IEEE Intl. Solid-State Circuits Conf., Feb. 15-17, 1978, pp. 216, 17. |