Claims
- 1. A thermo-magnetic information recording member, comprising:
- a disk substrate having a susrface; and
- a thin-film recording layer of an amorphous alloy of at least one rare-earth element and at least one transition-metal element, the elements being chosen to minimize domain wall energy per unit area in the resulting alloy; said layer being deposited upon the surface of said substrate with the layer material having a value of Q not less than 1 and not greater than 2, where Q=K.sub.u /2.pi.M.sup.2, K.sub.u is the uniaxial anisotropy constant and M is the magnetization of the layer material, said layer having a multiplicity of domains therein each stable in the absence of an external bias field.
- 2. The recording member of claim 1, wherein the resulting alloy has a compensation temperature near room temperature.
- 3. The recording member of claim 1, wherein said at least one transition-metal element is chosen from the group consisting of iron and cobalt.
- 4. The recording member of claim 1, wherein said at least one rare-earth element is chosen from the group consisting of gadolinium, dysprosium and terbium.
- 5. The recording member of claim 4, wherein said at least one transition-metal element is chosen from the group consisting of iron and cobalt
- 6. The recording member of claim 5, wherein said layer is fabricated of a gadolinum cobalt amorphous alloy.
- 7. The recording member of claim 5, wherein said layer is fabricated of a gadolinum terbium cobalt amorphous alloy.
- 8. The recording member of claim 5, wherein said layer is fabricated of a terbium iron amorphous alloy.
- 9. The recording member of claim 5, wherein said layer is fabricated of a gadolinium terbium iron amorphous alloy.
- 10. The recording member of claim 1, wherein said thin-film layer has a thickness less than the diameter of magnetic recording domains to be supported by said layer.
- 11. The recording member of claim 10, wherein said layer has a thickness from about 100 Angstroms to about 5,000 Angstroms.
- 12. The recording member of claim 11, wherein said layer has a thickness of about 500 Angstroms.
- 13. The recording member of claim 1, further including a film of a transparent material fabricated upon that surface of said alloy layer furthest from said substrate.
- 14. The recording member of claim 13, wherein said transparent film has a thickness on the order of 1000 Angstroms.
- 15. The recording member of claim 13, further comprising: a layer of a reflective material fabricated upon said substrate surface; and another film of a transparent material fabricated upon said reflective layer; said reflective layer and said another transparent film being sandwiched between said substrate and said alloy layer.
Parent Case Info
This application is a continuation Ser. No. 493,495 filed May 11, 1983 now abandoned.
US Referenced Citations (7)
Non-Patent Literature Citations (2)
Entry |
"Growth Induced Anisotropy in Sputtered GdCo Films", Esho et al., AIP Conf Proc., 34, 331-333 (1976). |
"Different Origin of the Perpendicular Anisotropy in Amorphous Gd-Fe from Gd-Co Films", Katayama et al., IEEE Trans. Mag., (MAG 13) No. 5, pp. 1603-1605 (Sep. 1977). |
Continuations (1)
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Number |
Date |
Country |
Parent |
493495 |
May 1983 |
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