1. Field of the Invention
The present invention relates to thermal reactors, and more specifically to thermal reactors for preparing thin films of Group IBIIIAVIA compound semiconductors for photovoltaic devices.
2. Description of the Related Art
Solar cells are photovoltaic (PV) devices that convert sunlight directly into electrical energy. Solar cells can be based on crystalline silicon or thin films of various semiconductor materials that are usually deposited on low-cost substrates, such as glass, plastic, or stainless steel.
Thin film based photovoltaic cells, such as amorphous silicon, cadmium telluride, copper indium diselenide or copper indium gallium diselenide based solar cells, offer improved cost advantages by employing deposition techniques widely used in the thin film industry. Group IBIIIAVIA compound photovoltaic cells, including copper indium gallium diselenide (CIGS) based solar cells, have demonstrated the greatest potential for high performance, high efficiency, and low cost thin film PV products.
As illustrated in
After the absorber film 14 is formed, a transparent layer 15, for example, a CdS film, a ZnO film or a CdS/ZnO film-stack, is formed on the absorber film 14. Light enters the solar cell 10 through the transparent layer 15 in the direction of the arrows 16. The preferred electrical type of the absorber film is p-type, and the preferred electrical type of the transparent layer is n-type. However, an n-type absorber and a p-type window layer can also be formed. The above described conventional device structure is called a substrate-type structure. In the substrate-type structure light enters the device from the transparent layer side as shown in
Contrary to CIGS and amorphous silicon cells, which are fabricated on conductive substrates such as aluminum or stainless steel foils, standard silicon solar cells are not deposited or formed on a protective sheet. Such solar cells are separately manufactured, and the manufactured solar cells are electrically interconnected by a stringing or shingling process to form solar cell circuits. In the stringing or shingling process, the (+) terminal of one cell is typically electrically connected to the (−) terminal of the adjacent solar cell. Circuits may then be packaged in protective packages to form modules. Each module typically includes a plurality of strings of solar cells which are electrically connected to one another.
In a thin film solar cell employing a Group IBIIIAVIA compound absorber, the cell efficiency is a strong function of the molar ratio of IB/IIIA. If there are more than one Group IIIA materials in the composition, the relative amounts or molar ratios of these IIIA elements also affect the properties. For a Cu(In,Ga)(S,Se)2 absorber layer, for example, the efficiency of the device is a function of the molar ratio of Cu/(In+Ga). Furthermore, some of the important parameters of the cell, such as its open circuit voltage, short circuit current and fill factor, vary with the molar ratio of the IIIA elements, i.e. the Ga/(Ga+In) molar ratio. In general, for good device performance the Cu/(In+Ga) molar ratio is kept at around or below 1.0. On the other hand, as the Ga/(Ga+In) molar ratio increases, the optical bandgap of the absorber layer increases and therefore the open circuit voltage of the solar cell increases while the short circuit current may typically decrease. It is important for a thin film deposition process to have the capability of controlling both the molar ratio of IB/IIIA, and the molar ratios of the Group IIIA components in the composition.
As mentioned above, the second step or the reaction step of the two-step process involves the reaction process of the precursor stack that is formed at the first step of the two step process. The reaction process can be performed in radiation heating reactors or thermal reactors using, for example, resistance heaters. In general the thermal reactors can be atmospheric-pressure (AP) or Sub-Atmospheric (SA) thermal reactors. Such reactors are generally designed for thermal processing of thin-film solar cell materials. Although in the prior art the reactors have been described in some detail there is very little description of the design details essential to provide good uniformity of the final product. This uniformity is typically but not limited to deposited film thickness uniformity in a CVD or similar reactor, or uniformity of composition in a selenization reactor for formation of CuInGaSe (CIGS) layers or similar materials. Described reactor features are mainly limited to the general reactor configuration, including locations of heating zones, gas inlets and outlets, and reaction zones, and overall operation modes. Missing from many of these descriptions are details concerning optimum or desired configuration of the wetted internal surfaces of the reactor that are exposed to the process gases and constrain and direct the process gases over the substrate during the reaction process.
Internal design of the reactors is critical for the quality of the manufactured thin films. Deposition and growth of layers forming a thin film solar cell in a roll-to-roll or in-line process is attractive for higher throughput, lower cost and better yield of such approaches. There is still a need to develop roll-to-roll or in-line growth CIGS growth techniques where the CIGS material compositions are tightly controlled.
The present invention provides a thermal reactor and reaction method for forming thin films from precursor materials deposited on substrates.
An aspect of the present invention includes a thermal reactor applying a process gas more uniformly along the length of a workpiece including a precursor material layer during its transit through an internal volume of the thermal reactor.
Another aspect of the present invention includes a roll-to-roll thermal reactor applying a process gas more uniformly along the length of a flexible continuous workpiece including a precursor material layer during its transit through an internal volume of the roll-to-roll thermal reactor.
The aforementioned needs are satisfied in one embodiment by a reactor for reacting a precursor material disposed on a top surface of a continuous workpiece to form a solar cell absorber. In this embodiment, the reactor comprises an elongated chamber to flow at least one process gas flow and to advance the continuous workpiece in a process direction between an entrance opening located at a first end of the elongated chamber and an exit opening located at a second end of the elongated chamber. In this embodiment, the elongated chamber includes at least one delivery region including the entrance opening of the elongated chamber, the delivery region having an inner peripheral surface defining an inner space having a length extending along the process direction and a cross-sectional area, wherein the process gas flow is introduced into the delivery region thought a gas inlet located adjacent the entrance opening. In this embodiment, the elongated chamber also includes a reaction region including the exit opening of the elongated chamber, the reaction region being heated to react the precursor, the reaction region having an inner peripheral surface defining an inner space having a length extending along the process direction and a cross sectional area, wherein the cross-sectional area of the reaction region is greater than the cross-sectional area of the delivery region, wherein the process gas flow flows through the reaction region towards an exhaust opening located adjacent the exit opening. In this embodiment, the elongated chamber also includes at least one gas expansion region that connects the delivery region and the reaction region, the gas expansion region having an inner peripheral surface defining an inner space having a length extending along the process direction and a cross-sectional area that uniformly increases along the process direction toward the reaction region, wherein the gas expansion is configured to uniformly heat and expand the process gas flow before entering the reaction region within its uniformly expanding inner space.
In another embodiment, the aforementioned needs are satisfied by a reactor for reacting a precursor material disposed on a top surface of a continuous workpiece to form a solar cell absorber. In this embodiment, the reactor comprises a reaction chamber having an inlet and an outlet and defining an inner space having a length extending along the process direction and a cross-sectional area. In this embodiment, the reactor further includes at least one gas expansion chamber having an inlet and an outlet wherein the outlet of the gas expansion chamber is coupled to the inlet of the reaction chamber and wherein the continuous workpiece travels through the gas expansion chamber into the reaction chamber. In this embodiment, the reactor further includes a gas supply system that supplies process gas into the inlet of the at least one gas expansion chamber at a first temperature. In this embodiment, the reactor further includes a heating system that heats gas within the reaction chamber to a second temperature so as to react the precursor material formed on top of the continuous workpiece to form a solar absorber and so that gas that is in the gas expansion chamber heats from the first temperature to the second temperature which results in expansion of the gas in the gas expansion chamber as the gas travels in the process direction, wherein the cross-sectional area of the gas expansion region is dimensioned to increase in the process direction in a first proportional relationship to the expansion of the gas in the process direction so as to reduce turbulence of the gas in the gas expansion chamber.
These and other objects and advantages will become more apparent from the following description taken in conjunction with the accompanying drawings.
The present invention provides a method and apparatus to react precursor films to form thin films. In one embodiment, a multilayer Group IBIIIAVIA precursor deposited on continuous substrate is thermally reacted to manufacture a Group IBIIIAVIA solar cell absorber. A CIGS precursor comprising Cu, In, Ga and at least one Group VIA material such as Se may be reacted in a roll-to-roll process reactor that applies a process temperature to the precursor layer at a predetermined rate to convert the CIGS precursor into a CIGS thin film absorber layer. The process involves heating the CIGS precursor to a reaction temperature range of 300-700° C., preferably to a range of 400-600° C., in the presence of at least one of a reactive gas containing selenium (Se) and an inert gas such as nitrogen (N2), while the CIGS precursor on the continuous substrate is advanced through the roll-to-roll process reactor.
It has been observed that a roll-to-roll or continuous-process reactor used for thermal processing, thin-film reaction, or thin-film deposition should provide as uniform a processing environment as possible along the length of the reactor in the direction of substrate travel (the “axial” direction) as well as in the perpendicular (“transverse”) direction. For wide substrates, especially for thin-film solar cell applications, transverse process uniformity is very important and often hard to achieve. Although the uniformity of substrate heating is important, it is not a sufficient condition for acceptable reactor performance. It has been further observed that features employed for good heating uniformity, for example non-contact substrate heating zones where substrates are heated via thermal radiation, may have superior thermal performance at the cost of degraded gas flow characteristics in some applications, which can negate the effects of the improved thermal uniformity. Additionally, for many applications involving reactive substrates where uniformity of the thermal and ambient gas during substrate heating or cooling is important, the changes in reactor temperature in the heating and/or cooling zones affect gas flow uniformity which disturbs the axial and transverse gas flow uniformity, detrimentally affecting the uniformity of the reacted film. Even the very act of translating a substrate through a stationary enclosure of the reactor causes gas flow variations at the edge of the substrate. Reactors employing a moving substrate in an otherwise stationary reactor employing flowing reacting or inert gases may have several inherent sources of gas flow non-uniformity. These factors are addressed by the various embodiments disclosed below and the described reactor embodiments reduce these sources of non-uniformity.
The elongated chamber 102 includes a delivery section 120A, which is kept at a low T1 temperature, to introduce the process gas over the advancing workpiece; a gas expansion section 120B to allow the process gas to uniformly expand with reduced turbulence; a reaction section 120C that is heated by heating members to the reaction temperature T2 to react the precursor as the workpiece advances through the reaction section; a gas contraction section 120D that allows the process gas to cool more uniformly with reduced turbulence; and an exit section 120E from which the substrate exits. The gas expansion and gas contraction sections 120B and 120D are transition regions in which the process gas 108 is expanded and contracted respectively. In the embodiment shown in
The expansion and contraction sections 120B and 120D can range from 100 to 3000 mm in length, with a typical length near 300 mm. The height of the delivery and exit sections 120A and 120E range from 1 to 25 mm with typical values near 5 mm. These are less than the height of the reaction section 120C, which can range from 10 to 100 mm, but is about 15 mm in one typical embodiment. The height of the gas expansion section 120B preferably increases between the delivery and reaction sections substantially proportional to the absolute change in temperature, whereas the height of the gas contraction region 120D decreases from the reaction section to exit section, preferably in a symmetrical manner. The ratio of the heights in the reaction section 120C to the delivery or exit sections can range from 2:1 to 4:1, depending on the temperature in the reaction region, with a typical value of 3:1 for a process near 500° C. In the embodiment depicted in
The axial and transverse uniformity of the gas flow 108, i.e. a gas flow with reduced unwanted gas turbulence, within the process space 106 may be greatly improved by tailoring the internal volume of the elongated chamber 102 at any axial position to an internal temperature profile that includes a gradual temperature shift between low and high temperatures of the environment such as the one exemplified as a graph 150 in
From the foregoing, it will be apparent that there is a desire to be able to control the volume of the expansion section 120B and contraction section 120D so that the heating and cooling gas flows through these regions with reduced turbulence. As discussed above, the reactant gas is supplied to the inlet via a gas supply system 113 at room temperature. There are heating elements 115 adjacent the reaction section 120C and potentially the expansion section 120B and the contraction section 120D. The reactant gas is thus heated from around room temperature in the inlet section 120A to a process temperature that can be approximately 500° C. By maintaining a ratio of the cross-sectional area of the expansion section 120B to the temperature of the gas during the expansion section of approximately 300 mm along the length of the expansion section 120B, the amount of turbulence in the reactant gas in the expansion section 120B can be maintained at a sufficiently low amount so that a desired uniformity of reaction in the reaction section 120C can be maintained.
Similarly, in the contraction section 120D, the reactant gas is being cooled from approximately 500° C. to room temperature at the outlet section 120E. This can also result in turbulence that can affect the uniformity of the resultant material. To reduce this turbulence, the ratio of the cross-sectional area of the contraction section 120D to the gas temperature is maintained at approximately 0.1 cm2/K along the length of the contraction section 120D.
In another embodiment shown in
As is understood, the cross sections of the delivery and the reaction spaces 106A and 106C may not change along the length of the delivery and the reaction sections 120A and 120C while the cross section of the gas expansion space 106B uniformly increases towards the reaction section 120C in accordance with the increasing temperature in the expansion space. In this embodiment, the delivery section 120A may be maintained at the T1 by cooling the delivery section using a cooling system (not shown), and the reaction section may be maintained at the T2 temperature by a heating system (not shown). T1 temperature is in the range of 10-50° C., preferably 20-30° C. and the T2 temperature is in the range of 250-700° C., preferably 450-600° C. for CIGS film reaction. The back surface 111B of the continuous workpiece 110, which includes the continuous conductive substrate, may be supported by the inner bottom surface 105 as the workpiece 110 is advanced through the elongated chamber 102. The inner surface 105 and the sheet-shaped workpiece are in parallel alignment. The process gas flow 108 flows over the CIGS precursor at the top surface 111A. The gas flow 108 has an axial flow component 108A or axial gas flow 108A and a transverse gas flow component 108T or transverse flow 108T. As is understood the axial gas flow 108A is parallel to the axis of the inner space 106 and extends along the process direction ‘P’. The transverse gas flow 108T is parallel to the transverse axis of the inner space 106.
During a reaction process, for wide workpieces such as workpieces with continuous substrates having a width of about a meter or more, transverse uniformity is very important within the reaction section 120C. Although the uniformity of heating is very important for uniformly heating the workpiece, the uniformity of the process gas flow by uniformly distributing the axial and transverse gas flows is also important and affects the uniformity of the finished product. As will be exemplified below, the translation of a workpiece through a stationary reaction enclosure may cause unwanted gas flow variations at the edge of the workpiece.
As shown in
As shown in
In another embodiment, the floor pieces 160A may also be used in a non-contact thermal reactor 300 including a reactor housing 302 and a partial contact thermal reactor 400 including a reactor housing 402 shown in
Although the present invention is described with respect to certain preferred embodiments, modifications thereto will be apparent to those skilled in the art. Thus the scope of the present invention should not be limited to the foregoing discussion but should be defined by the appended claims.
This application claims the benefit of U.S. Provisional Application No. 61/453,413 filed on Mar. 16, 2011, which is hereby incorporated by reference in its entirety herein.
Number | Date | Country | |
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61453413 | Mar 2011 | US |